Transistor gate to minimize agglomeration defect sensitivity
    1.
    发明公开
    Transistor gate to minimize agglomeration defect sensitivity 失效
    晶体管栅极以最小化Agglomeratfehlerempfindlichkeit

    公开(公告)号:EP0800216A3

    公开(公告)日:1998-10-07

    申请号:EP97301764

    申请日:1997-03-17

    Applicant: IBM

    CPC classification number: H01L29/4238

    Abstract: A field effect transistor is provided which includes a substrate having an active region and an adjacent non-active region. A gate conductor having a first gate conductor cross-sectional area is provided proximate the active region of the substrate. An increased gate conductor cross-sectional area is provided at the intersection of the active region and the non-active region to provide parallel current paths in order to circumvent agglomeration defects formed at the intersection.

    WIDE ADDER HAVING CRITICAL PATH FOR THREE GATES

    公开(公告)号:JP2003216414A

    公开(公告)日:2003-07-31

    申请号:JP2003004702

    申请日:2003-01-10

    Applicant: IBM

    Abstract: PROBLEM TO BE SOLVED: To provide a device and a method performing a high-speed arithmetic operation including addition in a pipeline circuit. SOLUTION: This device is provided with a plurality of gates in one embodiment, and a critical path passing through a plurality of gates is three-gate lag in some embodiments. This device is provided with a logic first level receiving, at least, two binary numbers and producing multi-bit P, G, Z and K carry signals, a logic second level receiving the multi-bit P, G, Z and K carry signals and producing multi-bit section base carry signal, and a logic third level having a plurality of domino logic gates receiving the multi-bit section base carry signal and forming an addition bit using the multi-bit P, G, Z and K carry signals for producing a sum of the received binary numbers. COPYRIGHT: (C)2003,JPO

    FIELD EFFECT TRANSISTOR
    3.
    发明专利

    公开(公告)号:JPH1012865A

    公开(公告)日:1998-01-16

    申请号:JP7319597

    申请日:1997-03-26

    Applicant: IBM

    Abstract: PROBLEM TO BE SOLVED: To provide a gate conductor which is improved so that its sensitivity to agglomeration failure may be limited at the transistor edge. SOLUTION: A field effect transistor 10 is provided with a substrate having an active region 12 and inactive regions 15a and 15b adjacent thereto. A gate conductor 18 having a sectional region of a first gate conductor is formed near the active region 12 of the substrate. The expanded sectional region of the gate conductor is formed on the cross-section of the region 12 and regions 15a and 15b, and a parallel current path rounding an agglomeration 24 formed on the cross section is provided.

    LOW POWER OFF-CHIP DRIVER CIRCUIT

    公开(公告)号:DE3478731D1

    公开(公告)日:1989-07-20

    申请号:DE3478731

    申请日:1984-07-11

    Applicant: IBM

    Abstract: Power dissipation in an off-chip driver circuit is decreased by utilizing a selectively switched transistor to discharge the base of the output pull-down transistor, and by using a large resistance in the base current path for the first stage of the Darlington pull-up transistors. An additional transistor having a larger emitter area and coupled to a lower potential source is connected in parallel with the normal phase-splitter transistor to provide additional output current sinking capability, and a current mirror is connected to control the current through both the phase splitting transistor and the additional transistor to control the turn-on transition of the pull-down output transistor.

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