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公开(公告)号:GB2579748A
公开(公告)日:2020-07-01
申请号:GB202003124
申请日:2018-07-26
Applicant: IBM
Inventor: YUN SEOG LEE , DEVENDRA SADANA , SOUZA DE
IPC: H01M10/0525
Abstract: A solid-state lithium-based battery having fast charging and recharging speeds (above 3 C) is provided by including a nitrogen-enriched lithiated cathode material surface layer between the lithiated cathode material layer and the lithium-based solid-state electrolyte layer. The nitrogen-enriched lithiated cathode material surface layer can be formed by introducing nitrogen into a lithiated cathode material. The nitrogen can be introduced during the final stage of a deposition process or by utilizing a different process, such as, for example, thermal nitridation, than a deposition process.
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公开(公告)号:GB2574776B
公开(公告)日:2022-03-30
申请号:GB201914035
申请日:2018-02-21
Applicant: IBM
Inventor: YUN SEOG LEE , DEVENDRA SADANA , SOUZA DE
IPC: H01M10/058 , H01M4/64 , H01M10/0525
Abstract: A solid-state lithium-based battery is provided in which the formation of lithium islands (i.e., lumps) during a charging/recharging cycle is reduced, or even eliminated. Reduction or elimination of lithium islands (i.e., lumps) can be provided by forming a lithium nucleation enhancement liner between a lithium-based solid-state electrolyte layer and a top electrode of a solid-state lithium based battery.
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公开(公告)号:GB2580827B
公开(公告)日:2022-02-23
申请号:GB202004615
申请日:2018-09-21
Applicant: IBM
Inventor: JOEL PEREIRA DE SOUZA , NING LI , YAO YAO , DEVENDRA SADANA , YUN SEOG LEE
IPC: H01L33/00
Abstract: A semiconductor device is formed using an n-type layer of Zinc Oxide, a p-type layer formed of a narrow bandgap material. The narrow bandgap material uses a group 3A element and a group 5A element. A junction is formed between the n-type layer and the p-type layer, the junction being operable as a heterojunction diode having a rectifying property at a temperature range, the temperature range having a high limit at room temperature.
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公开(公告)号:GB2579748B
公开(公告)日:2022-01-19
申请号:GB202003124
申请日:2018-07-26
Applicant: IBM
Inventor: YUN SEOG LEE , DEVENDRA SADANA , SOUZA DE
IPC: H01M10/0525
Abstract: A solid-state lithium-based battery having fast charging and recharging speeds (above 3 C) is provided by including a nitrogen-enriched lithiated cathode material surface layer between the lithiated cathode material layer and the lithium-based solid-state electrolyte layer. The nitrogen-enriched lithiated cathode material surface layer can be formed by introducing nitrogen into a lithiated cathode material. The nitrogen can be introduced during the final stage of a deposition process or by utilizing a different process, such as, for example, thermal nitridation, than a deposition process.
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公开(公告)号:GB2584548B
公开(公告)日:2021-03-31
申请号:GB202005406
申请日:2018-09-11
Applicant: IBM
Inventor: YUN SEOG LEE , STEPHEN W BEDELL , JOEL PEREIRA DE SOUZA , DEVENDRA SADANA
IPC: H01M10/04 , H01M4/131 , H01M4/136 , H01M4/505 , H01M4/525 , H01M4/58 , H01M4/66 , H01M4/78 , H01M10/0525 , H01M10/058
Abstract: High-capacity (i.e., a capacity of 50 mAh/gm or greater) and high-performance rechargeable batteries are provided that contain a rechargeable battery stack that includes a spalled material structure that includes a cathode material layer that is attached to a stressor material. The cathode material may include a single crystalline that is devoid of polymeric binders. The stressor material serves as a cathode current collector of the rechargeable battery stack.
