Abstract:
Embodiments including systems, methods, and apparatuses associated with refreshing memory cells are disclosed herein. In embodiments, a memory controller may be configured to perform a read operation on one or more memory cells in a cross-point non-volatile memory such as a phase change memory (PCM). The one or more memory cells may have voltage values respectively set to a first threshold voltage or a second threshold voltage. Based on the read, the memory controller may identify the memory cells in the cross-point non-volatile memory that are set to the second threshold voltage, and refresh the voltage values of those cells without altering the voltage values of the memory cells in the cross-point non-volatile memory that are set to the first threshold voltage. Other embodiments may be described or claimed.
Abstract:
A system includes a processor and a flash memory block that may receive an operating voltage sufficient for reading a memory cell. A standby oscillator may generate a first signal to a Power-Supply-In-Package block and a second, higher frequency signal to a regulator block. The first signal may control the time at which charge is stored on a first capacitor that may be used to provide charge in a standby mode to a second capacitor. The second signal may control the time at which charge is stored on the second capacitor.
Abstract:
Apparatus, systems, and methods to correct for threshold voltage drift in non- volatile memory devices are disclosed and described. In one example, a compensated demarcation voltage is generated by either a time-based drift compensation scheme or a disturb-based drift compensation scheme, and read and write operations to the non- volatile memory are carried out using the compensated voltage threshold.
Abstract:
Data reliability and integrity may be compromised when memory resources used to store the data reach elevated temperatures. A sensor in the memory resource may monitor the temperature of the memory resource in real-time. A comparator in the memory resource may indicate a high temperature condition to a memory controller. The memory controller, in response to the high temperature condition, can restrict or halt data flow to the memory resource. When the real-time temperature of the memory resource falls below a defined threshold, the memory controller may resume data flow to the memory resource.
Abstract:
Examples are given for techniques for entry to a lower power state for a memory device or die. The examples to include delaying transitions of the memory device or die from a first higher consuming power state to a second relatively lower power state using one or more programmable counters maintained at or with the memory device.
Abstract:
An apparatus for data storage is presented. In one embodiment, the apparatus includes a phase change memory device comprising phase change memory storage elements. The apparatus further includes control logic to control two or more set pipelines to serve memory requests in a staggered manner, such that set operations of the memory requests begin at different times.
Abstract:
Variable voltage source (80) for a flash memory device. The variable voltage source (80) receives an input voltage (V) and provides an output voltage (Vout) for a read or write operations in the flash memory. The variable voltage source (80) further comprises a voltage-divider (170, 180, 190, 200) and a tap circuit (210) for selecting a tap point, according to the received data values in the control logic (230). The voltage selected from the tap point is compared with the voltage reference in the regulation circuit (220), which controls a transistor (150) for switching the output current flowing through the inductor (130).
Abstract:
The present invention is in the field of flash memory. More particularly, embodiments of the present invention may provide a negative voltage for erasing when coupled to a memory cell to be erased and provide voltages to read or program when not coupled to a memory cell that is selected to be erased. Embodiments may also provide a high magnitude negative voltage to erase; a low impedance, low voltage current to read or program; and burn little to no current when not couplet to a memory cell that is selected to be erased.
Abstract:
Cross point memory architectures, devices, systems, and methods are disclosed and described, and can include a cross point memory core subsystem having increased bandwidth that is scalable. The memory core can include a plurality of independently operating partitions, each comprising a plurality of cross point memory arrays.
Abstract:
A memory device performs DLL (delay locked loop) calibration in accordance with a DLL calibration mode configured for the memory device. A host controller can configure the calibration mode based on operating conditions for the memory device. The memory device includes an input/output (I/O) interface circuit and a delay locked loop (DLL) circuit coupled to control I/O timing of the I/O interface. A control circuit of the memory device selectively enables and disables DLL calibration in accordance with the DLL calibration mode. When selectively enabled, the DLL calibration is to operate at a time interval identified by the DLL calibration mode, and when selectively disabled, the DLL calibration is to cease or refrain from DLL calibration operations.