1.
    发明专利
    未知

    公开(公告)号:DE102005039068A1

    公开(公告)日:2007-02-15

    申请号:DE102005039068

    申请日:2005-08-11

    Abstract: The invention relates to semiconductor substrates and methods for producing such semiconductor substrates. In this connection, it is the object of the invention to provide semiconductor substrates which can be produced more cost-effectively and with which a high arrangement density as well as good electrical conductivity and closed surfaces can be achieved. In accordance with the invention, an electrically conductive connection is guided from its front side through the substrate up to the rear side. The electrically conductive connection is completely surrounded from the outside. The insulator is formed by an opening which is filled with material. The inner wall is provided with a dielectric coating and/or filled with an electrically insulating or conductive material. The electrically conductive connection is formed with a further opening which is filled with an electrically conductive material and is arranged in the interior of the insulator. The openings are formed with step-free inner walls aligned orthogonally to the front side or tapering continuously in the direction of the rear side.

    3.
    发明专利
    未知

    公开(公告)号:DE602005019622D1

    公开(公告)日:2010-04-08

    申请号:DE602005019622

    申请日:2005-12-19

    Abstract: The present invention provides a radiation sensor featuring a plurality of individual sensor elements, e.g. pixels, each of which having a radiation detection portion that is adapted to generate an electric current in response to impingement of electromagnetic radiation and a current amplifier for amplifying the photoelectric current generated by the radiation detection portion. Current amplification is therefore performed locally within each pixel of the radiation sensor itself. This local current amplification effectively allows to increase sensitivity and response of the radiation sensor and therefore enables implementation of the radiation sensor on the basis of CMOS technology. By means of the current amplification, the radiation sensor can be adapted for read-out by means of read-out devices and signal processing modules featuring distinct input specifications Further, a bias current required by the pixel implemented current amplifier is reproduced within each pixel and coupled to consecutive or adjacently arranged sensor elements or pixel, thereby providing a cascaded bias current regeneration and bias current distribution scheme.

    APPARATUS, IMAGING DEVICE AND METHOD FOR DETECTING X-RAY RADIATION
    4.
    发明申请
    APPARATUS, IMAGING DEVICE AND METHOD FOR DETECTING X-RAY RADIATION 审中-公开
    装置,成像装置和用于检测X射线辐射的方法

    公开(公告)号:WO2008050283A2

    公开(公告)日:2008-05-02

    申请号:PCT/IB2007054283

    申请日:2007-10-22

    CPC classification number: G01T1/17

    Abstract: The invention is directed at an apparatus (10), an imaging device and a method for detecting X-ray photons, in particular photons (32,34) in a computer tomograph. Photons (32,34) are converted into an electrical pulse and compared against a threshold using a discriminator (20). The electrical network (12) performing these functions comprises a switching element (28), that can modify the electrical path (22) along which the process signals travel. The trigger signal (V T ) for actuating the switching element (28) is derived from an electrical state of the electrical path (22). If a pulse associated to a photon (32,34) is detected, the switching element (28) is actuated in order to avoid that the processing of the charge pulse stemming from a first photon (32) is affected by a subsequent second photon (34).

    Abstract translation: 本发明涉及一种用于检测计算机断层摄影机中的X射线光子,特别是光子(32,34)的成像装置和方法的装置(10)。 光子(32,34)被转换成电脉冲,并使用鉴别器(20)与阈值进行比较。 执行这些功能的电网(12)包括开关元件(28),其可以修改过程信号沿其移动的电路径(22)。 用于致动开关元件(28)的触发信号(V SUB T)是从电路径(22)的电气状态导出的。 如果检测到与光子(32,34)相关联的脉冲,则开关元件(28)被致动以避免由第一光子(32)产生的电荷脉冲的处理受随后的第二光子( 34)。

    RADIATION DETECTOR ASSEMBLY WITH TEST CIRCUITRY
    5.
    发明申请
    RADIATION DETECTOR ASSEMBLY WITH TEST CIRCUITRY 审中-公开
    辐射检测器总成与测试电路

    公开(公告)号:WO2011077302A2

    公开(公告)日:2011-06-30

    申请号:PCT/IB2010055633

    申请日:2010-12-07

    Abstract: A radiation detector assembly (20) includes a detector array module (40) configured to convert radiation particles to electrical detection pulses, and an application specific integrated circuit (ASIC) (42) operatively connected with the detector array. The ASIC includes signal processing circuitry (60) configured to digitize an electrical detection pulse received from the detector array, and test circuitry (80) configured to inject a test electrical pulse into the signal processing circuitry. The test circuitry includes a current meter (84) configured to measure the test electrical pulse injected into the signal processing circuitry, and a charge pulse generator (82) configured to generate a test electrical pulse that is injected into the signal processing circuitry. The radiation detector assembly (20) is assembled by operatively connecting the ASIC (42) with the detector array module (40), and the signal processing circuitry (60) of the ASIC of the assembled radiation detector assembly is tested without the use of radiation.

