SHIELDING APPARATUS, SHIELDING METHOD AND DEMAGNETIZING FOR MEASURING MAGNETIC FIELD
    2.
    发明申请
    SHIELDING APPARATUS, SHIELDING METHOD AND DEMAGNETIZING FOR MEASURING MAGNETIC FIELD 审中-公开
    屏蔽装置,用于测量磁场的屏蔽方法和去磁

    公开(公告)号:US20160011278A1

    公开(公告)日:2016-01-14

    申请号:US14768898

    申请日:2013-03-08

    CPC classification number: G01R33/0076 G01R33/025 H01F13/003 H05K9/0069

    Abstract: The present invention relates to a shield apparatus and a shield method for measuring a subtle magnetic field. More specifically, the present invention relates to a shield apparatus having a precise magnetic sensor therein, for shielding an external magnetic field in a subtle magnetic field measurement apparatus including a magnetic field generation apparatus for exciting a sample, the shield apparatus for measuring a subtle magnetic field, including: a shield wall provided with a high-conductivity metal layer of high conductivity being partitioned into a plurality of segments and having a high-frequency shield property and a closed high-permeability soft magnetic layer spaced apart from the high-conductivity metal layer by a predetermined distance, so as to seal a measurement space.

    Abstract translation: 本发明涉及一种用于测量微妙磁场的屏蔽装置和屏蔽方法。 更具体地说,本发明涉及一种在其中具有精密磁传感器的屏蔽装置,用于在包括用于激发样品的磁场产生装置的微小磁场测量装置中屏蔽外部磁场,用于测量微妙磁性的屏蔽装置 包括:具有高导电性的高导电性金属层的屏蔽壁被分隔成多个段并具有高频屏蔽特性和与高导电性金属间隔开的封闭的高磁导率软磁性层 层预定距离,以便密封测量空间。

Patent Agency Ranking