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公开(公告)号：US12042865B2
公开(公告)日：2024-07-23
申请号：US17992447
申请日：2022-11-22
Applicant: NCS Testing Technology CO., LTD
Inventor： Lei Zhao , Hui Wang , Lixia Yang , Haizhou Wang , Xuejing Shen , Yunhai Jia , Dongling Li , Xing Yu , Suran Liu
Abstract: A high-throughput 3D printing system for preparing multi-component, small sized samples, includes a raw material supply module, providing a various kinds of metal powders for printing small sized samples; the first mixer module, mixing the metal powders obtained from the raw material supply module to generate the first blended metal powders; the second mixer module, mixing the first mixed metal powders, in order to generate the second blended metal powders for printing small sized samples; the first printing module, printing the secondary blended metal powder into a small-sized sample; a control module, controlling other functional modules of the high-throughput 3D printing system for generating small-size samples.
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公开(公告)号：US11927511B2
公开(公告)日：2024-03-12
申请号：US17586729
申请日：2022-01-27
Inventor： Dongling Li , Lei Zhao , Haizhou Wang , Xuejing Shen , Qingqing Zhou , Weihao Wan , Haozhou Feng
IPC: G01N1/28 , G01N23/223 , G01N33/204
CPC classification number: G01N1/286 , G01N23/223 , G01N33/204 , G01N2001/2866 , G01N2001/2893
Abstract: The present application relates to a method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy, and relates to the technical field of analysis of metal material composition and microstructure, comprising the following steps: step 1, processing a to-be-tested sample and determining a calibration coefficient; step 2, obtaining a two-dimensional element content distribution map of the to-be-tested sample; and step 3, determining the number and average spacing of primary dendrites. A composition distribution region analyzed in the present application is larger than the area of a distribution region of the traditional microscopic analysis method, and the sample preparation is simple. The distribution, number and average spacing of the primary dendrites can be obtained without metallographic corrosion sampling. Therefore, the present invention has the advantages of large statistical field of view, high efficiency and complete information, and the statistical data is more accurate and reliable.
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3.发明授权公开(公告)号：US11193867B2
公开(公告)日：2021-12-07
申请号：US16835899
申请日：2020-03-31
Applicant: The NCS Testing Technology Co., Ltd.
Inventor： Guiyong Wang , Haizhou Wang , Linmao Zhu , Zhigang Yang , Peng Wang , Tiezhu Zhu , Lei Zhao , Dongling Li
Abstract: The present invention relates to a test system and method capable of simultaneously carrying out a high-throughput test of mechanical properties for miniature specimens. The system comprises one workstation (17) and a plurality of specimen test modules (16) installed horizontally or vertically on a workbench (15), wherein the workstation (17) comprises an operation interface, a data processing unit and a load output unit; each specimen test module (16) comprises a drive unit (5), an interchangeable clamp unit (8), a displacement sensor (2), and a load sensor (14); the workstation (17) controls the drive unit (5) of the specimen test module (16) and receives detection data of the displacement sensor (2) and the load sensor (14); each specimen test module (16) optionally performs mechanical property testing independently; and the workstation (17) controls simultaneously started testing of a plurality of specimens (9). The present invention can achieve tensile, bending, compression bending, stress-rupture, relaxation, and fatigue strength tests on a plurality of specimens at the same time.
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公开(公告)号：US11754503B1
公开(公告)日：2023-09-12
申请号：US17975636
申请日：2022-10-28
Applicant: NCS TESTING TECHNOLOGY CO., LTD
Inventor： Yunhai Jia , Haizhou Wang , Liangjing Yuan , Xiaofen Zhang , Qiaochu Zhang , Lei Yu , Liang Sheng , Baibing Li
Abstract: A measurement deviation correction method and system for spark discharge analysis of a large-size metal material includes: performing line-by-line scanning measurement on a surface of the material to obtain a line component content, performing in-line correction on the line component content by adopting a line linear fitting model, and performing inter-line correction by taking a total average value obtained by eliminating an extreme value from a line component content distribution to obtain an inter-line corrected component content; performing column-by-column scanning measurement on the surface of the material to obtain a column component content, performing in-column correction on the column component content by adopting a column linear fitting model, and performing inter-column correction by taking a total average value obtained by eliminating an extreme value from the column component content; and coupling the inter-line corrected component content and the inter-column corrected component content to obtain an optimal measurement component content.
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5.发明公开公开(公告)号：US20240068936A1
公开(公告)日：2024-02-29
申请号：US17962602
申请日：2022-10-10
Applicant: NCS Testing Technology CO., LTD.
Inventor： Jia Liu , Feipeng Cui , Xiaopeng Li , Ling Liu , Hongwei Shi , Feifei Guo , Ying Zhao , Xuejing Shen , Haizhou Wang
CPC classification number: G01N21/3103 , G06K9/0051 , G06K9/6235 , G06N3/126 , G06K2009/6237
Abstract: An adaptive characteristic spectral line screening method and system based on atomic emission spectrum are provided, the method includes: using a set characteristic screening optimization method to perform a plurality of optimization rounds of characteristic screening, obtaining an initialized spectral dataset of each round of the characteristic screening and initialized characteristic population genes; obtaining an optimal characteristic population gene of each round by a set analysis method, a fitness function, and an iteration of a genetic algorithm; obtaining an optimized characteristic spectral information set when the plurality of optimization rounds reach set optimization rounds; performing combination statistics and discriminant analyses on the optimized characteristic spectral information set to complete an adaptive characteristic spectral line screening. The disclosure can efficiently and automatically screen out the characteristic spectral lines that meet the analysis requirements in the complex atomic emission spectrum, thus ensuring the effectiveness and accuracy of screening the characteristic spectral lines.
