Abstract:
An integrated circuit capacitor (10, 25, 30, 402) containing a thin film of dielectric metaloxide (20, 420) is formed above a silicon germanium substrate (12, 406). A silicon nitride diffusion barrier layer (24, 324, 414) is deposited on a silicon germanium substrate to prevent evaporation of the substrate in subsequent heating steps. A silicon dioxide stress reduction layer is deposited on the diffusion barrier layer. A bottom electrode (16, 418) is formed on the stress reduction layer, then a liquid precursor is spun on the bottom electrode, dried at about 400 DEG C, and annealed at between 600 DEG C and 850 DEG C to form a BST capacitor dielectric (20, 420). A top electrode (22, 422) is deposited on the dielectric and annealed. The integrated circuit may also include a BiCMOS device, a HBT device or a MOSFET.
Abstract:
A coating of liquid precursor for forming a layered superlattice material is applied to a substrate, the substrate is dried and then pretreated using RTP at 450 DEG C for 5 minutes. Following the RTP, the substrate is annealed in an unreactive gas at a temperature not exceeding 800 DEG C, then annealed in oxygen gas at a temperature not exceeding 800 DEG C for one hour to form a thin film (124, 422) of layered superlattice material.
Abstract:
A thin film of ferroelectric layered superlattice material in a flat panel display device is energized to selectively influence the display image. In one embodiment, a voltage pulse causes the layered superlattice material to emit electrons that impinge upon a phosphor, causing the phosphor to emit light. In another embodiment, an electric potential creates a remanent polarization in the layered superlattice material, which exerts an electric field in liquid crystal layer, thereby influencing the transmissivity of light through the liquid crystal. The layered superlattice material is a metal oxide formed using an inventive liquid precursor containing an alkoxycarbolyxate. The thin film thickness is preferably in the range of 50-140 nm, so that polarizability and transparency of the thin film is enhanced. A display element may comprise a varistor device to prevent cross-talk between pixels and to enable sudden polarization switching. A functional gradient in the ferroelectric thin film enhances electron emission. Two ferroelectric elements, one on either side of the phosphor may be used to enhance luminescence. A phosphor can be sandwiched between a dielectric and a ferroelectric layer to enhance emission.
Abstract:
A semiconductor device forming a capacitor through an interlayer insulating layer on a semiconductor substrate on which an integrated circuit is formed. This semiconductor device has an interlayer insulating layer, which covers the capacitor, and has a passivation layer which covers the interconnections of the capacitor. The passivation layer is composed of a phospho-silicate layer and a non-doped silicate layer formed sequentially from the interconnections side. By thus constituting, deterioration of the capacitor dielectric can be prevented which brings about the electrical reliability of the ferroelectric layer or high dielectric layer.
Abstract:
A new method (P200) is provided for making magnesium oxide layers (122) in plasma displays (100). A magnesium carboxylate liquid precursor solution is applied to a display panel (102), dried, and annealed to yield a solid magnesium oxide layer (122) having excellent electro-optical performance.
Abstract:
A semiconductor device forming a capacitor through an interlayer insulating layer on a semiconductor substrate on which an integrated circuit is formed. This semiconductor device has an interlayer insulating layer, which covers the capacitor, and has a passivation layer which covers the interconnections of the capacitor. The passivation layer is composed of a phospho-silicate layer and a non-doped silicate layer formed sequentially from the interconnections side. By thus constituting, deterioration of the capacitor dielectric can be prevented which brings about the electrical reliability of the ferroelectric layer or high dielectric layer.
Abstract:
A temperature distribution measurement apparatus (100) has an infrared array sensor (1) that comprises a pyroelectric substrate with infrared ray detecting electrodes, focusing means that includes and infrared lens (2) for focusing incident infrared rays on the infrared array sensor, cylindrical chopping means (4) for intermittenly shielding the plurality of detector elements from incident infrared rays and a driving means for continuously rotating a rotation member (3) which includes infrared array sensor (1). And this temperature distribution measurement apparatus combined with computational means and detector means is applied to determine number, position, and movements of persons in a space.
Abstract:
A method of forming a Bi-layered ferroelectric thin film on a substrate with good reproducibility, using a mixed composition of a Bi-containing organic compound and a metal polyalkoxide compound by at least one technique selected from the group consisting of molecular deposition such as CVD, and spincoat-sintering.