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公开(公告)号:US11061186B2
公开(公告)日:2021-07-13
申请号:US16199468
申请日:2018-11-26
Inventor: Ajey Poovannummoottil Jacob , Marcus V. S. Dahlem , Humaira Zafar , Anatol Khilo , Sujith Chandran
Abstract: The present disclosure relates to semiconductor structures and, more particularly, to rib waveguide structures and methods of manufacture. The structure includes: a waveguide structure comprising one or more bends, an input end and an output end; and grating structures which are positioned adjacent to the one or more bends of the waveguide structure.
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公开(公告)号:US20180038890A1
公开(公告)日:2018-02-08
申请号:US15670281
申请日:2017-08-07
Applicant: Khalifa University of Science and Technology
Inventor: Marcus S. Dahlem , Evgenii Demidov , Anatol Khilo
IPC: G01P15/13 , G01C19/56 , G01P15/097
CPC classification number: G01P15/131 , B81B2201/0235 , B81B2201/047 , B81C1/00246 , B81C2201/0143 , B81C2201/0188 , B81C2203/0714 , G01C19/56 , G01C19/66 , G01P15/093 , G01P15/097
Abstract: A method of forming a photonic inertial sensor includes providing a substrate having an insulation layer and a silicon layer on the insulation layer opposite the substrate; etching the silicon layer to form a silicon proof mass for the photonic inertial sensor; etching at least a portion of the insulation layer underneath the silicon proof mass to suspend the silicon proof mass; and depositing a high-density mass-increasing layer on the silicon proof mass to thereby increase the mass of the silicon proof mass.
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