公开(公告)号：WO2008049853A3

公开(公告)日：2008-06-12

申请号：PCT/EP2007061403

申请日：2007-10-24

Applicant: IBM ,  IBM UK ,  LIANG ZHI YONG ,  LU WEI ,  SABHIKHI RAVINDER KUMAR ,  SHAO LING ,  YANG BO ,  ZHAO YI XIN

Inventor： LIANG ZHI YONG ,  LU WEI ,  SABHIKHI RAVINDER KUMAR ,  SHAO LING ,  YANG BO ,  ZHAO YI XIN

IPC: H04L29/06

CPC classification number: H04L29/06027 ,  H04L65/1006 ,  H04L67/1002 ,  H04L67/1008 ,  H04L67/1029 ,  H04L69/12 ,  H04L69/22

Abstract: The present invention discloses a method and an apparatus for improving SIP parse performance. The method comprising the steps of: receiving a text-based SIP message to be sent to a SIP server; according to a SIP message filter table, determining whether the text- based SIP message needs to be transformed to a token-based message; and in the case that the text-based SIP message needs to be transformed to a token-based message, performing the transformation and sending the transformed token-based message to said SIP server, otherwise directly sending the text-based SIP message to said SIP server. According to the present invention, larger SIP message throughput in a SIP server and better utilization of resources of a front end device can be achieved.

Abstract translation: 本发明公开了一种改进SIP解析性能的方法和装置。 该方法包括以下步骤：接收要发送到SIP服务器的基于文本的SIP消息; 根据SIP消息过滤表，确定基于文本的SIP消息是否需要被转换为基于令牌的消息; 并且在基于文本的SIP消息需要被转换为基于令牌的消息的情况下，执行变换并将所变换的基于令牌的消息发送到所述SIP服务器，否则直接将基于文本的SIP消息发送到所述SIP 服务器。 根据本发明，可以实现SIP服务器中更大的SIP消息吞吐量以及更好地利用前端设备的资源。

公开(公告)号：JP2005017298A

公开(公告)日：2005-01-20

申请号：JP2004187428

申请日：2004-06-25

Applicant: Internatl Business Mach Corp ,  インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation

Inventor： LU WEI ,  PETRUS JOHN CHARLES

IPC: G01N23/225 ,  G01N1/28 ,  G01N1/32 ,  G01N23/22 ,  H01J37/20 ,  H01J37/317

CPC classification number: G01N23/22

Abstract: PROBLEM TO BE SOLVED: To provide a metrology process for enhancing image contrast of a buried feature.
SOLUTION: The present invention provides the metrology process for enhancing the image contrast of the buried feature. The metrology has a step for polishing a selected surface of a substrate to expose a cross-section of the buried feature, a step for exposing the exposed cross-section to a gas mixture containing a fluorine bearing compound, and a step for irradiating the exposed cross-section with a high-energy beam to enhance the image contrast of a buried feature.
COPYRIGHT: (C)2005,JPO&NCIPI

Abstract translation: 要解决的问题：提供用于增强掩埋特征的图像对比度的计量过程。 解决方案：本发明提供了用于增强掩埋特征的图像对比度的计量过程。 测量具有用于抛光衬底的选定表面以暴露掩埋特征的横截面的步骤，用于将暴露的横截面暴露于含有氟化合物的气体混合物的步骤，以及用于照射暴露 横截面用高能束增强了埋藏特征的图像对比度。 版权所有（C）2005，JPO＆NCIPI

公开(公告)号：AU2003290287A1

公开(公告)日：2004-07-29

申请号：AU2003290287

申请日：2003-12-19

Applicant: IBM

Inventor： FU RONG YAO ,  LI WEI ,  YING CHUN ,  SONG SONG ,  LIU XIAO XI ,  LU WEI

IPC: H04M3/42