Abstract:
A high density non volatile ferroelectric-based memory (500) based on ferroelectric FET operated in a two terminal write mode. Storage words may be constructed either from one or two bit storage cells based on a ferroelectric FET (10). A memory using either the one or two bit storage cells includes a plurality of word storage cells (502) organized into a rectangular array including a plurality of columns and rows. Each of the single bit memory cells (101) includes a pass transistor (115) and a ferroelectric storage element (116). All of the gates of the ferroelectric storage elements transistors are connected to a common gate electrode (122), and all of the source electrodes are connected to a common source electrode (121). If the memory is built as a two bit storage cell (300), all of the common source electrodes in each of the columns are connected electrically to a column electrode (504) corresponding to that column and all of the pass gates in each of the rows that are connected electrically to a row electrode (503) corresponding to that row.
Abstract:
A memory (500) for storing a plurality of words of data. Each of the words includes N data bits, where N is an integer greater than 1. The memory (500) includes a plurality of storage cells, each of the word storage cells having N + 1 single bit memory cells (512, 513, 514, 517). The single bit memory cells (512, 513, 514, 517) are numbered from 1 to N + 1. Each of the single bit memory cells (512, 513, 514, 517) connects a conductor in a word bus common to all of the memory cells in that word to a bit line that is connected in common to all of the single bit memory cells (512, 513, 514, 517) having the same number. The word bus also includes a conductor for transmitting a signal indicating that this connection is to be made. Each of the single bit memory cells (512, 513, 514) having a number between 1 and N stores one of the N data bits. The memory (500) also includes N sense amplifiers (550, 560, 570), one of the sense amplifiers (550, 560, 570) being connected to each of the bit lines to which the bits numbered 1 to N are connected. Each of the sense amplifiers (550, 560, 570) compares a signal on the bit line (551-553) connected thereto to a signal on the bit line (557) connected to the single bit memory cells (517) numbered (N + 1). When data is written into the data bits of the word, a predetermined value is preferably written into the single bit memory cell (517) number N + 1. Embodiments of the present invention based on ferroelectric FET memory cells (10) or ferroelectric capacitor-based memory cells (100) are preferred.