公开(公告)号：JP2001147107A

公开(公告)日：2001-05-29

申请号：JP2000339229

申请日：2000-11-07

Applicant: LEICA MICROSYSTEMS

Inventor： GANSER MICHAEL ,  WEISS ALBRECHT

IPC: G01B11/06

Abstract: PROBLEM TO BE SOLVED: To provide a method and a device for measuring the film thickness of a transparent film. SOLUTION: An irradiated beam 4 is passed through an objective lens 5 and guided to an object 1 having the transparent film 2. A structured focusing auxiliary member 9 is arranged in the irradiated beam 4, and a camera 13 is arranged in an image beam 12, and each of them is arranged on a conjugate position relative to a focusing surface 8 of the objective lens 5. The focusing surface 8 of the objective lens 5 is moved gradually through the object 1. Camera images are recorded at respective positions, and focus scores thereof are determined, and the image of the focusing auxiliary member 9 is used as a sharpness display device. The position having a maximal focus score is assigned to the position of an interface. The thickness of the transparent film 2 is calculated from the difference between each position of the interfaces.

公开(公告)号：JP2002168740A

公开(公告)日：2002-06-14

申请号：JP2001348847

申请日：2001-11-14

Applicant: LEICA MICROSYSTEMS

Inventor： PFEIFER GERHARD ,  WEISS ALBRECHT

IPC: G01N1/04 ,  G01N1/06 ,  G01N1/28 ,  G01N33/48 ,  G02B21/26

Abstract: PROBLEM TO BE SOLVED: To manufacture a sampling device for microdissection, ensuring highly reliable sampling for microdissection while realizing simple and convenient operation. SOLUTION: This device 10 for housing a sample for microdissection is equipped with one or more containers 12 for sampling. The device 10 is disposed so that it can move in an open space 32 defined by the stage surface 4 of an X-Y stage 2 and a pollution screening panel 42. The containers 12 are disposed on individual holding elements 54 in the device. By operating the device 10, the holding elements 54 can be brought, one at a time, to a sampling position.

公开(公告)号：WO2006084777A3

公开(公告)日：2006-12-07

申请号：PCT/EP2006050113

申请日：2006-01-10

Applicant: LEICA MICROSYSTEMS ,  WEISS ALBRECHT

Inventor： WEISS ALBRECHT

IPC: G02B21/06

CPC classification number: G02B21/06

Abstract: The invention relates to an LED module (60) which is configured in such a manner that in can be used in a conventional base (47) for a conventional light source without the need to change the circuitry of the microscope. The functionality of the LED module (60) is guaranteed by the mere insertion of the module into the base (47).

Abstract translation: 公开了一种LED模块（60），其被构造成插入常规光源的常规灯座（47）中。 显微镜上的电路没有变化。 LED模块（60）的功能仅通过插入灯头（47）来确保。

公开(公告)号：WO0005606A3

公开(公告)日：2000-04-20

申请号：PCT/DE9902218

申请日：1999-07-17

Applicant: LEICA MICROSYSTEMS ,  WEISS ALBRECHT

Inventor： WEISS ALBRECHT

IPC: G02B5/02 ,  G02B27/09 ,  G02B5/20 ,  G02B5/22 ,  G02B21/06

CPC classification number: G02B27/0927 ,  G02B5/0205 ,  G02B5/0263 ,  G02B5/0268 ,  G02B5/0278 ,  G02B27/09 ,  G02B27/0988

Abstract: Disclosed is a homogenization filter (6) for an optical radiation field pertaining to an illuminating beam (2), whereby said filter cooperates with a diffusion screen (9) in order to homogenize light intensity in an image plane. The inventive filter comprises a transparent substrate (12) on which a grid consisting of light-proof surface elements (13) is placed. The homogenization filter (6) can, for instance, be used in the reflected light or transmitted light beam (2) of a microscope in a conjugate position, e.g. close to the collector (5). A diffusion screen (9) that is usually present in the plane of the aperture stop is used to blur the shadows in the illuminating beam produced by the surface elements (13). By varying the surface ratio between the non-coated and coated surface of the substrate, local transmission values can be produced at any point of the homogenization filter as desired, and radial and non-rotationally symmetrical inhomogeneities can be compensated.

