STICKING TO SUBSTRATE OF CONDUCTIVE METAL

    公开(公告)号:JPH07221443A

    公开(公告)日:1995-08-18

    申请号:JP31639194

    申请日:1994-12-20

    Applicant: IBM

    Abstract: PURPOSE: To increase a seeding or activation efficiency of dielectric material for electroless plating to be conducted afterward by depositing conductive metal on the surface of a dielectric substrate using a metal sheet having specific parameters and a rough surface. CONSTITUTION: This method includes a step for obtaining a metal sheet having a rough surface and parameters including Ra=0.00127-0.00203 mm, Rmax=0.00508-0.0140 mm, Sm=0.0254-0.0762 mm, Rp=0.00508-0.00889 mm, and a surface area = 0.000581-0.000774 mm , where Ra is an average roughness, that is, an arithmetical mean of the deviations from a horizontal mean line profile, Rmax is the maximum height from the bottom to the top, Sm is a mean distance on the mean line between high points, Rp is the maximum profile height from the mean line, and the surface area is an area under a surface profile. These values are measured by a TalysurfS-120 Profilometer.

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