Abstract:
PROBLEM TO BE SOLVED: To perform efficient power source control while preventing a malfunction in a memory device provided with a low power consumption mode. SOLUTION: The memory device includes a power source system having many power source devices for supplying voltage or current to the memory device, a controller for supplying, into the power source system, a state control signal to instruct the power source devices to be in an active state or a standby state, and a self-refresh oscillator for generating a self-refresh clock signal with a suitable cycle for refreshing memory cells of the memory device. The controller uses the self-refresh clock signal, and delays transition of the state control signal from the active state to the standby state, relatively to the state change corresponding to at least one external signal receiving from the memory device. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
The present invention avoids leakage in semiconductors, such as dynamic random access memory (DRAM) devices, caused by word line/bit line shorts by locating transistors (e.g., isolator, current limiter, equalize) inside isolated p-wells.
Abstract:
The circuit outputs voltage levels lower than the low state and higher than the high state. Two transistors of a first conductivity type have first connections connected to a supply voltage higher than a positive supply voltage. A negative supply voltage is connected to a third transistor of a second type. Fourth and fifth transistors of the second type have first connections connected to a voltage lower than the negative supply voltage. The circuit has input and output lines and outputs a voltage level lower than the low state and a voltage level higher than the high state. First and second transistors (P1,P2) of a first conductivity type have first connections connected to a supply voltage (VPP) higher than a positive supply voltage (VDD). A negative supply voltage (VSS) is connected to a third transistor (N3) of a second conductivity type and fourth and fifth transistors (N1,N2) of the second type have first connections connected to a low voltage lower (VWL) than the negative supply voltage.
Abstract:
A memory configuration is divided into memory blocks and allows a flexible access to redundant memory locations by using both, redundant column lines and redundant row lines of a particular memory block to repair defects of another memory block. Thus more defects can be repaired in the other memory block than there are redundant memory locations present in the other memory block. A method of accessing redundant memory locations is also provided. The memory configuration and the method of accessing redundant memory locations can be used in all memory architectures that write or read one or more bits of information per address in a parallel manner.
Abstract:
An integrated charge pump comprises a capacitor (1), a control (2) to operate the pump between two phases, first transistors (T3,T5) to charge the capacitor in the first phase and second transistors (T1,T2) to give the potential in the second phase. The potential gradient is so chosen that the breakthrough voltage of the first transistor is not exceeded.
Abstract:
An ordering method for ranking membership function values (Wi) of linguistic input values (LWEi) in a fuzzy logic processor is presented The steps of the method are: a) within the time of one processor clock, successively reading the membership function values (Wi) into holding elements (L1 . . . L4) and, after every reading, outputs of the holding elements are through-connected onto outputs (A . . . D) of a selector (SC) as determined by a selection signal (SEL); b) comparing the signals at the outputs (A . . . D) of the selector in comparators (C1,C2,C3) and generating control signals (S1 . . . S3) for a unit (SELC) which in turn generates the new selection signal (SEL); and c) writing pointers (MAX, MAX', MAX'', MIN', MIN) into position registers (P1 . . . P5) with the assistance of the control signals (S1 . . . S3) such that the pointers enable a ranked access to the membership function values (Wi) in the holding elements (L1 . . . L4).
Abstract:
A psuedostatic memory circuit is selected by a memory selection signal. A control circuit, in a first operating mode, carries out a refresh of the memory area at a refresh address after reception of the refresh request signal by generation of a refresh signal if the memory circuit is deselected or if, in the event of selection of the memory circuit by the memory selection signal, the access to the memory area is ended before the generation of a further refresh request signal. The control circuit, in a second operating mode, interrupts an access to the memory area for the writing and read-out of data and carries out a refresh of the memory area by generation of a refresh signal if the memory circuit is selected and a further refresh request signal is received before the ending of the access to the memory area.
Abstract:
An integrated circuit comprises an input for receiving a supply voltage, a field-effect transistor with a gate which is connected to the input in such a manner that the gate voltage present at the gate is a function of the supply voltage, a voltage source for generating a reference voltage which is connected to the input for receiving the supply voltage, a device for determining whether the gate voltage of the field effect transistor exceeds a turn-on voltage of the field-effect transistor, and a device for generating a ready signal which indicates that the supply voltage is high enough for performing functions of the integrated circuit, the device for generating being constructed for generating the ready signal when the gate voltage of the field-effect transistor exceeds the turn-on voltage of the field-effect transistor. The integrated circuit is characterized by the fact that a device for detecting the reference voltage generated by the voltage source is provided and the device for generating the ready signal is also constructed for generating the ready signal only when the reference voltage lies within a predetermined interval.