Integrated decoupling capacitor employing conductive through-substrate vias

    公开(公告)号:GB2488078A

    公开(公告)日:2012-08-15

    申请号:GB201209593

    申请日:2010-11-09

    Applicant: IBM

    Abstract: A capacitor (180) in a semiconductor substrate (10) employs a conductive through-substrate via (TSV) (80) as an inner electrode and a columnar doped semiconductor region as an outer electrode. The capacitor (80) provides a large decoupling capacitance in a small area, and does not impact circuit density or a Si3D structural design. Additional conductive TSVs can be provided in the semiconductor substrate (10) to provide electrical connection for power supplies and signal transmission therethrough. The capacitor (180) has a lower inductance than a conventional array of capacitors having comparable capacitance, thereby enabling reduction of high frequency noise in the power supply system of stacked semiconductor chips.

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