    Abstract translation: 辐射检测器组件(20)包括被配置为将辐射粒子转换成电检测脉冲的检测器阵列模块(40)以及与检测器阵列可操作地连接的专用集成电路(ASIC)(42)。 ASIC包括被配置为数字化从检测器阵列接收的电检测脉冲的信号处理电路(60),以及配置成将测试电脉冲注入到信号处理电路中的测试电路(80)。 测试电路包括配置成测量注入到信号处理电路中的测试电脉冲的电流计(84)和被配置为产生被注入到信号处理电路中的测试电脉冲的充电脉冲发生器(82)。 通过将ASIC(42)与检测器阵列模块(40)可操作地连接来组装放射线检测器组件(20),并且组装的辐射探测器组件的ASIC的信号处理电路(60)被测试而不使用辐射 。

    SPECTRAL IMAGING
    7.
    发明申请
    SPECTRAL IMAGING 审中-公开
    光谱成像

    公开(公告)号:WO2010119358A3

    公开(公告)日:2011-08-25

    申请号:PCT/IB2010051101

    申请日:2010-03-15

    CPC classification number: G01T1/1647 G01T1/2985

    Abstract: An imaging system includes a scintillator array (202) and a digital photomultiplier array (204). A photon counting channel (212), an integrating channel (210), and a moment generating channel (214) process the output signal of the digital photomultiplier array (204). A reconstructor (122) spectrally resolves the first, the second and the third output signals. In one embodiment, a controller (232) activates the photon counting channel (212) to process the digital signal only if a radiation flux is below a predetermined threshold. An imaging system includes at least one direct conversion layer (302) and at least two scintillator layers (304) and corresponding photosensors (306). A photon counting channel (212) processes an output of the at least one direct conversion layer (302), and an integrating channel (210) and a moment generating channel (214) process respective outputs of the photosensors (306). A reconstructor (122) spectrally resolves the first, the second and the third output signals.

    Abstract translation: 成像系统包括闪烁体阵列(202)和数字光电倍增管阵列(204)。 光子计数通道(212),积分通道(210)和力矩产生通道(214)处理数字光电倍增管阵列(204)的输出信号。 重建器(122)对第一,第二和第三输出信号进行光谱解析。 在一个实施例中,仅当辐射通量低于预定阈值时,控制器(232)激活光子计数通道(212)才能处理数字信号。 成像系统包括至少一个直接转换层(302)和至少两个闪烁体层(304)和对应的光电传感器(306)。 光子计数通道(212)处理至少一个直接转换层(302)的输出,并且积分通道(210)和力矩产生通道(214)处理光电传感器(306)的相应输出。 重建器(122)对第一,第二和第三输出信号进行光谱解析。

    RADIATION DETECTOR WITH COUNTING ELECTRONICS
    8.
    发明申请
    RADIATION DETECTOR WITH COUNTING ELECTRONICS 审中-公开
    具有计数电子的辐射探测器

    公开(公告)号:WO2008020379A3

    公开(公告)日:2008-04-03

    申请号:PCT/IB2007053182

    申请日:2007-08-10

    CPC classification number: G01T1/17

    Abstract: The invention relates to a radiation detector, particularly an X-ray detector (100), comprising a counting circuitry (10, 20, 30) for counting electrical pulses generated by the (sub-)pixels (2) of the detector. In the counting circuitry, the results counted by a fast counting stage (10) are at intervals transferred to a slow counting stage (20). The fast counting stage (10) may for example comprise a fast counter (111) with a low bit-depth operating as a frequency divider in front of a slow counter (121) of high bit-depth in the slow counting stage (20). The counting circuitry (10, 20, 30) can optionally be fed via a multiplexer (4) with the signals of several (sub-)pixels (2). Furthermore, the pixels (1, 2) of the radiation device may optionally deliver energy resolved pulses.

    Abstract translation: 本发明涉及一种辐射检测器,特别是一种X射线检测器(100),包括用于对由检测器的(子)像素(2)产生的电脉冲进行计数的计数电路(10,20,30)。 在计数电路中,通过快速计数级(10)计数的结果以间隔传送到慢计数级(20)。 快速计数级(10)可以例如包括具有低位深度的快速计数器(111),其作为在慢计数级(20)中的高位深度的慢计数器(121)前面的分频器操作, 。 计数电路(10,20,30)可以可选地通过多路复用器(4)与多个(子)像素(2)的信号馈送。 此外,辐射装置的像素(1,2)可以可选地递送能量分辨脉冲。

    SPECTRAL PHOTON COUNTING DETECTOR
    10.
    发明申请
    SPECTRAL PHOTON COUNTING DETECTOR 审中-公开
    光谱计数检测器

    公开(公告)号:WO2008146218A3

    公开(公告)日:2009-06-25

    申请号:PCT/IB2008052029

    申请日:2008-05-22

    CPC classification number: G01T1/171

    Abstract: An apparatus includes a scale factor determiner (236) that determines a count scale factor based on a measured count of a number detected photons for an energy threshold and an estimated actual count of the number of detected photons. The photons include poly-energetic photons detected by a radiation sensitive detector. The apparatus further includes a count sealer (136) that employs the count scale factor to scale measured counts of detected photons for different energy thresholds.

    Abstract translation: 一种装置包括比例因子确定器(236),该比例因子确定器(236)基于针对能量阈值的检测到的光子数量的测量计数和检测到的光子数量的估计实际计数来确定计数比例因子。 光子包括由辐射敏感检测器检测的多能光子。 该装置还包括计数密封器(136),其使用计数比例因子来缩放检测到的光子对于不同能量阈值的计数。

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