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10 records (took 0.023 seconds)

    1.
    发明专利
    未知

    公开(公告)号：DE102005004379B4

    公开(公告)日：2007-12-27

    申请号：DE102005004379

    申请日：2005-01-31

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： PERNER MARTIN ,  KILIAN VOLKER

    IPC: G11C29/24

    Abstract: The method involves coupling a regular storage cell (6) with redundant storage cell (7) by a coupling circuit (12). A regular storage area (4) is parallely and uniformly loaded with a redundant storage area (5) by temperature, stress and/or voltage loads. Functional capability of the area (4) together with the area (5) is tested. The cells are evaluated and determined based on the testing result, and defective cells are deactivated. An independent claim is also included for a system with a dynamic random access memory (DRAM) semiconductor storage component.

    3.
    发明专利
    未知

    公开(公告)号：DE10154812A1

    公开(公告)日：2003-06-05

    申请号：DE10154812

    申请日：2001-11-08

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： KILIAN VOLKER ,  ROTH RICHARD ,  SOMMER STEFAN ,  HAUPTNER LENART

    IPC: G11C7/22 ,  G11C11/4076

    Abstract: A tuning circuit for setting a signal propagation time on a signal line in an integrated circuit, particularly a DRAM circuit, has a transistor and a capacitor. A control connection of the transistor is connected to a control unit for the purpose of switchably connecting the capacitor to the signal line through the transistor in order to set the signal propagation time on the signal line on the basis of application of a control signal, generated in the control unit, to the control connection on the transistor.

    7.
    发明专利
    未知

    公开(公告)号：DE10155467A1

    公开(公告)日：2003-05-22

    申请号：DE10155467

    申请日：2001-11-09

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： HAUPTNER LENART ,  KILIAN VOLKER ,  SOMMER STEFAN ,  ROTH RICHARD

    IPC: G01R31/28 ,  G01R31/02

    Abstract: In the case of the present-day trend of miniaturizing housed electronic devices, there is the problem that the contact spacings between the terminal pins becomes smaller and smaller and are no longer visible optically. As a result, it also becomes more difficult to solder the contacts of correspondingly designed contact bases, which for example, are designed as test bases, to the individual conductor tracks of the printed circuit board. Possible faulty soldering points, short circuits or interruptions have hitherto been tracked down by laborious manual measurement using the TDR method. The invention proposes producing a test device in which in each case two terminal pins are connected to a short-circuiting bridge. The test device is inserted into the contact base and connects two signal paths of the printed circuit board on which the propagation time of a reflected wave can be measured.

    9.
    发明专利
    未知

    公开(公告)号：DE10155467B4

    公开(公告)日：2004-11-25

    申请号：DE10155467

    申请日：2001-11-09

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： HAUPTNER LENART ,  KILIAN VOLKER ,  SOMMER STEFAN ,  ROTH RICHARD

    IPC: G01R31/28 ,  G01R31/02

    Abstract: In the case of the present-day trend of miniaturizing housed electronic devices, there is the problem that the contact spacings between the terminal pins becomes smaller and smaller and are no longer visible optically. As a result, it also becomes more difficult to solder the contacts of correspondingly designed contact bases, which for example, are designed as test bases, to the individual conductor tracks of the printed circuit board. Possible faulty soldering points, short circuits or interruptions have hitherto been tracked down by laborious manual measurement using the TDR method. The invention proposes producing a test device in which in each case two terminal pins are connected to a short-circuiting bridge. The test device is inserted into the contact base and connects two signal paths of the printed circuit board on which the propagation time of a reflected wave can be measured.

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