1.
    发明专利
    未知

    公开(公告)号:DE69127416T2

    公开(公告)日:1998-02-26

    申请号:DE69127416

    申请日:1991-06-21

    Applicant: IBM

    Abstract: A single width bidirectional bar code exhibiting inherent self clocking characteristics is provided so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described herein are robust, reliable and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear measurements, an important consideration in semiconductor manufacturing wherein space on chips and wafers is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.

    2.
    发明专利
    未知

    公开(公告)号:DE69127416D1

    公开(公告)日:1997-10-02

    申请号:DE69127416

    申请日:1991-06-21

    Applicant: IBM

    Abstract: A single width bidirectional bar code exhibiting inherent self clocking characteristics is provided so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described herein are robust, reliable and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear measurements, an important consideration in semiconductor manufacturing wherein space on chips and wafers is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.

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