公开(公告)号：DE50300349D1

公开(公告)日：2005-04-21

申请号：DE50300349

申请日：2003-01-21

Applicant: LEICA MICROSYSTEMS

Inventor： CEMIC FRANZ DR ,  DANNER LAMBERT ,  MAINBERGER ROBERT ,  VEITH MICHAEL DR ,  OSTERFELD MARTIN DR ,  GRAF UWE

IPC: G02B7/28 ,  G02B21/24

Abstract: Autofocus module for a microscope system (2) comprises: at least two light sources (20, 21) each of which generates a light beam (22) for focussing; optical deflector or prism (27, 32) for deflection of a part of each beam into an beam that is used to illuminate an object; and at least first and second detectors (35, 45) for detecting light originating from respective light sources reflected from the object. Independent claims are included for: (1) a corresponding microscope system; (2) autofocus method. According to the method the optimal focal position is determined using the measured intensities on the first and second detectors.