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公开(公告)号:DE69127416T2
公开(公告)日:1998-02-26
申请号:DE69127416
申请日:1991-06-21
Applicant: IBM
Inventor: BOSSEN DOUGLAS CRAIG , CHEN CHIN-LONG , HSIAO MU-YUE , MULLIGAN JAMES MICHAEL
Abstract: A single width bidirectional bar code exhibiting inherent self clocking characteristics is provided so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described herein are robust, reliable and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear measurements, an important consideration in semiconductor manufacturing wherein space on chips and wafers is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.
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公开(公告)号:DE69127416D1
公开(公告)日:1997-10-02
申请号:DE69127416
申请日:1991-06-21
Applicant: IBM
Inventor: BOSSEN DOUGLAS CRAIG , CHEN CHIN-LONG , HSIAO MU-YUE , MULLIGAN JAMES MICHAEL
Abstract: A single width bidirectional bar code exhibiting inherent self clocking characteristics is provided so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described herein are robust, reliable and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear measurements, an important consideration in semiconductor manufacturing wherein space on chips and wafers is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.
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