Ultrasonic wave measurement system

    公开(公告)号:JP2004085368A

    公开(公告)日:2004-03-18

    申请号:JP2002246976

    申请日:2002-08-27

    Abstract: PROBLEM TO BE SOLVED: To provide an inexpensive ultrasonic wave measurement system capable of being handled easily and measuring vibration energy of an ultrasonic wave without being restricted by a liquid where the ultrasonic wave is present.
    SOLUTION: The ultrasonic wave measurement system comprises a Teflon synthetic resin 1 as an ultrasonic wave absorbing material for absorbing the vibration energy of the ultrasonic wave to convert it into thermal energy and a thermocouple 2 as a temperature measurement member coated with the Teflon synthetic resin.
    COPYRIGHT: (C)2004,JPO

    TEXTURING METHOD FOR RECORDING MEDIUM SUBSTRATE

    公开(公告)号:JPH0744862A

    公开(公告)日:1995-02-14

    申请号:JP18361693

    申请日:1993-07-26

    Applicant: KAO CORP

    Inventor: OTANI MASASHI

    Abstract: PURPOSE:To easily provide a recording medium substrate having a desirable surface profile by supplying water at the time of polishing in the case where a carbon substrate is subjected to texturing by polishing with a tape. CONSTITUTION:The glassy carbon to be used as the recording medium substrate is formed by curing a thermosetting resin and baking this resin to carbonize and is then subjected to finish polishing and the texturing treatment. The texturing treatment is executed by the polishing tape 3 which is pressed by a contact roller 2 under a prescribed working pressure to the glassy carbon substrate 1 rotating at a constant speed. The roller 2 is oscillated at need and the tape 3 is fed at a specified speed during the working. Water is dropped by gravity between the tape 3 and the substrate 1 toward A. As a result, the substrate having the desirable surface profile which is the cause of a difference in recording and reproducing characteristics is obtd. Since cutting oil is not required, the need for excess operations is eliminated.

    MAGNETIC RECORDING MEDIUM
    3.
    发明专利

    公开(公告)号:JPH08279135A

    公开(公告)日:1996-10-22

    申请号:JP7917595

    申请日:1995-04-04

    Applicant: KAO CORP

    Abstract: PURPOSE: To obtain a magnetic recording medium having excellent durability and environment stability by specifying the skewness on the front surface of a carbon substrate as a base and forming a lubricant layer by gaseous phase reaction atop this substrate. CONSTITUTION: A magnetic layer 3 is arranged via a ground surface layer 2 atop the carbon substrate 1 as the base and the hybrid lubricant layer 5 is disposed atop the magnetic layer 3. The surface of the substrate 1 is so formed that the max. value and min. value of the skewnesses expressed by equation exist in a range of -1 to 4 and the average value thereof is within a range of 0 to 3. The lubricant layer 5 is formed by the gaseous phase reaction. In the equation described above, Yi denotes the distance from a center line to the peak top or valley bottom; Rq denotes the root mean square roughness and (n) denotes the number of data of Yi. As a result, the errors occurred at the time of reproducing and erasing of recording are decreased and the durability and environmental stability of the recording medium are improved.

    TEXTURE PROCESSING METHOD FOR SUBSTRATE

    公开(公告)号:JPH08241521A

    公开(公告)日:1996-09-17

    申请号:JP4318195

    申请日:1995-03-02

    Applicant: KAO CORP

    Inventor: OTANI MASASHI

    Abstract: PURPOSE: To obtain a recording medium with a low head floating amount and excellent for CSS durability and a reproducing characteristics by performing texture processing under a prescribed condition. CONSTITUTION: The processing is performed by a grinding tape 3 subjected to press contacting with a substrate 1 formed by vitreous carbon by a contact roller 2. The roller 2 rubber hardness of which is 40-80 degree is used, and the work of the grinding tape is performed at a feed rate of 100-600mm/min. The texture processing is performed under the condition of inequality I or inequality II. (Inequality I) 100Å/min

    CARBON SUBSTRATE AND RECORDING MEDIUM

    公开(公告)号:JPH06349049A

    公开(公告)日:1994-12-22

    申请号:JP13782293

    申请日:1993-06-08

    Applicant: KAO CORP

    Inventor: OTANI MASASHI

    Abstract: PURPOSE:To provide the recording medium having the low flying height of a head and excellent CSS durability by providing the surface of a carbon substrate having surface roughness of a prescribed value with a recording film. CONSTITUTION:Glassy carbon is produced by executing a first treatment at about 1000 to 1400 deg.C in an inert atmosphere, then executing a second treatment to make heat treatment at about 1500 to 2000 deg.C under about >=1000atm. The magnetic recording medium is produced by using such carbon. The magnetic recording medium which has high bending strength, is substantially free from cracking and chipping in the production stage for magnetic disks, is as light as 1.6 to 1.8 density, has small intrinsic resistivity, high corrosion resistance and weatherability and high hardness and is nonmagnetic is thereby obtd. The carbon substrate having a trough-shaped surface is formed and the surface roughness of about 40 to 100Angstrom center line average height and about 1 to 6 Rp/Ra with the center line height as Rp is obtd. by a texturing technique using a polishing tape and free abrasive grains. The recording medium having the low flying height of the head and the excellent CSS durability is obtd.

