Patent search ap:("INFINEON TECHNOLOGIES AG") AND inv:"WANG TAO" Page 1

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发明专利
Die testing system for integrated circuit, compares original data from write registers and read data received from the dies of semiconductor wafer and generates test result of die 未知

公开(公告)号：DE10342275A1

公开(公告)日：2004-03-25

申请号：DE10342275

申请日：2003-09-12

Applicant: INFINEON TECHNOLOGIES AG

Inventor： DIETZ JAMES J , MA DAVID SUITWAI , REN BING , WANG TAO

IPC: G01R31/317 , G01R31/3187 , G01R31/3193 , H01L21/66

Abstract: The write registers (102,104,106) write original data onto the dies (114) of a semiconductor wafer. A comparator compares original data from the write registers and the read data received from the die, to generate test result of the die. An Independent claim is also included for die testing method.

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