APPARATUS FOR EUV IMAGING AND METHODS OF USING SAME
    1.
    发明申请
    APPARATUS FOR EUV IMAGING AND METHODS OF USING SAME 审中-公开
    EUV成像装置及其使用方法

    公开(公告)号:WO2012096847A3

    公开(公告)日:2012-11-01

    申请号:PCT/US2012020504

    申请日:2012-01-06

    CPC classification number: G03F1/84 B82Y10/00 B82Y40/00 G03F1/24

    Abstract: One embodiment relates to an apparatus that includes an illumination source (102) for illuminating a target substrate (106), objective optics (108) for projecting the EUV light which is reflected from the target substrate, and a sensor (110) for detecting the projected EUV light. The objective optics includes a first mirror (202,302, or 402) which is arranged to receive and reflect the EUV light which is reflected from the target substrate, a second mirror (204, 304, or 404) which is arranged to receive and reflect the EUV light which is reflected by the first mirror, a third mirror (206, 306, or 406) which is arranged to receive and reflect the EUV light which is reflected by the second mirror, and a fourth mirror (208, 308, or 408) which is arranged to receive and reflect the EUV light which is reflected by the third mirror.

    Abstract translation: 一个实施例涉及一种装置,其包括用于照射目标基板(106)的照明源(102),用于投射从目标基板反射的EUV光的物镜(108)和用于检测目标基板 预计EUV灯。 物镜包括第一反射镜(202,302或402),第一反射镜(202,302或402)被布置成接收和反射从目标基底反射的EUV光,第二反射镜(204,304或404),其布置成接收和反射 由第一反射镜反射的EUV光,被配置为接收和反射由第二反射镜反射的EUV光的第三反射镜(206,306或406)和第四反射镜(208,308或408) ),其被布置成接收和反射由第三反射镜反射的EUV光。

    APPARATUS FOR EUV IMAGING AND METHODS OF USING SAME

    公开(公告)号:EP2663897A4

    公开(公告)日:2018-01-03

    申请号:EP12734716

    申请日:2012-01-06

    CPC classification number: G03F1/84 B82Y10/00 B82Y40/00 G03F1/24

    Abstract: One embodiment relates to an apparatus that includes an illumination source (102) for illuminating a target substrate (106), objective optics (108) for projecting the EUV light which is reflected from the target substrate, and a sensor (110) for detecting the projected EUV light. The objective optics includes a first mirror (202,302, or 402) which is arranged to receive and reflect the EUV light which is reflected from the target substrate, a second mirror (204, 304, or 404) which is arranged to receive and reflect the EUV light which is reflected by the first mirror, a third mirror (206, 306, or 406) which is arranged to receive and reflect the EUV light which is reflected by the second mirror, and a fourth mirror (208, 308, or 408) which is arranged to receive and reflect the EUV light which is reflected by the third mirror.

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