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公开(公告)号:US12042865B2
公开(公告)日:2024-07-23
申请号:US17992447
申请日:2022-11-22
Applicant: NCS Testing Technology CO., LTD
Inventor: Lei Zhao , Hui Wang , Lixia Yang , Haizhou Wang , Xuejing Shen , Yunhai Jia , Dongling Li , Xing Yu , Suran Liu
Abstract: A high-throughput 3D printing system for preparing multi-component, small sized samples, includes a raw material supply module, providing a various kinds of metal powders for printing small sized samples; the first mixer module, mixing the metal powders obtained from the raw material supply module to generate the first blended metal powders; the second mixer module, mixing the first mixed metal powders, in order to generate the second blended metal powders for printing small sized samples; the first printing module, printing the secondary blended metal powder into a small-sized sample; a control module, controlling other functional modules of the high-throughput 3D printing system for generating small-size samples.
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公开(公告)号:US20240066602A1
公开(公告)日:2024-02-29
申请号:US17992447
申请日:2022-11-22
Applicant: NCS Testing Technology CO.,LTD
Inventor: Lei Zhao , Hui Wang , Lixia Yang , Haizhou Wang , Xuejing Shen , Yunhai Jia , Dongling Li , Xing Yu , Suran Liu
Abstract: A high-throughput 3D printing system for preparing multi-component, small sized samples, includes a raw material supply module, providing a various kinds of metal powders for printing small sized samples; the first mixer module, mixing the metal powders obtained from the raw material supply module to generate the first blended metal powders; the second mixer module, mixing the first mixed metal powders, in order to generate the second blended metal powders for printing small sized samples; the first printing module, printing the secondary blended metal powder into a small-sized sample; a control module, controlling other functional modules of the high-throughput 3D printing system for generating small-size samples.
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公开(公告)号:US10804073B2
公开(公告)日:2020-10-13
申请号:US16669274
申请日:2019-10-30
Applicant: THE NCS TESTING TECHNOLOGY CO., LTD.
Inventor: Haizhou Wang , Xing Yu , Xuejing Shen , Yunhai Jia , Xiaojia Li , Yuhua Lu , Weihao Wan , Jianqiu Luo , Dongling Li , Lei Zhao
Abstract: An apparatus and method for a large-scale high-throughput quantitative characterization and three-dimensional reconstruction of a material structure. The apparatus having a glow discharge sputtering unit, a sample transfer device, a scanning electron microscope unit and a GPU computer workstation. The glow discharge sputtering unit can achieve large size (cm order), nearly flat and fast sample preparation, and controllable achieve layer-by-layer ablation preparation along the depth direction of the sample surface; rapid scanning electron microscopy (SEM) can achieve large-scale and high-throughput acquisition of sample characteristic maps. The sample transfer device is responsible for transferring the sample between the glow discharge sputtering source and the scanning electron microscope in an accurately positioning manner. The GPU computer workstation performs splicing, processing, recognition and quantitative distribution characterization on the acquired sample characteristic maps, and carries out three-dimensional reconstruction of the structure of the sample prepared by layer-by-layer sputtering.
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公开(公告)号:US12019025B2
公开(公告)日:2024-06-25
申请号:US17315235
申请日:2021-05-07
Applicant: NCS Testing Technology CO., LTD
Inventor: Xing Yu , Haizhou Wang , Xuejing Shen , Xiaojia Li , Yifei Zhu , Weihao Wan , Yuhua Lu , Hui Wang , Qun Ren , Yongqing Wang , Zhenzhen Wan
CPC classification number: G01N21/67 , C23C14/3435 , H01J49/0459 , H01J49/06 , H01J49/12
Abstract: An apparatus and a method for preparing glow discharge sputtering samples for materials microscopic characterization are provided. The apparatus includes a glow discharge sputtering unit, a glow discharge power supply, a gas circuit automatic control unit, a spectrometer, and a computer. The structure of the glow discharge sputtering unit is optimized to be more suitable for sample preparation by simulation. By adding a magnetic field to the glow discharge plasma, uniform sample sputtering is realized within a large size range of the sample surface. The spectrometer monitors multi-element signal in a depth direction of the sample sputtering, so that precise preparation of different layer microstructures is realized. In conjunction with the acquisition of the sample position marks and the precise spatial coordinates (x, y, z) information, the correspondence between the surface space coordinates and the microstructure of the sample is conveniently realized.
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公开(公告)号:US20230205175A1
公开(公告)日:2023-06-29
申请号:US18116279
申请日:2023-03-01
Applicant: NCS Testing Technology CO.,LTD
Inventor: Lei Zhao , Haizhou Wang , Lixia Yang , Lei Yu , Xuebin Chen , Hui Wang , Xuejing Shen , Yunhai Jia , Dongling Li , Xing Yu
IPC: G05B19/4099
CPC classification number: G05B19/4099 , G05B2219/49023
Abstract: The present invention discloses an integrated research and development system for high-throughput preparation and statistical mapping characterization of materials, comprising: a high-throughput preparation module, a high-throughput characterization module, an automatic control module and a statistical mapping data processing module; the high-throughput preparation module is used for preparing a multi-component combinatorial-sample; the high-throughput characterization module comprises a plurality of different high-throughput characterization devices; the automatic control module comprises a special sample box, a sample moving platform, an intelligent mechanical arm and a synchronous control system; and the statistical mapping data processing module is used for constructing a statistical mapping constitutive model corresponding to position mapping according to the composition, microstructure and performance data of the combinatorial-sample. The present invention integrates multiple functions, has high automatic control level, improves the experimental speed and experimental efficiency.
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