Patent search ap:("IBM") AND inv:"SINGH VIJENDRA P" Page 1

1.

发明专利
METHOD OF RELATING YIELD IMPROVEMENTS AND REDUCTIONS OF DEFECT OCCURRENCES IN MANUFACTURED S AND MANUFACTURING METHOD UTILIZING SAME 未知

公开(公告)号：CA990408A

公开(公告)日：1976-06-01

申请号：CA173857

申请日：1973-06-12

Applicant: IBM

Inventor： FROOT HOWARD A , SINGH VIJENDRA P

2.

发明专利
METHOD OF DETERMINING YIELD LOSS DUE TO A COMBINATION OF DEFECTS IN MANUFACTURED UNITS MANUFACTURING METHOD UTILIZING SAME 未知

公开(公告)号：CA990407A

公开(公告)日：1976-06-01

申请号：CA173856

申请日：1973-06-12

Applicant: IBM

Inventor： FROOT HOWARD A , SINGH VIJENDRA P

3.

发明专利
未知

公开(公告)号：DE3484636D1

公开(公告)日：1991-07-04

申请号：DE3484636

申请日：1984-07-24

Applicant: IBM

Inventor： SINGH SHANKER , SINGH VIJENDRA P

IPC: G06F12/16 , G06F11/00 , G11C29/00 , G11C29/04 , G06F11/20

4.

发明专利
METHOD OF DETERMINING YIELD LOSS DUE TO A SINGLE DEFECT IN MANUFACTURED UNITS AND FACTURING METHOD UTILIZING SAME 未知

公开(公告)号：CA990409A

公开(公告)日：1976-06-01

申请号：CA174373

申请日：1973-06-19

Applicant: IBM

Inventor： FROOT HOWARD A , SINGH VIJENDRA P

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