Abstract translation: 提供了一种用于照明光束路径（2），其实现的光强度的均匀化中的图像平面在合作用透镜（9）的光学辐射字段中提供的Homogenisierungsfilter（6）。 它由在其上施加不透明表面元件（13）的栅格的透明基板（12）的。 所述Homogenisierungsfilter（6），例如，在反射光或透射光照明光束路径（2）在一个平面上共轭的像平面位置的显微镜，例如 在收集器（5）的附近，被使用。 甲在孔径光阑平面透镜（9）公知的是利用抹杀的元件的表面中的照明光束路径中产生（13）的影子（2）。 通过改变非沉积，和气相沉积基板表面所需的局部透射值之间的表面比可在（6），并且因此径向和非旋转对称的不均匀性进行补偿的Homogenisierungsfilters的任意点来生成。

公开(公告)号：WO02057746A3

公开(公告)日：2002-11-21

申请号：PCT/DE0200056

申请日：2002-01-10

Applicant: LEICA MICROSYSTEMS ,  WEISS ALBRECHT ,  GANSER MICHAEL

Inventor： WEISS ALBRECHT ,  GANSER MICHAEL

IPC: G01N1/04 ,  G01N1/06 ,  G01N1/28 ,  G01N35/00

CPC classification number: G01N1/2813 ,  G01N1/06 ,  G01N2001/045 ,  G01N2001/2886 ,  G01N2035/00138

Abstract: The invention relates to a specimen slide (1) for microscopic preparations (3). The specimen slide (1) defines a total area, has a first thickness (13), and is characterized in that it has, over a portion of its total surface, a second thickness (7) that is significantly smaller than the first thickness (13).

Abstract translation: 本发明公开了一种用于显微制剂（3）的物体载体（1）。 滑块（1）限定了总面积并具有第一厚度（13），并且其特征在于其在其总面积的一部分上具有第二厚度（7），其基本小于第一厚度（13）。 ，

公开(公告)号：DE102016115856B4

公开(公告)日：2020-01-02

申请号：DE102016115856

申请日：2016-08-25

Applicant: LEICA MICROSYSTEMS

Inventor： DEISSLER BENJAMIN ,  WEISS ALBRECHT ,  WEISS ALEXANDER

IPC: G02B21/00 ,  G02B21/06 ,  G06T5/00

Abstract: Verfahren zur Bildgebung in einem Mikroskop (200) mit schiefer Beleuchtung, wobei ein Objekt von einem schräg auf die Objektebene (204) des Mikroskops (200) einfallenden Beleuchtungsstrahlengang (211), beleuchtet wird und ein mikroskopisches Bild des Objekts und ein entsprechendes digitales Bildsignal erzeugt werden,dadurch gekennzeichnet,dass das digitale Bildsignal mittels digitaler Bildverarbeitung unter Verwendung eines Faltungskerns zur Kontraststeigerung bearbeitet und hieraus ein kontrastgesteigertes digitales Bild erzeugt wird, wobei ein Faltungskern verwendet wird,dessen Orientierung in Relation zur Richtung der schiefen Beleuchtung ausgerichtet ist, um die Kontraststeigerung weiter zu erhöhen.

公开(公告)号：DE60040960D1

公开(公告)日：2009-01-15

申请号：DE60040960

申请日：2000-10-17

Applicant: LEICA MICROSYSTEMS

Inventor： GANSER MICHAEL ,  WEISS ALBRECHT

IPC: G01B11/06

Abstract: A method and an apparatus for thickness measurement on transparent films is described. An illumination beam (4) is directed through an objective (5) onto an object (1) having a transparent film (2). A structured focusing aid (9) is arranged in the illumination beam (4), and a camera (13) in an imaging beam (12), each in locations conjugated with the focal plane (8) of the objective (5). The focal plane (8) of the objective (5) is displaced stepwise through the object (9). At each position, a camera image is recorded and its focus score is determined, the image of the focusing aid (9) being used as the sharpness indicator. The positions with maximal focus scores are assigned to the locations of the interfaces. The thickness of the transparent film (2) is calculated from the difference between the positions of its interfaces.

