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1.发明公开Method and apparatus for simultaneously determining gauge and orientation of polymer films 失效同时测定聚合物膜的方位和方位的方法和装置
公开(公告)号：EP0176827A3
公开(公告)日：1987-09-09
申请号：EP85111476
申请日：1985-09-11
Applicant: KOLLMORGEN TECHNOLOGIES CORPORATION
Inventor： Zelmanovic, David , Kishner, Stanley J.
CPC classification number: G01N33/442 , G01N21/3563 , G01N21/86 , G01N2021/3174 , G01N2021/869
Abstract: In the manufacture of a multilayer polymer film, the thickness and degree of orientation are simultaneously measured. A beam of infrared radiation having predetermined wavelengths, is either transmitted through or reflected by the polymer film to be measured and received by a photodetector. The photodetector provides an electrical output signal which can be analyzed to determine the thickness and degree of orientation.
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