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公开(公告)号：JP2002196255A
公开(公告)日：2002-07-12
申请号：JP2001342834
申请日：2001-11-08
Applicant: LEICA MICROSYSTEMS
Inventor： STENZEL RUEDIGER
Abstract: PROBLEM TO BE SOLVED: To provide a microscope which is capable of easily associating and attaching a desired objective lens to the prescribed position in the optical path of the microscope. SOLUTION: This microscope has a stand (3) and has an objective lens turntable (1) rotatably fixed onto the stand (3). This objective lens turntable (1) has at least two receptive sections (4) for respectively at least one objective lens (2) and the objective lens (2) is introduced into optical path (5) of the microscope by rotation of the objective lens turntable (1). The microscope is constituted to be attached with one transponder (6) in order for the objective lens (2) to be easily associated and attached between itself and its position within the optical path (5) of the microscope and to be attached with a reader (7) for communicating with the transponder (6).
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公开(公告)号：JP2000241713A
公开(公告)日：2000-09-08
申请号：JP2000036804
申请日：2000-02-15
Applicant: LEICA MICROSYSTEMS WETZLER GMB
Inventor： WEIS ALBRECHT , GANSER MICHAEL , STENZEL RUEDIGER
Abstract: PROBLEM TO BE SOLVED: To constitute a holder so as to extremely decrease danger that a sample carrier made of glass is damaged, improve operability in terms of human engineering, extend its applicable range to the sample carriers of various sizes and guarantee the sure positioning of the sample carrier without shake in directions (x), (y) and (z). SOLUTION: This holder is equipped with a movable pressing part 1 and a stationary contact part 2, and the contact part 2 is constituted to have at least one precise contact point (6a, 6b; 7) for the side 4a in the direction (x) or the side 5a in the direction (y) of the sample carrier 3. In such a case, the pressing part 1 (H1) comes in contact with the sample carrier 3 at two pressing points 8 and 9 at an actuation position. Either pressing point 9 comes in contact with the side 4a in the direction (x) of the sample carrier 3 and the other pressing point 8 comes in contact with the side 5a in the direction (y) of the sample carrier 3.
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3.发明申请METHOD FOR THE ELECTRONIC CALIBRATION OF AN EXPOSURE METER IN AN OPTICAL SYSTEM 审中-公开光测量装置的电子校准的光学系统中的方法
公开(公告)号：WO0037987A3
公开(公告)日：2000-11-23
申请号：PCT/DE9904005
申请日：1999-12-17
Applicant: LEICA MICROSYSTEMS , ZEISS CARL JENA GMBH , STENZEL RUEDIGER , RUEHL HELMUT , KNOBLICH JOHANNES , KOHLE DIRK
Inventor： STENZEL RUEDIGER , RUEHL HELMUT , KNOBLICH JOHANNES , KOHLE DIRK
IPC: G02B21/36
CPC classification number: G02B21/36
Abstract: The invention relates to a calibration method for an exposure meter of a microscope (1) in which the ray bundle (4; 7) exiting from the microscope objective (22) is divided in to a first partial ray bundle (8) which is guided to an eyepiece (8) in which a grid-line reticle (24) having a focussing mark is positioned and a second partial ray bundle (4) which is guided to a sensor (10) made of electrooptical pixel elements (12) downstream of which an electronic processing unit is positioned. According to the method a calibration sample (15) having a calibration reference point is arranged on the microscope table (3); by displacing the microscope table (2) the calibration reference point of the calibration sample (15) is moved into a specified positional relationship to the focussing mark of the grid-line reticle (24); in this positional relationship the calibration sample (15) having the calibration reference point is imaged on the pixel elements (12) of the sensor (10); and among the pixel elements (12) of the sensor (10) the pixel element on which the image of the calibration reference point falls is chosen as the reference pixel element for future exposure measurements.
Abstract translation: 本发明涉及一种校准方法，用于曝光测量显微镜的装置（1），其从所述显微镜物镜（22）呈现光束的（4; 7）在一个至目镜（8），从而导致所述第一部分光束束（7），其中掩模版（24） 被布置成与对准标记和在第二部分光束（4）被划分，这导致一个传感器（10）的电光像素元件（12）被形成为，其电子处理装置下游连接。 该方法包括一个具有校准的参考点的校准样品（15）被放置在显微镜载物台上（3），通过移动显微镜载物台（2）校准样品（15）与标线（24）的在对准标记的校准基准点的 预定的位置关系是由与所述传感器的所述像素元件（12）的校准的参考点的校准样品（15）（10）被成像在该位置关系，并且所述传感器（10）中的像素元件作为基准像素单元的像素单元（12）之间 随后暴露测量被确定为落在校准基准的图像。
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公开(公告)号：DE10018255C2
公开(公告)日：2003-08-28
申请号：DE10018255
申请日：2000-04-13
Applicant: LEICA MICROSYSTEMS
Inventor： GANSER MICHAEL , WEIS ALBRECHT , STENZEL RUEDIGER
Abstract: The invention relates to a method and a device for laser cutting microscopic samples. The device for laser cutting microscopic samples comprises a microscope (1) having at least one lens (6) for observing a sample (12) that is to be cut The lens (6) defines an optical axis (14) and a lens aperture (34). A laser (4) is also connected to the microscope (1). The laser (4) generates a laser beam (41) that is injected into the lens (6) by means of at least one optical system (16). A diaphragm (18) is provided, which generates a dimmed laser beam (4b), whereby the laser aperture (36) generated by the lens (6) is smaller than the lens aperture (34) of the lens (6) itself.
