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公开(公告)号:WO2023091285A1
公开(公告)日:2023-05-25
申请号:PCT/US2022/048192
申请日:2022-10-28
Applicant: QUALCOMM INCORPORATED
Inventor: PATIL, Aniket , LISK, Durodami , WE, Hong Bok , PAYNTER, Charles David
IPC: H01L23/538 , H01L25/10 , H05K1/14 , H01L25/065 , H01L25/18 , H01L23/00
Abstract: A device comprising a first package and a second package coupled to the first package through a first plurality of solder interconnects. The first package includes a first substrate comprising at least one first dielectric layer and a first plurality of interconnects, and a first integrated device coupled to the first substrate. The second package includes a second substrate comprising at least one second dielectric layer and a second plurality of interconnects, a second integrated device coupled to a first surface of the second substrate, a third integrated device coupled to the first surface of the second substrate through a second plurality of solder interconnects and a first plurality of channel interconnects coupled to the first surface of the second substrate, wherein the first plurality of channel interconnects is located between solder interconnects from the second plurality of solder interconnects.
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公开(公告)号:WO2022164559A1
公开(公告)日:2022-08-04
申请号:PCT/US2021/064902
申请日:2021-12-22
Applicant: QUALCOMM INCORPORATED
Inventor: PATIL, Aniket , WE, Hong Bok
IPC: H01L23/538 , H01L21/48 , G11C5/06
Abstract: A package comprising a substrate, a first integrated device and a second integrated device. The substrate includes at least one dielectric layer, a plurality of interconnects, a solder resist layer, and a plurality of periphery interconnects located over the solder resist layer. The first integrated device is coupled to the substrate. The second integrated device is coupled to the substrate. The second integrated device is configured to be electrically coupled to the first integrated device through the plurality of periphery interconnects.
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公开(公告)号:WO2022072101A1
公开(公告)日:2022-04-07
申请号:PCT/US2021/048248
申请日:2021-08-30
Applicant: QUALCOMM INCORPORATED
Inventor: PATIL, Aniket , WE, Hong Bok , BUOT, Joan Rey Villarba
IPC: H01L25/065 , H01L25/16 , H01L25/18 , H01L23/538
Abstract: Terminal connection routing on top of a substrate surface connects to component terminals to and from PMIC devices and provides a novel structure to connect surface mount technology (SMT) passive device terminals on an SMT layer (such as a Cu bar mesh) that uses the 3D space available near to components to lower resistance / lower inductive path and provides a shorter path, SIP form factor reduction, a component placement density increase, creates an additional PDN layer for connectivity and, if the routing is encapsulated in a mold, protects the metal in the connection from oxidation.
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公开(公告)号:WO2022060511A1
公开(公告)日:2022-03-24
申请号:PCT/US2021/046323
申请日:2021-08-17
Applicant: QUALCOMM INCORPORATED
Inventor: KIM, Jonghae , PATIL, Aniket
IPC: H01L25/16 , H01L25/10 , H01L25/065 , H01L25/00 , H01L23/00
Abstract: An integrated circuit (IC) with reconstituted die interposer for improved connectivity has at least one device or component mounted on an exterior upper surface that couples to a die in an interposer layer within the package. The interposer layer may have interconnect structures, where a first interconnect structure has vias of a first pitch and a second interconnect structure has vias of a second pitch greater than the first pitch. In this manner, the interposer layer acts as a device that can allow conductive coupling for other devices with those pitches to support interconnections between those devices and other devices within the interposer layer.
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5.
公开(公告)号:WO2021173825A1
公开(公告)日:2021-09-02
申请号:PCT/US2021/019654
申请日:2021-02-25
Applicant: QUALCOMM INCORPORATED
Inventor: PATIL, Aniket , WANG, Zhijie , WE, Hong, Bok
IPC: H01L25/065 , H01L21/683 , H01L23/00
Abstract: A package comprising a substrate, an integrated device, and an interconnect structure. The substrate includes a first surface and a second surface. The substrate further includes a plurality of interconnects for providing at least one electrical connection to a board. The integrated device is coupled to the first surface of the substrate. The interconnect structure is coupled to the first surface of the substrate. The integrated device, the interconnect structure and the substrate are coupled together in such a way that when a first electrical signal travels between the integrated device and the board, the first electrical signal travels through at least the substrate, then through the interconnect structure and back through the substrate.
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6.
公开(公告)号:EP4302327A1
公开(公告)日:2024-01-10
申请号:EP22705351.9
申请日:2022-02-01
Applicant: QUALCOMM INCORPORATED
Inventor: PATIL, Aniket , WE, Hong Bok , YAN, Bohan
IPC: H01L23/367 , H01L23/433
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7.
公开(公告)号:EP4205172A1
公开(公告)日:2023-07-05
申请号:EP21763187.8
申请日:2021-08-06
Applicant: QUALCOMM INCORPORATED
Inventor: PATIL, Aniket , BUOT, Joan Rey Villarba , WE, Hong Bok
IPC: H01L23/522 , H01L23/528 , H01L21/48 , H01L23/498 , H01L23/538
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公开(公告)号:EP4038663A1
公开(公告)日:2022-08-10
申请号:EP20775456.5
申请日:2020-09-01
Applicant: QUALCOMM INCORPORATED
Inventor: PATIL, Aniket , WE, Hong Bok , RAE, David Fraser
IPC: H01L23/498 , H01L23/538 , H05K3/46
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9.
公开(公告)号:WO2022216389A1
公开(公告)日:2022-10-13
申请号:PCT/US2022/018955
申请日:2022-03-04
Applicant: QUALCOMM INCORPORATED
Inventor: PATIL, Aniket , WE, Hong Bok , BUOT, Joan, Rey, Villarba
IPC: H01L23/498 , H01L23/50
Abstract: A device comprising a first substrate comprising a first plurality of pillar interconnects; a second substrate comprising a second plurality of pillar interconnects, wherein the second plurality of pillar interconnects is coupled to the first plurality of pillar interconnects through a plurality of solder interconnects; a passive component located between the first substrate and the second substrate; and an integrated device coupled to the first substrate.
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公开(公告)号:WO2022164565A1
公开(公告)日:2022-08-04
申请号:PCT/US2021/065329
申请日:2021-12-28
Applicant: QUALCOMM INCORPORATED
Inventor: BUOT, Joan Rey Villarba , PATIL, Aniket , WANG, Zhijie , WE, Hong Bok
IPC: H01L23/538 , H01L25/065 , H01L23/00 , H01L23/498
Abstract: Disclosed are examples of integrated circuit (IC) packages. Each IC package may include a flip-chip (FC) die on a substrate, a wire bond die above the FC die, a wire bond connected to the wire bond die, and a mold on the substrate and encapsulating the FC die, the wire bond die, and the wire bond. The substrate may include at least a first metallization layer comprising a first substrate layer, a trace on the first substrate layer and routed within the first metallization layer to electrically couple with one or more FC interconnects of the FC die, and a bond finger pad formed on the trace. The bond finger pad may be circular. The wire bond may electrically connect to the trace such that the wire bond die is electrically coupled with the FC die through the wire bond, the bond finger pad, and the trace.
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