公开(公告)号：HK1030485A1

公开(公告)日：2001-05-04

申请号：HK01101440

申请日：2001-02-28

Applicant: IBM ,  INFINEON TECHNOLOGIES CORP

Inventor： HOUGHTON RUSSELL J ,  NORRIS ALAN D ,  CLINTON MICHAEL P ,  SCHNELL JOSEPH T ,  ENK KLAUS G

IPC: G01R31/28 ,  G01R31/3183 ,  G11C11/401 ,  G11C29/02 ,  G11C29/04 ,  G11C29/50 ,  H01L21/66 ,  H01L21/8242 ,  H01L27/108 ,  H01L ,  G01R ,  G11C

公开(公告)号：DE10356956A1

公开(公告)日：2004-07-22

申请号：DE10356956

申请日：2003-12-05

Applicant: INFINEON TECHNOLOGIES AG ,  IBM

Inventor： HOKENMAIER WOLFGANG ,  NIERLE KLAUS ,  NORRIS ALAN D

IPC: G11C29/48 ,  G11C29/00

Abstract: A test operation of a memory array permits changing the test vector during the test by controlling the contents of a test vector through at least two external terminals not used during the test to change from a first to a second test vector, both of said first and second test vectors being stored in a controllable register connected to the external terminals.