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公开(公告)号：DE19906422C2
公开(公告)日：2001-03-01
申请号：DE19906422
申请日：1999-02-16
Applicant: LEICA MICROSYSTEMS
Inventor： WEIS ALBRECHT , GANSER MICHAEL , STENZEL RUEDIGER
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Patent Agency Ranking
公开(公告)号：DE10018251C2
公开(公告)日：2003-08-14
申请号：DE10018251
申请日：2000-04-13
Applicant: LEICA MICROSYSTEMS
Inventor： GANSER MICHAEL , WEIS ALBRECHT , STENZEL RUEDIGER
IPC: B23K26/00 , B23K26/10 , B23K26/40 , G01N1/04 , G01N1/28 , G02B21/32 , G01N33/48 , C12M1/42 , G02B21/26
Abstract: The invention relates to a device for laser cutting preparations which comprises an XY table ( 2 ) that defines a table surface ( 4 ). A holding device ( 14 ) for accommodating an object support ( 6 ) with a preparation ( 8 ) is arranged above the table surface ( 4 ) and is joined to the XY table ( 2 ) in a manner that permits it to be displaced in the Y direction ( 20 a) in the X direction ( 22 a). An open working space ( 16 ) is defined between the holding device ( 14 ) and the table surface ( 4 ). A catching device ( 10 ), which has at least one receptacle ( 12 ) for catching a preparation part that has been cut out, can be introduced into said working space. The invention also relates to a microscope that is equipped with the aforementioned laser cutting device.
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公开(公告)号：DE19859159A1
公开(公告)日：2000-07-06
申请号：DE19859159
申请日：1998-12-21
Applicant: LEICA MICROSYSTEMS , ZEISS CARL JENA GMBH
Inventor： STENZEL RUEDIGER , RUEHL HELMUT , KOHLE DIRK , KNOBLICH JOHANNES
IPC: G02B21/36
Abstract: The invention relates to a calibration method for an exposure meter of a microscope (1) in which the ray bundle (4; 7) exiting from the microscope objective (22) is divided in to a first partial ray bundle (8) which is guided to an eyepiece (8) in which a grid-line reticle (24) having a focussing mark is positioned and a second partial ray bundle (4) which is guided to a sensor (10) made of electrooptical pixel elements (12) downstream of which an electronic processing unit is positioned. According to the method a calibration sample (15) having a calibration reference point is arranged on the microscope table (3); by displacing the microscope table (2) the calibration reference point of the calibration sample (15) is moved into a specified positional relationship to the focussing mark of the grid-line reticle (24); in this positional relationship the calibration sample (15) having the calibration reference point is imaged on the pixel elements (12) of the sensor (10); and among the pixel elements (12) of the sensor (10) the pixel element on which the image of the calibration reference point falls is chosen as the reference pixel element for future exposure measurements.
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公开(公告)号：DE19906422A1
公开(公告)日：2000-05-31
申请号：DE19906422
申请日：1999-02-16
Applicant: LEICA MICROSYSTEMS
Inventor： WEIS ALBRECHT , GANSER MICHAEL , STENZEL RUEDIGER
Abstract: The holder has a pressed part (1) contacting the object carrier (3) at two pressing points (8,9). One point (9) lies on the x-side and the other point (8) lies on the y-side. Preferred Features: The pressed part (1) is a one-piece lever (H1) pivoting about an axis (11) fixed to the bearing part (2). The lever can additionally be moved in its longitudinal direction. The pressed part is fixed to a spring (10). The spring is provided with a magnetic holder.
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公开(公告)号：DE10018255A1
公开(公告)日：2001-10-25
申请号：DE10018255
申请日：2000-04-13
Applicant: LEICA MICROSYSTEMS
Inventor： GANSER MICHAEL , WEIS ALBRECHT , STENZEL RUEDIGER
Abstract: The laser cutting method involves bringing an object carrier (10) with a sample (12) to be cut into a microscope (1) which has at least one objective lens (6). Using the objective lens, a region to be cut out is determined. A cut line is defined around the region. A laser beam (4b) is generated through an aperture (18) so that its diameter is reduced such that a laser aperture (36) generated through the lens (6) is smaller than the lens aperture (34) of the lens itself. The sample is then cut along the cut line. Independent claims also cover an apparatus for carrying out the method.
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公开(公告)号：DE10018251A1
公开(公告)日：2001-10-25
申请号：DE10018251
申请日：2000-04-13
Applicant: LEICA MICROSYSTEMS
Inventor： GANSER MICHAEL , WEIS ALBRECHT , STENZEL RUEDIGER
Abstract: A laser micro-dissection microscope has a table for a sample illuminated by a laser light source with a lens-focused beam. The table is fixed in both the X and Y axes during dissection. The laser has a scanner with two thick wedge-shaped glass panels. The panels are inclined with respect to the optical axis and may be rotated independently of each other about the axis. A laser micro-dissection microscope has a table (1) for a sample (3) illuminated by a laser (7) light source (5) with a lens-focused (10) beam (18). The table is fixed in both the X and Y axes during dissection. The laser (7) has a scanner (9) with two thick wedge-shaped glass panels (11a,11b). The panels are inclined with respect to the optical axis (8) and may be rotated independently of each other about the axis. Rotation deflects the beam about the axis by an angle alpha. The laser beam is offset laterally with respect to the optical axis (8) by the thickness and angle of the glass panels and impinges on the center of the lens pupil (19) for all alpha angles. The laser light source is an ultra violet or VIS laser. The wedge-shaped glass panels are rotated as required by electric motors (14a,14b) with control units. The dissection unit is linked to a computer (26) with a mouse and a monitor screen (28). The computer is coupled to the motor control and laser light source. Also claimed is a process in which the preparation remains fixed while being progressively sliced in steps by the laser beam. An image of the preparation is captured by a camera (16) and presented on the monitor screen (28).
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