公开(公告)号：DE69219467D1

公开(公告)日：1997-06-05

申请号：DE69219467

申请日：1992-09-11

Applicant: IBM

Inventor： LOCQUET JEAN-PIERRE DR ,  BEDNORZ JOHANNES GEORG DR ,  MUELLER CARL ALEXANDER PROF DR ,  MAECHLER ERICH ,  CATANA ANDREI DR

IPC: C23C14/06 ,  C23C14/08 ,  C30B29/22 ,  H01L39/12 ,  H01L39/24

Abstract: Described is a process for manufacturing thin films by periodically depositing (DEP) a number of block layers consisting of different base materials on a substrate (multilayer deposition), wherein the thickness of the layers (LT) is restricted to one to 20 monolayers and deposition as well as crystallization of the thin film is completed at approximately constant temperature without performing a seperate annealing step. The method can be used to produce thin films of high-Tc-superconductors. It allows a better control of the crystal growth of ternary or higher compounds with comparatively large unit cells.

公开(公告)号：DE10007617A1

公开(公告)日：2000-11-02

申请号：DE10007617

申请日：2000-02-18

Applicant: IBM

Inventor： BERGER RUEDIGER ,  DIETZEL ANDREAS H ,  FOMPEYRINE JEAN ,  KRAUSE FRANK ,  LOCQUET JEAN PIERRE ,  MAECHLER ERICH

IPC: G01Q60/56 ,  G01Q70/14 ,  G01R33/10 ,  G11B5/31 ,  G11B5/455 ,  G12B21/10 ,  G01R33/12 ,  H01L41/16

Abstract: A magnetic field characterization process, comprising provision of a magnetosensitive layer between a component surface and a scanning force microscope sensor, is new. Independent claims are also included for the following: (i) apparatus for carrying out the above process; (ii) a scanning force microscope sensor bearing a magnetosensitive layer; and (iii) use of a scanning force microscope sensor for characterizing a magnetic field from a magnetic read/write head with micrometer dimensions.

公开(公告)号：DE10007617B4

公开(公告)日：2006-04-20

申请号：DE10007617

申请日：2000-02-18

Applicant: IBM

Inventor： BERGER RUEDIGER ,  DIETZEL ANDREAS H ,  FOMPEYRINE JEAN ,  KRAUSE FRANK ,  LOCQUET JEAN PIERRE ,  MAECHLER ERICH

IPC: G01Q60/56 ,  G01Q70/14 ,  G01R33/10 ,  G01R33/12 ,  G11B5/31 ,  G11B5/455 ,  H01L41/16

Abstract: A magnetic field characterization process, comprising provision of a magnetosensitive layer between a component surface and a scanning force microscope sensor, is new. Independent claims are also included for the following: (i) apparatus for carrying out the above process; (ii) a scanning force microscope sensor bearing a magnetosensitive layer; and (iii) use of a scanning force microscope sensor for characterizing a magnetic field from a magnetic read/write head with micrometer dimensions.

公开(公告)号：DE69608821T2

公开(公告)日：2000-12-07

申请号：DE69608821

申请日：1996-03-29

Applicant: IBM ,  BERKE HEINZ ,  HUBER J ROBERT

Inventor： BERKE HEINZ ,  HUBER ROBERT ,  ARROUY FREDERIC ,  BEDNORZ GEORG ,  FRITSCH ELKE ,  LOCQUET JEAN-PIERRE ,  MAECHLER ERICH

IPC: C23C16/18

公开(公告)号：DE69608821D1

公开(公告)日：2000-07-13

申请号：DE69608821

申请日：1996-03-29

Applicant: IBM ,  BERKE HEINZ ,  HUBER J ROBERT

Inventor： BERKE HEINZ ,  HUBER ROBERT ,  ARROUY FREDERIC ,  BEDNORZ GEORG ,  FRITSCH ELKE ,  LOCQUET JEAN-PIERRE ,  MAECHLER ERICH

IPC: C23C16/18

公开(公告)号：DE69219467T2

公开(公告)日：1997-10-23

申请号：DE69219467

申请日：1992-09-11

Applicant: IBM

Inventor： LOCQUET JEAN-PIERRE DR ,  BEDNORZ JOHANNES GEORG DR ,  MUELLER CARL ALEXANDER PROF DR ,  MAECHLER ERICH ,  CATANA ANDREI DR

IPC: C23C14/06 ,  C23C14/08 ,  C30B29/22 ,  H01L39/12 ,  H01L39/24

Abstract: Described is a process for manufacturing thin films by periodically depositing (DEP) a number of block layers consisting of different base materials on a substrate (multilayer deposition), wherein the thickness of the layers (LT) is restricted to one to 20 monolayers and deposition as well as crystallization of the thin film is completed at approximately constant temperature without performing a seperate annealing step. The method can be used to produce thin films of high-Tc-superconductors. It allows a better control of the crystal growth of ternary or higher compounds with comparatively large unit cells.