    Palette inspection apparatus
    6.
    发明专利
    Palette inspection apparatus 有权
    PALETTE检验仪器

    公开(公告)号:JP2009042193A

    公开(公告)日:2009-02-26

    申请号:JP2007210571

    申请日:2007-08-11

    Abstract: PROBLEM TO BE SOLVED: To detect the existence of the breakage regardless of the appearance aspect of an inspecting object section of a plate of a palette.
    SOLUTION: A palette inspection apparatus 200 includes palette support sections 221 and 222 for supporting a palette 10 to be inspected, a pair of light sources 228 so that the inspecting object section of the plate 11 of the palette 10 supported by the palette support sections 221 and 222 is irradiated with an inspection light from a diagonal direction of the widthwise both sides, and an image acquisition section 229 for acquiring an image of the inspecting object section of the plate 11 that is irradiated with the inspection light from the pair of light sources 228. The pair of light sources 228 are constituted so as to emit the inspection light with which the image of the inspecting object section of the plate 11 of erased appearance aspect is acquired by the image acquisition section 229.
    COPYRIGHT: (C)2009,JPO&INPIT

    Abstract translation: 要解决的问题:无论调色板的检查对象部分的外观方面如何,都检测是否存在破损。 调色板检查装置200包括用于支撑要检查的调色板10的调色板支撑部分221和222,一对光源228,使得由调色板支撑的调色板10的板11的检查对象部分 用宽度方向两侧的对角线方向的检查光照射支撑部221,222,以及图像获取部229,用于获取从该对照射了检查光的板11的检查对象部的图像 一对光源228被构造成发射检测光,通过图像获取部229获取被擦除外观方面的板11的检查对象部分的图像的检查光。 (C)2009,JPO&INPIT

    LIQUID LEAKAGE INSPECTION SYSTEM
    7.
    发明专利

    公开(公告)号:JP2001099744A

    公开(公告)日:2001-04-13

    申请号:JP35445099

    申请日:1999-12-14

    Applicant: KAO CORP

    Abstract: PROBLEM TO BE SOLVED: To provide a liquid leakage inspection system capable of improving detection accuracy for a liquid leakage, of facilitating cleaning and recovery, and of improving degrees of freedom for setting of an insulation substrate, as well as detecting a trace of liquid leakage from an object to be inspected with no bad effect thereon by bringing a detection electrode into contact therewith. SOLUTION: A pattern detection electrode 15 comprising mutually facing comb-shaped detection electrodes 2 of thickness 1-100 μm is formed on an insulation substrate 1 made of a glass epoxy resin. Electrical contact of the pattern detection electrode 15 is controlled by an impedance adjuster 6. Liquid leakage from an object to be inspected is determined by a liquid leakage detector 7 with a signal received from the pattern detection electrode 15.

    VISUAL INSPECTION SYSTEM FOR BOARD

    公开(公告)号:JPH10253547A

    公开(公告)日:1998-09-25

    申请号:JP5143797

    申请日:1997-03-06

    Applicant: KAO CORP

    Abstract: PROBLEM TO BE SOLVED: To inspect irregularity defect on the surface of a board to be inspected, such as a carbon board for hard disc automatically with high accuracy and a high efficiency. SOLUTION: A board to be inspected, which is stored in a cassette 51 for supply, is supplied to a turning table 56, which carries the board at a board supplying and carrying-out station A, and defect in its surface is inspected at a surface inspection station B. The front and back of the board are reversed at a reversing station, and it is sent to a back surface inspection station D to conduct defect inspection of the back surface. In the defect inspection, parallel light is radiated in the perpendicular direction to the surface to be inspected of the board to shoot the reflection of the parallel light for the detection of irregularity defect of the board surface as a contrast abnormal part. The number of the detected picture elements of detected defect is converted to a value equivalent to the number of missing errors at the time of using the board in media, a rank is determined based on the converted value, the inspected board is stored in the cassette 51 corresponding to the rank.

    METHOD AND INSTRUMENT FOR MEASURING FLATNESS

    公开(公告)号:JPH10141933A

    公开(公告)日:1998-05-29

    申请号:JP31540296

    申请日:1996-11-11

    Applicant: KAO CORP

    Abstract: PROBLEM TO BE SOLVED: To provide a method by which the flatness of a surface to be measured can be measured accurately regardless of the state of the surface. SOLUTION: Inspection light is converged to a plurality of measuring point on a surface 11 to be measured and the image of each measuring point is formed form the reflected light of the inspection light from each measuring point through an optical system 4. Then the recessing and projecting amount of the surface 11 from a fixed reference position at each measuring point are found based on the focal point position adjusting amount for forming the image of each measuring point at a set position. The flatness of the surface 11 is computed based on the found recessing and projecting amounts of the surface 11 from the reference position.

    METHOD FOR CLEANING SUBSTRATE
    10.
    发明专利

    公开(公告)号:JPH05143981A

    公开(公告)日:1993-06-11

    申请号:JP30905491

    申请日:1991-11-25

    Applicant: KAO CORP

    Inventor: OTANI MASASHI

    Abstract: PURPOSE:To provide the method for cleaning a substrate to be used for magnetic disks, optical disks, liquid crystal displays, etc. CONSTITUTION:The substrate is placed in ozone environment and is simultaneously irradiated with UV rays, by which the cleaning of the substrate surface using the decomposition of org. matter by the UV rays and the oxidation effect by the ozone of the decomposed matter is executed. More specifically, the substrate is placed in air and is irradiated with the UV rays including 184.9mm and 253.7mm wavelengths, by which O3 is generated from the O2 in the air and the decomposed matter is oxidized.

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