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公开(公告)号:GB2580827A
公开(公告)日:2020-07-29
申请号:GB202004615
申请日:2018-09-21
Applicant: IBM
Inventor: JOEL PEREIRA DE SOUZA , NING LI , YAO YAO , DEVENDRA SADANA , YUN SEOG LEE
IPC: H01L33/00
Abstract: A semiconductor device is formed using an n-type layer of Zinc Oxide, a p-type layer formed of a narrow bandgap material. The narrow bandgap material uses a group 3A element and a group 5A element. A junction is formed between the n-type layer and the p-type layer, the junction being operable as a heterojunction diode having a rectifying property at a temperature range, the temperature range having a high limit at room temperature.
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公开(公告)号:GB2581902B
公开(公告)日:2022-04-20
申请号:GB202006963
申请日:2018-11-16
Applicant: IBM
Inventor: NING LI , YUN SEOG LEE , JOEL PEREIRA DE SOUZA , DEVENDRA SADANA
IPC: H01L29/78 , G11C11/54 , H01M10/0585
Abstract: A semiconductor structure is provided that contains a non-volatile battery which controls gate bias and has increased output voltage retention and voltage resolution. The semiconductor structure may include a semiconductor substrate including at least one channel region that is positioned between source/drain regions. A gate dielectric material is located on the channel region of the semiconductor substrate. A battery stack is located on the gate dielectric material. The battery stack includes, a cathode current collector located on the gate dielectric material, a cathode material located on the cathode current collector, a first ion diffusion barrier material located on the cathode material, an electrolyte located on the first ion diffusion barrier material, a second ion diffusion barrier material located on the electrolyte, an anode region located on the second ion diffusion barrier material, and an anode current collector located on the anode region.
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公开(公告)号:GB2584548A
公开(公告)日:2020-12-09
申请号:GB202005406
申请日:2018-09-11
Applicant: IBM
Inventor: YUN SEOG LEE , STEPHEN W BEDELL , JOEL PEREIRA DE SOUZA , DEVENDRA SADANA
IPC: H01M10/04 , H01M4/131 , H01M4/136 , H01M4/505 , H01M4/525 , H01M4/58 , H01M4/66 , H01M4/78 , H01M10/0525 , H01M10/058
Abstract: High-capacity (i.e., a capacity of 50 mAh/gm or greater) and high-performance rechargeable batteries are provided that contain a rechargeable battery stack that includes a spalled material structure that includes a cathode material layer that is attached to a stressor material. The cathode material may include a single crystalline that is devoid of polymeric binders. The stressor material serves as a cathode current collector of the rechargeable battery stack.
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公开(公告)号:GB2581902A
公开(公告)日:2020-09-02
申请号:GB202006963
申请日:2018-11-16
Applicant: IBM
Inventor: NING LI , YUN SEOG LEE , JOEL PEREIRA DE SOUZA , DEVENDRA SADANA
IPC: H01L21/822
Abstract: A semiconductor structure is provided that contains a non-volatile battery which controls gate bias and has increased output voltage retention and voltage resolution. The semiconductor structure may include a semiconductor substrate including at least one channel region that is positioned between source/drain regions. A gate dielectric material is located on the channel region of the semiconductor substrate. A battery stack is located on the gate dielectric material. The battery stack includes, a cathode current collector located on the gate dielectric material, a cathode material located on the cathode current collector, a first ion diffusion barrier material located on the cathode material, an electrolyte located on the first ion diffusion barrier material, a second ion diffusion barrier material located on the electrolyte, an anode region located on the second ion diffusion barrier material, and an anode current collector located on the anode region.
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公开(公告)号:GB2574776A
公开(公告)日:2019-12-18
申请号:GB201914035
申请日:2018-02-21
Applicant: IBM
Inventor: YUN SEOG LEE , DEVENDRA SADANA , SOUZA DE
IPC: H01M10/058 , H01M4/64 , H01M10/0525
Abstract: A solid-state lithium-based battery is provided in which the formation of lithium islands (i.e., lumps) during a charging/recharging cycle is reduced, or even eliminated. Reduction or elimination of lithium islands (i.e., lumps) can be provided by forming a lithium nucleation enhancement liner between a lithium-based solid-state electrolyte layer and a top electrode of a solid-state lithium based battery.
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