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公开(公告)号：DE112018000917T5
公开(公告)日：2019-11-14
申请号：DE112018000917
申请日：2018-04-18
Applicant: IBM
Inventor： HORESH LIOR , HORESH RAYA , COHEN GUY , VAN KESSEL THEODORE , WISNIEFF ROBERT LUKE
IPC: G03B17/12
Abstract: Verfahren und Systeme zum Reinigen einer optischen Einheit beinhalten Messen eines Zustands der optischen Einheit. Dabei wird ermittelt, ob die optische Einheit auf Grundlage des gemessenen Zustands der optischen Einheit gereinigt werden muss. Die optische Einheit wird mit Ultraschallschwingungen gereinigt, wenn die optische Einheit gereinigt werden muss.
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公开(公告)号：DE69025158T2
公开(公告)日：1996-09-05
申请号：DE69025158
申请日：1990-08-20
Applicant: IBM
Inventor： JENKINS LESLIE CHARLES , WISNIEFF ROBERT LUKE
Abstract: The present invention relates to a sense circuit (430) for detecting charge on a TFT/LCD cell capacitor (420), which comprises a first, integrating circuit (480) attached to the TFT/LCD cell capacitor through a data line (418), wherein the data line is connected to the cell capacitance through a thin film transistor (410). The thin film transistor including a gate, a drain and a source, wherein the source (412) is connected to the cell capacitor and the drain (414) is connected to the data line. A first, gate supply voltage (VG) adapted to drive the gate of the thin film transistor. And a reset circuit (450) adapted to reset the integrating circuit. This embodiment may further include means (S1) for charging said cell capacitor prior to measuring the charge. The present invention further includes a method of testing a partially constructed electronic circuit, for example the cell of an LCD, prior to installation of the backplate. The partial circuit comprising an array of contact electrodes, for example cell pad electrodes being electrically connected to the contact electrodes. The method comprising the steps of providing the partial circuit with a test electrode, for example an adjacent data electrode extending alongside but spaced from at least a first contact electrode; and measuring the capacitance between the first contact electrode and the test electrode.
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公开(公告)号：DE69025158D1
公开(公告)日：1996-03-14
申请号：DE69025158
申请日：1990-08-20
Applicant: IBM
Inventor： JENKINS LESLIE CHARLES , WISNIEFF ROBERT LUKE
Abstract: The present invention relates to a sense circuit (430) for detecting charge on a TFT/LCD cell capacitor (420), which comprises a first, integrating circuit (480) attached to the TFT/LCD cell capacitor through a data line (418), wherein the data line is connected to the cell capacitance through a thin film transistor (410). The thin film transistor including a gate, a drain and a source, wherein the source (412) is connected to the cell capacitor and the drain (414) is connected to the data line. A first, gate supply voltage (VG) adapted to drive the gate of the thin film transistor. And a reset circuit (450) adapted to reset the integrating circuit. This embodiment may further include means (S1) for charging said cell capacitor prior to measuring the charge. The present invention further includes a method of testing a partially constructed electronic circuit, for example the cell of an LCD, prior to installation of the backplate. The partial circuit comprising an array of contact electrodes, for example cell pad electrodes being electrically connected to the contact electrodes. The method comprising the steps of providing the partial circuit with a test electrode, for example an adjacent data electrode extending alongside but spaced from at least a first contact electrode; and measuring the capacitance between the first contact electrode and the test electrode.
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