Beam or ray deflector and scanning microscope
    1.
    发明专利
    Beam or ray deflector and scanning microscope 审中-公开
    光束或光束偏转器和扫描显微镜

    公开(公告)号:JP2006119643A

    公开(公告)日:2006-05-11

    申请号:JP2005301629

    申请日:2005-10-17

    CPC classification number: G02B21/0048 G02B7/1821

    Abstract: PROBLEM TO BE SOLVED: To provide a beam or ray deflector and a scanning microscope in which noise is reduced at least in a sound volume level.
    SOLUTION: In a beam or ray deflector equipped with at least one deflecting means that is movably arranged for the purpose of adjustably deflecting a beam or a ray, the movably arranged deflecting means (15) is positioned in a fully soundproof casing (17) equipped with a light incident window (19) and/or a light emitting window (23).
    COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题:提供至少在音量水平下噪声降低的光束或射线偏转器和扫描显微镜。 解决方案:在装备有至少一个可移动地设置用于可调节地偏转光束或射线的目的的偏转装置的光束或射线偏转器中,可移动地布置的偏转装置(15)被定位在完全隔音的壳体 17)配备有光入射窗(19)和/或发光窗(23)。 版权所有(C)2006,JPO&NCIPI

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