Abstract:
PROBLEM TO BE SOLVED: To provide a DRAM and an access method to the DRAM with which a high data rate can be obtained in a Random Row Access. SOLUTION: The DRAM and the access method of the DRAM is constituted so that eight subword lines 16 are chosen from 512 subword lines 16 by selecting one main word line from a plurality of main word lines 14 and one subword line 16 is selected by a signal and an enable signal for selecting the subword line 16. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a timing circuit of which the power consumption is low and the clock period can be varied. SOLUTION: This timing circuit comprises a clock generator 11, comparators 12, 13 comparing inputted control voltage TDV with reference voltage VR, holding circuits 18, 19 holding an output of the comparator, and circuits 20, 21, 22 generating a timing pulse TDT outputted from an output of the holding circuit and a clock outputted by a clock generator. The comparator receives a first clock SS outputted by the clock generator, and is operated only for a time corresponding to a short pulse width of the first clock SS. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a DRAM low in power consumption and low in manufacturing cost without needing an SRAM, and to provide a refresh method. SOLUTION: This DRAM 10 comprises terminals 18a, 18b to which addresses of memory blocks 16a, 16b, 16c, 16d are inputted, selectors 20a, 20b, 20c, 20d selecting T/C of addresses, and a circuit selecting a block from signal of T or C of an address outputted from the selectors 20a, 20b, 20c, 20d. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a memory cell, a storage circuit block, and a data write-n method in which a current value made to flow in a bit line at the time of write-in of data is reduced, further, to provide a memory cell, a storage circuit block, and a data read-out method in which parasitic resistance of a switching element or the like at the time of read-out of data is reduced. SOLUTION: The MRAM 10 comprises a second switching element connecting first wiring structure 18 and an adjacent memory cell 12 in a memory cell 12, and second wiring structure body 20. Also, a third switching element is provided between the second wiring structure body 20 and ground.
Abstract:
PROBLEM TO BE SOLVED: To provide an accessing method for a storage circuit block and the storage circuit block in which high speed access can be performed in row-access. SOLUTION: This accessing method is constituted so that after a first read- out word line 24 is made active, a second read-out word line 24 is raised while the first read-out word line 24 is shut down. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a data input/output method which can minimize losses of data interruption at the time of switching between reading and writing in a DRAM using a common input/output section for reading and writing data, and to provide a DRAM. SOLUTION: This data input/output method comprises a step for holding predetermined data from a memory array 12 by a read command of m-th (m is integer), a step for outputting the data to a common input/output section 30 and holding new data from the memory array 12 upon (m+1)-th read command, a step for holding the data from the common input/output section 30 upon n-th (n is integer) write command, and a step for storing the data in the memory array 12 and holding new data from the common input/output section 30 upon (n+1)-th write command.
Abstract:
PURPOSE: To obtain high-speed switching by performing base charge discharging operation by diode-connected P-channel FET(field-effect transistor) and N- channel FET. CONSTITUTION: When an input varies from a low level to a high level, an FET(T) 4 turns on and T1 turns off, so that the voltage at a node N2 drops. In the beginning, T2 turns on strongly, so base charges of a transistor Q1 are drawn out through T2. As the voltage at the node N2 further drops, the substrate bias effect of T3 becomes small and the substrate bias effect of T2 becomes large to the contrary, so that T3 draws base charges out strongly. The drawn-out base charges are discharged to a ground voltage (GND) through T4. Therefore, a discharge path which efficiently draws the base charges out is formed. Consequently, high-speed switching operation can be obtained.
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor storage device in which seamless data can be inputted and outputted even if interruption occurs during a burst operation. SOLUTION: A plurality of segment arrays #0 to #15 that are independently activated from one another are provided. Each of the segment arrays includes a plurality of unit arrays that are independently activated from one another. Each of the segment arrays is provided with a prefetch latch circuit for latching burst read data and a preload latch circuit for latching burst write data. Even if there is interruption during a burst operation of a unit array UARY 1 in a certain segment array #14, a unit array UARY 2 in another activated segment array #3 starts a burst operation. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To solve such a problem that because a current is required to make to flow for each bit line when data are written simultaneously in a plurality of data bits belonging to the same column address, a current required for write-in is enlarged. SOLUTION: This device comprises a plurality of pairs of bit line comprising a first bit line and a second bit line, a plurality of storage cells storing information in accordance with the direction of a current flowing in the pair of bit line, at least one current driving source connected to at least one of pairs of bit line and making to flow a current in the first bit line and the second bit line of which the directions of current are reverse each other, at least one switch circuit connecting pairs of bit line and pairs of bit line, and a control circuit controlling a connection state of the switch circuit in accordance with information stored in the storage cell. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a nonvolatile magnetic memory cell having a multilayer structure and a storage circuit block using the same. SOLUTION: A nonvolatile magnetic memory cell 40 is constituted to include a second bit line 38b, a second storage device 10b which is connected to the second bit line 38b and includes a ferroelectric layer of which magnetization direction is changed by a direction of a magnetic field generated by an electric current that flows in the second bit line 38b, a second switching device 30b of which one end is connected to a third wiring structure 24, and a second wiring structure 22b which sandwiches the second storage device 10b with the second bit line 38b and allows the second storage device 10b and the other end of the second switching device 30b to connect to each other.