公开(公告)号：DE10326774A1

公开(公告)日：2004-04-15

申请号：DE10326774

申请日：2003-06-13

Applicant: INFINEON TECHNOLOGIES AG

Inventor： EDMONDS JOHNATHAN ,  HUCKABY JENNIFER FAYE ,  PARTSCH TORSTEN ,  TIAN TAO

IPC: G11C29/02 ,  G11C11/407 ,  G11C7/22

公开(公告)号：DE10330839A1

公开(公告)日：2004-02-26

申请号：DE10330839

申请日：2003-07-08

Applicant: INFINEON TECHNOLOGIES AG

Inventor： EDMONDS JOHNATHAN

IPC: H03M1/18 ,  H03M1/12

Abstract: A tunable analog-to-digital converter which generates samples having M-bits for use with an operating circuit. The operating circuit generates a first enable signal to instruct the analog-to-digital converter to turn on. Additionally, a sensor generates an analog signal in response to a condition. The tunable analog-to-digital converter includes a primary analog-to-digital converter which receives the analog signal and converts the analog signal to a primary digital signal upon receipt of the first enable signal. The tunable analog-to-digital converter also includes a comparator and a secondary analog-to-digital converter. The comparator compares the value of the primary digital signal to a predetermined value and generates a second enable signal depending on the value of the primary digital signal and the predetermined value. The secondary analog-to-digital converter receives the analog signal and converts the analog signal to a secondary digital signal upon receipt of the second enable signal.

公开(公告)号：DE10321451A1

公开(公告)日：2004-01-08

申请号：DE10321451

申请日：2003-05-13

Applicant: INFINEON TECHNOLOGIES AG

Inventor： EDMONDS JOHNATHAN ,  HUCKABY JENNIFER FAYE ,  PARTSCH TORSTEN

IPC: G11C7/22 ,  G11C7/24 ,  G11C11/4076 ,  G11C11/4078

Abstract: A method of protecting an integrated circuit that includes sensing a temperature of an integrated circuit, comparing the sensed temperature with a threshold temperature and controlling operation of the integrated circuit based on the comparing.

公开(公告)号：DE10321476A1

公开(公告)日：2003-12-04

申请号：DE10321476

申请日：2003-05-13

Applicant: INFINEON TECHNOLOGIES AG

Inventor： EDMONDS JOHNATHAN ,  HUCKABY JENNIFER FAYE ,  PARTSCH TORSTEN ,  WELCH MATT

IPC: G11C7/04 ,  G11C7/22 ,  G11C7/24 ,  G11C11/4076 ,  G11C11/4078 ,  G11C5/00

Abstract: A method of protecting an integrated circuit that includes sensing a temperature of an integrated circuit that has a data pin, generating a temperature data signal based on the sensing, implementing a temperature sensing protocol and supplying the temperature data signal to the data pin based on the temperature sensing protocol.

公开(公告)号：DE10342474A1

公开(公告)日：2004-04-15

申请号：DE10342474

申请日：2003-09-15

Applicant: INFINEON TECHNOLOGIES AG

Inventor： EDMONDS JOHNATHAN ,  HUCKABY JENNIFER FAYE ,  PARTSCH TORSTEN

IPC: G11C7/20 ,  G11C7/22 ,  G11C11/4072 ,  G11C11/4076

Abstract: A method of using a memory chip that includes operating a memory chip of a memory system and sending a command signal to the memory chip, wherein the command signal contains information regarding an operational frequency of a system clock signal of the memory system.

公开(公告)号：DE10330111A1

公开(公告)日：2004-04-08

申请号：DE10330111

申请日：2003-07-03

Applicant: INFINEON TECHNOLOGIES AG

Inventor： BOSCH KATHERINE ,  EDMONDS JOHNATHAN ,  HUCKABY JENNIFER FAYE ,  NINO JUN LEONEL R ,  PARTSCH TORSTEN

IPC: G11C11/4072 ,  G11C29/00

Abstract: A method of self-repair for a DRAM integrated circuit includes internally generating a bit pattern and writing the pattern to an array of memory cells within the integrated circuit. The DRAM integrated circuit reads from the array and internally compares the read data with the generated pattern to determine addresses for failed memory cells. The DRAM integrated circuit sets internal soft fuses that record the addresses of the failed memory cells and provide substitute memory cells for the failed memory cells from a redundant memory portion of the array. The self-repair process occurs each time the DRAM integrated circuit is powered up, thus permitting the integrated circuit to adapt to failures when installed in electronic devices and lessening the need for repair during manufacturing.

公开(公告)号：DE10334386A1

公开(公告)日：2004-02-26

申请号：DE10334386

申请日：2003-07-28

Applicant: INFINEON TECHNOLOGIES AG

Inventor： EDMONDS JOHNATHAN ,  HUCKABY JENNIFER FAYE ,  PARTSCH TORSTEN

IPC: G01K7/42 ,  G05B19/042 ,  H01L23/58 ,  G06F1/04

Abstract: A method of throttling the frequency with which an integrated circuit is accessed includes sensing the temperature of the integrated circuit die and converting the sensed temperature to a digital signal. The digital signal is stored in a register of the integrated circuit. The digital signal is read, and the frequency with which the integrated circuit is accessed is adjusted dependent at least in part upon the temperature of the die as indicated by the digital signal.