公开(公告)号：DE10007617B4

公开(公告)日：2006-04-20

申请号：DE10007617

申请日：2000-02-18

Applicant: IBM

Inventor： BERGER RUEDIGER ,  DIETZEL ANDREAS H ,  FOMPEYRINE JEAN ,  KRAUSE FRANK ,  LOCQUET JEAN PIERRE ,  MAECHLER ERICH

IPC: G01Q60/56 ,  G01Q70/14 ,  G01R33/10 ,  G01R33/12 ,  G11B5/31 ,  G11B5/455 ,  H01L41/16

Abstract: A magnetic field characterization process, comprising provision of a magnetosensitive layer between a component surface and a scanning force microscope sensor, is new. Independent claims are also included for the following: (i) apparatus for carrying out the above process; (ii) a scanning force microscope sensor bearing a magnetosensitive layer; and (iii) use of a scanning force microscope sensor for characterizing a magnetic field from a magnetic read/write head with micrometer dimensions.

公开(公告)号：DE10007617A1

公开(公告)日：2000-11-02

申请号：DE10007617

申请日：2000-02-18

Applicant: IBM

Inventor： BERGER RUEDIGER ,  DIETZEL ANDREAS H ,  FOMPEYRINE JEAN ,  KRAUSE FRANK ,  LOCQUET JEAN PIERRE ,  MAECHLER ERICH

IPC: G01Q60/56 ,  G01Q70/14 ,  G01R33/10 ,  G11B5/31 ,  G11B5/455 ,  G12B21/10 ,  G01R33/12 ,  H01L41/16

Abstract: A magnetic field characterization process, comprising provision of a magnetosensitive layer between a component surface and a scanning force microscope sensor, is new. Independent claims are also included for the following: (i) apparatus for carrying out the above process; (ii) a scanning force microscope sensor bearing a magnetosensitive layer; and (iii) use of a scanning force microscope sensor for characterizing a magnetic field from a magnetic read/write head with micrometer dimensions.

公开(公告)号：DE19811347A1

公开(公告)日：1999-09-23

申请号：DE19811347

申请日：1998-03-16

Applicant: IBM

Inventor： DIETZEL ANDREAS H ,  FLEISCHMANN FRIEDRICH G ,  KRAUSE FRANK

IPC: G01Q60/00 ,  G01R33/12 ,  G11B5/82 ,  G11B33/10 ,  G11B5/012

Abstract: The detector consists of a combination of a magnet tester (MAG tester) and a high resolution analyzer. The high resolution analyzer may be an atomic force microscope or a magnetic force microscope. Alternatively, the analyzer may be selected from the group consisting of an optical microscope, profilometer and a micro-Raman apparatus. A method of detecting and classifying defects on the surface of magnetic discs is also claimed.