Abstract:
A volatile/non-volatile RAM cell employing a bistable multivibrator with non-volatile, alterable-threshold capacitors (307, 308) coupled to the output terminals (A, B) thereof to provide backup data storage in a power-down situation The non-volatile capacitors each have a non-alterable section (307A, 308A) and an alterable section (307B, 308B), the non-alterable section having either a depletion or an enhancement threshold. The RAM cell incorporates both polysilicon resistors (305, 306) and enhancement mode devices (309, 310) in the load circuits of each cell to produce boot-strapping of the voltage on one of the multivibrator terminals (A, B) during a volatile/non-volatile write operation. A non-inverted restore of digital information to the bistable multivibrator is accomplished by simultaneous application of a step voltage to the cell power line (123A) and a restore pulse to the gate (307C, 308C) of the non-volatile capacitors. An alternative inverted restore for a cell utilizing depletion thresholds in the non-alterable sections (307A, 308A) of the non-volatile capacitors, (307, 308) involves grounding the gate electrode (307C, 308C) of the non-volatile capacitors to restore the previously written information to the multivibrator. A data processing system employing the volatile/non-volatile RAM system with a single five volt power supply (40) and a write/restore/erase signal generator (50), all implemented in five volt, n-channel silicon-insulator-silicon (SIS) device technology, is shown.
Abstract:
A volatile/non-volatile RAM cell (400) employing a bistable multivibrator with non-volatile, alterable-threshold capacitors (407, 408) coupled to the output terminals (A, B) thereof to provide backup data storage in a power-down situation. In one embodiment, the non-volatile capacitors each have a non-alterable section (A) and an alterable section (B), the non-alterable section having either a depletion or an enhancement threshold. The V/NV RAM cell employs a pair of field effect transistors (409, 410) of depletion or enhancement type to couple the non-volatile capacitors to the output terminals. These coupling transistors form with the non-volatile capacitors a pair of nodes (C, D). The coupling transistors are biased such that a write voltage signal applied to the gates of the non-volatile capacitors produces a bootstrapped voltage on one of the pair of nodes which is effectively isolated from the output terminals of the cell.
Abstract:
A signal generator (50A) for producing, from a low voltage power supply, relatively large magnitude pulse signals of opposite polarity to a device (10) input terminal having a parallel resistor (11)-capacitor (12) circuit connection to a reference voltage is disclosed. A voltage multiplier (52) powered by the low voltage power supply provides a multiplied voltage output which is stored on a first large capacitor (58). A second large capacitor (59) has one terminal connected to the device (10) input terminal. To produce the large, opposite polarity signals, a control circuit means operates in conjunction with the voltage multiplier (52) and the first capacitor (58) to produce a predetermined sequence of voltages on the second terminal of the second capacitor (59).
Abstract:
A low voltage write non-volatile MNOSFET memory device preferably of n-channel type has a first relatively highly doped p+ channel region (27) and a second underlying less highly doped p- region (28). The device is written to a "1" state by applying a low voltage (+12V) to the gate (21) and simultaneously applying a suitable voltage to the source (12) and/or the drain (13) to induce avalanche breakdown in the channel.