Projected memory device with reduced minimum conductance state

    公开(公告)号:GB2603999A

    公开(公告)日:2022-08-24

    申请号:GB202116055

    申请日:2021-11-09

    Applicant: IBM

    Abstract: A projected phase change memory device 100 has phase change material and a projection layer (liner) between first and second electrodes (104, 106). Device conductivity states depend on a ratio between crystalline and amorphous phases of the phase-change material. A size of a conductive portion 110 of the projection layer along an amorphous phase (112, 114, 116) in a reset state of the device is confined to less than a size of the amorphous phase. The projection layer may include a low conductivity, high resistance portion 118, doped differently to the conductive portion, whereby hydrogen or nitrogen doping may change along a gradient for a smooth resistance change. A discontinuity in conductance states of the memory device is created and minimum conductance in the reset state is reduced. The device may be a mushroom cell, lateral cell (fig. 5) or confined cell (fig.6) type, for in-memory and neuromorphic computing.

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