Apparatus for measuring nonspecular reflected light
    2.
    发明公开
    Apparatus for measuring nonspecular reflected light 失效
    Vorrichtung zur Messung nichtspekularen reflektierten Lichts。

    公开(公告)号:EP0125340A2

    公开(公告)日:1984-11-21

    申请号:EP83110396.5

    申请日:1983-10-19

    Applicant: MILES INC.

    CPC classification number: G01N21/474 G01N2021/478

    Abstract: Reflectance apparatus is disclosed for obtaining measurement of nonspecular reflected light in which one or more light sources and one or more detectors are mounted together on the same plane surface in close proximity to each other at an angle (φ) from the normal to the surface of the specimen holder. Angle (φ) is selected such that the specular reflection at the surface of the specimen is insignificant compared to the minimum diffused reflection expected from the specimen.

    Abstract translation: 公开了一种用于获得非特异性反射光的测量的反射装置,其中一个或多个光源和一个或多个检测器以相对于彼此的法线表面的角度(phi)彼此靠近地安装在同一平面上, 样品架。 角度(phi)被选择为使得与样本预期的最小扩散反射相比,样品表面的镜面反射是不显着的。

    Simultaneous multiple wavelength photometer
    4.
    发明公开
    Simultaneous multiple wavelength photometer 失效
    光度计在多个波长的辐射的同时测量。

    公开(公告)号:EP0205050A2

    公开(公告)日:1986-12-17

    申请号:EP86107340.1

    申请日:1986-05-30

    Applicant: MILES INC.

    Abstract: Simultaneous multiple photometer measurements are made by simultaneously passing light to be measured through multiple light paths to different locations of a circularly variable filter; passing the light through the circularly variable filter at said locations; collecting the light passed through the circularly variable filter at each location; transmitting the light passed through the circularly variable filter to separate detectors; and measuring the light transmitted along each light path by said detectors.

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