1.
    发明专利
    未知

    公开(公告)号:DE602005007776D1

    公开(公告)日:2008-08-07

    申请号:DE602005007776

    申请日:2005-10-18

    Applicant: IBM

    Abstract: A method (and resultant structure) of forming a plurality of masks, includes creating a reference template, using imprint lithography to print at least one reference template alignment mark on all of a plurality of mask blanks for a given chip set, and printing sub-patterns on each of the plurality of mask blanks, and aligning the sub-patterns to the at least one reference template alignment mark.

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