公开(公告)号：AU2003283397A1

公开(公告)日：2004-06-30

申请号：AU2003283397

申请日：2003-11-13

Applicant: LEICA MICROSYSTEMS

Inventor： GANSER MICHAEL ,  WEISS ALBRECHT

IPC: G02B21/08

公开(公告)号：DE10018253C2

公开(公告)日：2003-08-21

申请号：DE10018253

申请日：2000-04-13

Applicant: LEICA MICROSYSTEMS

Inventor： WEISS ALBRECHT

IPC: B23K26/00 ,  B23K26/02 ,  B23K26/03 ,  B23K26/06 ,  B23K26/08 ,  B23K26/082 ,  G01N1/28 ,  G02B21/32 ,  G01N33/48 ,  G01N1/04 ,  C12M1/42 ,  G02B21/34

Abstract: The invention relates to a laser microdissection device comprised of a microscope table ( 1 ), which supports a specimen ( 3 ) to be dissected, of an incident lighting device ( 7 ), a laser light source ( 5 ) and of an objective ( 10 ) for focussing the laser beam ( 18 ) of the laser light source ( 5 ) onto the specimen ( 3 ). According to the invention, the microscope table ( 1 ) is not moved during the dissecting process. A laser scanning device ( 9 ) is arranged in the incident lighting device ( 7 ), is comprised of two thick glass wedge plates ( 11 a , 11 b), which are tilted toward the optical axis ( 8 ) and can be rotated independently of one another around said optical axis ( 8 ). In addition to the beam deviation caused by the wedge angle of the wedge plates ( 11 a, 11 b), a beam offset of the laser beam ( 18 ) is produced by the thickness and the tilt of the wedge plates ( 11 a, 11 b). When both wedge plates ( 11 a, 11 b) are rotated, the beam deviation and the beam offset of the laser beam ( 18 ) are varied in such a manner that the laser beam ( 18 ) always passes through the middle of the objective pupil ( 19 ) and, at the same time, the beam is guided over the specimen ( 3 ) to be dissected by the beam deviation of the laser beam ( 18 ).

公开(公告)号：DE50107051D1

公开(公告)日：2005-09-15

申请号：DE50107051

申请日：2001-03-29

Applicant: LEICA MICROSYSTEMS

Inventor： WEISS ALBRECHT

IPC: B23K26/00 ,  B23K26/02 ,  B23K26/03 ,  B23K26/06 ,  B23K26/08 ,  B23K26/082 ,  G01N1/28 ,  G02B21/32

Abstract: The invention relates to a laser microdissection device comprised of a microscope table ( 1 ), which supports a specimen ( 3 ) to be dissected, of an incident lighting device ( 7 ), a laser light source ( 5 ) and of an objective ( 10 ) for focussing the laser beam ( 18 ) of the laser light source ( 5 ) onto the specimen ( 3 ). According to the invention, the microscope table ( 1 ) is not moved during the dissecting process. A laser scanning device ( 9 ) is arranged in the incident lighting device ( 7 ), is comprised of two thick glass wedge plates ( 11 a , 11 b), which are tilted toward the optical axis ( 8 ) and can be rotated independently of one another around said optical axis ( 8 ). In addition to the beam deviation caused by the wedge angle of the wedge plates ( 11 a, 11 b), a beam offset of the laser beam ( 18 ) is produced by the thickness and the tilt of the wedge plates ( 11 a, 11 b). When both wedge plates ( 11 a, 11 b) are rotated, the beam deviation and the beam offset of the laser beam ( 18 ) are varied in such a manner that the laser beam ( 18 ) always passes through the middle of the objective pupil ( 19 ) and, at the same time, the beam is guided over the specimen ( 3 ) to be dissected by the beam deviation of the laser beam ( 18 ).