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Patent Agency Ranking
公开(公告)号：US20240066602A1
公开(公告)日：2024-02-29
申请号：US17992447
申请日：2022-11-22
Applicant: NCS Testing Technology CO.,LTD
Inventor： Lei Zhao , Hui Wang , Lixia Yang , Haizhou Wang , Xuejing Shen , Yunhai Jia , Dongling Li , Xing Yu , Suran Liu
Abstract: A high-throughput 3D printing system for preparing multi-component, small sized samples, includes a raw material supply module, providing a various kinds of metal powders for printing small sized samples; the first mixer module, mixing the metal powders obtained from the raw material supply module to generate the first blended metal powders; the second mixer module, mixing the first mixed metal powders, in order to generate the second blended metal powders for printing small sized samples; the first printing module, printing the secondary blended metal powder into a small-sized sample; a control module, controlling other functional modules of the high-throughput 3D printing system for generating small-size samples.
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7.发明授权公开(公告)号：US11906474B2
公开(公告)日：2024-02-20
申请号：US17333012
申请日：2021-05-28
Applicant: NCS Testing Technology CO., LTD
Inventor： Guiyong Wang , Haizhou Wang , Peng Wang , Linmao Zhu , Tiezhu Zhu , Lei Zhao , Donglin Li
CPC classification number: G01N3/06 , G01N2203/003 , G01N2203/0017 , G01N2203/0019 , G01N2203/0023 , G01N2203/0026 , G01N2203/06
Abstract: A high-throughput and small size samples tension, compression, bending test system is disclosed. The system includes a computer unit, a motor and a number of the sample testing modules mounted horizontally or perpendicular to that ground on a workbench. The sample testing modules include a sample testing modules base plate fixedly attached to the workbench, and a ball screw, a displacement sensor, a moving beam, a clamp unit, a linear moving platform unit and a force value sensor arranged on the sample testing modules base plate. A number of the sample testing modules are arrange in parallel on the workbench or uniformly distributed in a circumferential direction with a point on the workbench as a circular center.
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公开(公告)号：US10804073B2
公开(公告)日：2020-10-13
申请号：US16669274
申请日：2019-10-30
Applicant: THE NCS TESTING TECHNOLOGY CO., LTD.
Inventor： Haizhou Wang , Xing Yu , Xuejing Shen , Yunhai Jia , Xiaojia Li , Yuhua Lu , Weihao Wan , Jianqiu Luo , Dongling Li , Lei Zhao
Abstract: An apparatus and method for a large-scale high-throughput quantitative characterization and three-dimensional reconstruction of a material structure. The apparatus having a glow discharge sputtering unit, a sample transfer device, a scanning electron microscope unit and a GPU computer workstation. The glow discharge sputtering unit can achieve large size (cm order), nearly flat and fast sample preparation, and controllable achieve layer-by-layer ablation preparation along the depth direction of the sample surface; rapid scanning electron microscopy (SEM) can achieve large-scale and high-throughput acquisition of sample characteristic maps. The sample transfer device is responsible for transferring the sample between the glow discharge sputtering source and the scanning electron microscope in an accurately positioning manner. The GPU computer workstation performs splicing, processing, recognition and quantitative distribution characterization on the acquired sample characteristic maps, and carries out three-dimensional reconstruction of the structure of the sample prepared by layer-by-layer sputtering.
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公开(公告)号：US12146845B2
公开(公告)日：2024-11-19
申请号：US17902952
申请日：2022-09-05
Inventor： Lixia Yang , Haizhou Wang , Lizhi Ren , Danqi Huang , Lei Zhao , Xuejing Shen , Dongling Li , Zongxin Liu , Changwang Zhu , Yang Wang , Yunhai Jia
IPC: G01N23/20025 , G01N23/207
Abstract: A component residual stress testing platform based on neutron diffraction and experimental method thereof are provided, the testing platform includes a component support, a rotating mainshaft, a first thrust cylindrical roller bearing, a first cylindrical roller bearing, a bearing spacing sleeve, a second cylindrical roller bearing, a sleeve, and a first fixed baffle. The rotating mainshaft is disposed on the component support. The first thrust cylindrical roller bearing, the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing are sleeved on the rotating mainshaft, the sleeve is sleeved outside the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing, a component to be tested is sleeved on the sleeve. The testing platform can support, move, tilt and rotate the component to be tested in a process of a residual stress testing.
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公开(公告)号：US12019025B2
公开(公告)日：2024-06-25
申请号：US17315235
申请日：2021-05-07
Applicant: NCS Testing Technology CO., LTD
Inventor： Xing Yu , Haizhou Wang , Xuejing Shen , Xiaojia Li , Yifei Zhu , Weihao Wan , Yuhua Lu , Hui Wang , Qun Ren , Yongqing Wang , Zhenzhen Wan
CPC classification number: G01N21/67 , C23C14/3435 , H01J49/0459 , H01J49/06 , H01J49/12
Abstract: An apparatus and a method for preparing glow discharge sputtering samples for materials microscopic characterization are provided. The apparatus includes a glow discharge sputtering unit, a glow discharge power supply, a gas circuit automatic control unit, a spectrometer, and a computer. The structure of the glow discharge sputtering unit is optimized to be more suitable for sample preparation by simulation. By adding a magnetic field to the glow discharge plasma, uniform sample sputtering is realized within a large size range of the sample surface. The spectrometer monitors multi-element signal in a depth direction of the sample sputtering, so that precise preparation of different layer microstructures is realized. In conjunction with the acquisition of the sample position marks and the precise spatial coordinates (x, y, z) information, the correspondence between the surface space coordinates and the microstructure of the sample is conveniently realized.
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