公开(公告)号：JP2001273790A

公开(公告)日：2001-10-05

申请号：JP2001048272

申请日：2001-02-23

Applicant: IBM ,  INFINEON TECHNOLOGIES CORP

Inventor： KIRIHATA TOSHIAKI ,  GABRIEL DANIEL

IPC: G11C11/413 ,  G11C11/401 ,  G11C29/00 ,  G11C29/04

Abstract: PROBLEM TO BE SOLVED: To provide a memory device including a means coupling plural data storing cells, at least one redundant data storing cell, a redundant match detecting circuit, and a programmable fuse to a redundant match detecting circuit. SOLUTION: When a redundant match detecting circuit detects the prescribed condition set by a programmable fuse, a defective data is replaced by one redundant data storage region. Decoding is achieved by selecting an (e) fuse to be cut off by a data bus. Data bus, also, reads a state of the (e) fuse, and is used for guaranteeing that the (e) fuse is correctly cut off. Electric power is applied effectively to a selected (e) fuse while the data bus is shared to decode and verify the (e) fuse. Time-muliplex is used for transfer operation to reduce the number of communication channels between the (e) fuse and the redundant match detecting circuit, and transferring successively (e) fuse information to the redundant match detecting circuit can be performed. Actual time-multiplex operation for performing transfer is preferable to make 'enable' only after a chip is made a power source apply state.

公开(公告)号：JP2001068555A

公开(公告)日：2001-03-16

申请号：JP2000210177

申请日：2000-07-11

Applicant: IBM ,  INFINEON TECHNOLOGIES CORP

Inventor： NARAYAN CHANDRASEKHAR ,  ARNDT KENNETH ,  LACHTRUPP DAVID ,  BRINTZINGER AXEL ,  GABRIEL DANIEL ,  KIRIHATA TOSHIAKI

IPC: H01L21/82 ,  H01H85/00 ,  H01H85/02 ,  H01H85/044 ,  H01H85/046 ,  H01L21/66 ,  H01L23/525 ,  H01L27/02

Abstract: PROBLEM TO BE SOLVED: To combine a laser actuation fuse with an electric starting fuse in order to increase total yield of product. SOLUTION: A plurality of different types of fuses 510, each serving a specified purpose, are arranged on a semiconductor integrated circuit wafer, such that a type of fuse can be actuated without missing the function of different types of fuses. A first type of fuse, e.g. a laser actuation fuse, is principally used for repairing a wafer level defect and a second type of fuse, e.g. an electric starting fuse, is used for repairing a defect found after an IC chip is mounted on a module and a stress is applied to the module during burn-in test. The module level defect is an unit cell trouble corrected normally by an electrically programmed fuse, in order to actuate a module level redundancy arrangement.

公开(公告)号：JP2000332122A

公开(公告)日：2000-11-30

申请号：JP2000109755

申请日：2000-04-11

Applicant: IBM ,  INFINEON TECHNOLOGIES CORP

Inventor： CHANDRASEKHAR NARAYAN ,  GABRIEL DANIEL

IPC: H01L21/82 ,  H01H85/00 ,  H01L23/525 ,  H05K1/00 ,  H01H85/044

Abstract: PROBLEM TO BE SOLVED: To provide a conductive contact and a slotted stripe which are so designed as to reduce the resistance between the contact and fuse and then minimize the level of an external applied voltage to program the fuse. SOLUTION: The electric fuse 202 embedded in a multi-layered structure is programmed by remotely applying a voltage to the fuse from the top layer 230 of the structure. A fuse pad 200 integrated with the fuse is stacked on a conductive pad and an electric path is provided between the fuse and top layer. The conductive pad is as large as the fuse pad. This constitution greatly lowers the voltage needed to program the electric fuse embedded in the multi- layered structure.