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公开(公告)号:DE3275964D1
公开(公告)日:1987-05-07
申请号:DE3275964
申请日:1982-04-27
Applicant: IBM
Inventor: MARINACE JOHN CARTER , MCGIBBON RALPH CHARLES
IPC: G03F7/09 , G03F7/11 , H01L21/312 , G03F7/02
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公开(公告)号:DE1280416B
公开(公告)日:1968-10-17
申请号:DEJ0026794
申请日:1964-10-31
Applicant: IBM
Inventor: SILVESTRI VICTOR JOSEPH , LYONS VINCENT JAMES , MARINACE JOHN CARTER
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公开(公告)号:DE1194062B
公开(公告)日:1965-06-03
申请号:DEJ0023660
申请日:1963-05-07
Applicant: IBM
Inventor: MARINACE JOHN CARTER
IPC: C30B25/02 , H01L21/00 , H01L21/205 , H01L27/082 , H01L29/00 , H01L29/06 , H01L29/10 , H01L29/36 , H01L29/73
Abstract: A process for producing a vapour-grown semi-conductor structure including a plurality of layers having a gradient of impurity concentration therein, includes the steps of simultaneously reacting in a first zone of a reaction chamber a halogen transport element with both a source of semi-conductor material and at least two sources of impurities of opposite conductivity type having different degrees of bonding with the halogen, whereby vapours of compounds of the halogen with the semi-conductor material and with the impurities are formed and establishing a temperature gradient between the first zone and a second zone in which a substrate of semi-conductive material is disposed, the temperature gradient being such that the vapours produced by the first step pass into the second zone and are there decomposed to be epitaxially deposited on the substrate, whereby the initially-grown layer of semi-conductor material on the substrate is of a conductivity-type determined by the conductivity type of the impurity which is less strongly bonded to the halogen. Thus n-type material may first be deposited followed by p-type material or i-type material wherein p-type and n-type impurity concentrations exactly correspond. As shown in Fig. 1, sources of iodine 4, Ge doped with Ga 5, and Ge doped with Sb 6 in a container 1 are heated in a first zone by windings 3a to 500 DEG C. and the resultant halide vapours 9 pass to a second zone heated by windings 3b to 380 DEG C. where deposition occurs on a substrate of semi-conductor material, n-type material being deposited initially. Instead of separate sources 5 and 6, a single source of compensated material may be used. Possible structures that can be built up are illustrated in Figs. 3A-3D (not shown) (see Division H1). In one of the structures, part of the vapour-grown layers is etched away to produce a mesa contour. Specification 916,887 is referred to.
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公开(公告)号:DE3062651D1
公开(公告)日:1983-05-19
申请号:DE3062651
申请日:1980-01-23
Applicant: IBM
Inventor: MARINACE JOHN CARTER
IPC: C30B25/18 , C30B29/40 , G01D15/18 , H01L21/20 , H01L21/205 , H01L23/473 , H01L27/14 , H01L29/04 , H01L29/06 , H01L31/00 , H01L31/0264 , H01L33/20 , C30B23/04 , C30B25/04
Abstract: Epitaxial tunnels may be formed in crystalline bodies of crystalline materials by growth of the material on a substrate having two intersecting crystallographic planes that exhibit rapid epitaxial growth and by maintaining the growth until the structure forming along those planes closes, thereby producing a tunnel. P-n junction structures can be made in semiconductor devices by appropriate techniques.
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公开(公告)号:DE1223814B
公开(公告)日:1966-09-01
申请号:DEJ0016099
申请日:1959-03-03
Applicant: IBM DEUTSCHLAND
Inventor: MARINACE JOHN CARTER
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公开(公告)号:DE1222165B
公开(公告)日:1966-08-04
申请号:DEJ0024619
申请日:1963-10-24
Applicant: IBM
Inventor: MARINACE JOHN CARTER
IPC: G02F1/015
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公开(公告)号:DE1190106B
公开(公告)日:1965-04-01
申请号:DEJ0019237
申请日:1960-12-29
Applicant: IBM
IPC: C30B25/02 , H01L21/00 , H01L21/205 , H01L29/00
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公开(公告)号:DE1222586B
公开(公告)日:1966-08-11
申请号:DEJ0019553
申请日:1961-03-09
Applicant: IBM
Inventor: MARINACE JOHN CARTER , RUTZ RICHARD FREDERICK
Abstract: A tunnel diode is formed by epitaxially depositing, in a closed container, a layer of semi-conductor of one conductivity type on a substrate of the opposite conductivity type by vapour deposition from a gaseous compound of the semi-conductor element and a transport element as in the parent Specification, the resulting junction being heat treated, either before, or during, the alloying of ohmic contacts thereto, to increase the ratio of peak to valley currents of the current voltage characteristic of the diode. In examples, germanium is deposited on germanium or gallium arsenide bodies which are then heat treated for 20 seconds-10 minutes at 665 DEG C.
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公开(公告)号:DE1178518B
公开(公告)日:1964-09-24
申请号:DEJ0022464
申请日:1962-10-04
Applicant: IBM
Inventor: MARINACE JOHN CARTER
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