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公开(公告)号：DE60109478D1
公开(公告)日：2005-04-21
申请号：DE60109478
申请日：2001-10-19
Applicant: INFINEON TECHNOLOGIES AG
Inventor： LEHMANN GUNTHER , DANIEL GABRIEL , FRANKOWSKY GERD
Abstract: A circuit for programming electrical fuses, in accordance with the present invention, includes a shift register including a plurality of latches. Each latch has a corresponding switch and a corresponding electrical fuse. A bit generator generates a single bit of a first state and all other bits of a second state. The bit generator propagates the generated bits into the shift register in accordance with a clock signal. Each switch enables conduction through the corresponding electrical fuse in accordance with the generated bits stored in the corresponding latch. A blow voltage line connects to the electrical fuses. The blow voltage line is activated to blow fuses in accordance with programming data such that the electrical fuses are programmed in accordance with the programming data when the single bit of the first state is stored in the latch corresponding to the fuse to be programmed.
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公开(公告)号：DE69911364T8
公开(公告)日：2004-11-25
申请号：DE69911364
申请日：1999-12-20
Applicant: INFINEON TECHNOLOGIES AG , IBM
Inventor： KIRIHATA TOSHIAKI , DANIEL GABRIEL
IPC: G11C11/401 , G11C29/00 , G11C29/04 , H01L21/82 , H01L21/8242 , H01L27/108 , G06F11/20
Abstract: The present disclosure relates to semiconductor memories and more particularly, to an improved method and apparatus for replacing defective row/column lines. In accordance with the present invention, a high replacement flexibility redundancy and method is employed to increase chip yield and prevent sense amplifier signal contention. Redundancy elements are integrated in at least two of a plurality of memory arrays, which don't share the sense amplifiers. Thus, no additional sense amplifiers are required. A defective row/column line in a first array or block is replaced with a redundant row/column line from its own redundancy. A corresponding row/column line whether defective or not is replaced in a second array or block, which does not share sense amplifiers with the first block. The corresponding row/column is replaced to mimic the redundancy replacement of the first block thereby increasing flexibility and yield as well as preventing sensing signal contention.
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公开(公告)号：DE60013168D1
公开(公告)日：2004-09-23
申请号：DE60013168
申请日：2000-10-24
Applicant: INFINEON TECHNOLOGIES AG
Inventor： DANIEL GABRIEL , WEINFURTNER OLIVER
Abstract: A circuit for storing a bit of data is provided, where the circuit includes a first fuse having a first end and a second end and a second fuse having a third end and a fourth end. The first end of the first fuse is connected to a logic 0 input and its second end is connected to a common output. The third end of the second fuse is connected to a logic 1 input and the fourth end is connected to the common output. To store the bit of data, one of the first and second fuses is selectively blown. Hence, two fuses can be used to store a bit of information.
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Patent Agency Ranking
公开(公告)号：DE60011190D1
公开(公告)日：2004-07-08
申请号：DE60011190
申请日：2000-07-25
Applicant: INFINEON TECHNOLOGIES AG , IBM
Inventor： NARAYAN CHANDRASEKHAR , ARNDT KENNETH , KIRIHATA TOSHIAKI , DANIEL GABRIEL , LACHTRUPP DAVID , BRINTZINGER AXEL
IPC: H01L21/82 , H01H85/00 , H01H85/02 , H01H85/044 , H01H85/046 , H01L21/66 , H01L23/525 , H01L27/02
Abstract: A plurality of fuses of different types, each type of fuse serving a specific purpose are positioned on a semiconductor integrated circuit wafer, wherein activating one type of fuse does not incapacitate fuses of a different type. Fuses of the first type, e.g., laser activated fuses, are primarily used for repairing defects at the wafer level, whereas fuses of the second type, e.g., electrically activated fuses, are used for repairing defects found after mounting the IC chips on a module and stressing the module at burn-in test. Defects at the module level typically are single cell failures which are cured by the electrically programmed fuses to activate module level redundancies.
