公开(公告)号：JPH075408A

公开(公告)日：1995-01-10

申请号：JP2387394

申请日：1994-02-22

Applicant: IBM

Inventor： ICHIOKA ZENICHI ,  RESURII CHIYAARUSU JIENKINSU ,  KIMURA SHINICHI ,  ROBAATO JIYON PORASUTORU ,  RONARUDO ROI TORAUTOMAN ,  ROBAATO RUUKU UIZUNIFU

IPC: G01R31/02 ,  G02F1/13 ,  G02F1/136 ,  G02F1/1362 ,  G02F1/1368 ,  G09G3/00

Abstract: PURPOSE: To provide a method for specifying the type of the defect of a TFT/ LCD array. CONSTITUTION: In a TFT/LCD, a driving pulse is impressed to the end part to be driven of a gate line 24, it is confirmed that the gate line is not disconnected, that is, it is continuous by observing the presence of a corresponding characteristic pulse on a first data line 20 close to the driven end part of this gate line and the presence of the corresponding characteristic pulse on a second data line passing through the opposite end part to this driven end part. In the same way, the gate lines are successively tested, the continuous gate lines at the uppermost side and the continuous gate lines at the lowermost side are found on a display panel, and the completeness of all data lines is evaluated by using those continuous gate lines at the uppermost and lowermost sides. Thus, this TFT/LCD array can be tested.