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公开(公告)号：DE60109478T2
公开(公告)日：2006-04-13
申请号：DE60109478
申请日：2001-10-19
Applicant: INFINEON TECHNOLOGIES AG
Inventor： LEHMANN GUNTHER , DANIEL GABRIEL , FRANKOWSKY GERD
Abstract: A circuit for programming electrical fuses, in accordance with the present invention, includes a shift register including a plurality of latches. Each latch has a corresponding switch and a corresponding electrical fuse. A bit generator generates a single bit of a first state and all other bits of a second state. The bit generator propagates the generated bits into the shift register in accordance with a clock signal. Each switch enables conduction through the corresponding electrical fuse in accordance with the generated bits stored in the corresponding latch. A blow voltage line connects to the electrical fuses. The blow voltage line is activated to blow fuses in accordance with programming data such that the electrical fuses are programmed in accordance with the programming data when the single bit of the first state is stored in the latch corresponding to the fuse to be programmed.
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公开(公告)号：DE60110297T2
公开(公告)日：2006-02-09
申请号：DE60110297
申请日：2001-02-23
Applicant: INFINEON TECHNOLOGIES AG , IBM
Inventor： KIRIHATA TOSHIAKI , DANIEL GABRIEL
IPC: G11C11/413 , G06F11/20 , G11C11/401 , G11C29/00 , G11C29/04
Abstract: A memory device that includes a plurality of data storage cells; at least one redundancy data storage cell; a redundancy match detection circuit; and a means for coupling programmable fuses to the redundancy match detection circuit, wherein a defective data storage is replaced by one redundancy data storage when the redundancy match detection detects a pre-determined condition set by said programmable fuse is described. Decoding is accomplished by a data bus selecting the e-fuse to be blown. The data bus is also used for reading the state of the e-fuses to ensure that the e-fuses are correctly blown. Power is effectively applied to the selected e-fuses while sharing the data bus for e-fuse decoding and verification. In order to reduce the number of communication channels between e-fuses and the redundancy match detection circuitry, the transfer operation uses time multiplexing, allowing e-fuse information to be transferred to the redundancy match detection circuitry sequentially. The actual time multiplexing operation for performing the transfer is preferably enabled only after the chip power-up state.
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公开(公告)号：DE60011190T2
公开(公告)日：2005-06-30
申请号：DE60011190
申请日：2000-07-25
Applicant: INFINEON TECHNOLOGIES AG , IBM
Inventor： NARAYAN CHANDRASEKHAR , ARNDT KENNETH , KIRIHATA TOSHIAKI , DANIEL GABRIEL , LACHTRUPP DAVID , BRINTZINGER AXEL
IPC: H01L21/82 , H01H85/00 , H01H85/02 , H01H85/044 , H01H85/046 , H01L21/66 , H01L23/525 , H01L27/02
Abstract: A plurality of fuses of different types, each type of fuse serving a specific purpose are positioned on a semiconductor integrated circuit wafer, wherein activating one type of fuse does not incapacitate fuses of a different type. Fuses of the first type, e.g., laser activated fuses, are primarily used for repairing defects at the wafer level, whereas fuses of the second type, e.g., electrically activated fuses, are used for repairing defects found after mounting the IC chips on a module and stressing the module at burn-in test. Defects at the module level typically are single cell failures which are cured by the electrically programmed fuses to activate module level redundancies.
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公开(公告)号：DE60013168T2
公开(公告)日：2005-08-11
申请号：DE60013168
申请日：2000-10-24
Applicant: INFINEON TECHNOLOGIES AG
Inventor： DANIEL GABRIEL , WEINFURTNER OLIVER
Abstract: A circuit for storing a bit of data is provided, where the circuit includes a first fuse having a first end and a second end and a second fuse having a third end and a fourth end. The first end of the first fuse is connected to a logic 0 input and its second end is connected to a common output. The third end of the second fuse is connected to a logic 1 input and the fourth end is connected to the common output. To store the bit of data, one of the first and second fuses is selectively blown. Hence, two fuses can be used to store a bit of information.
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