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公开(公告)号:JP2006226975A
公开(公告)日:2006-08-31
申请号:JP2005044781
申请日:2005-02-21
Applicant: SEIKO INSTR INC
Inventor: MATSUZAWA OSAMU , TAKAHASHI HIROSHI , HAMAO HISANORI
Abstract: PROBLEM TO BE SOLVED: To precisely measure force output by a cantilever for observation or other pressing member, and to maintain linearity of an output signal over a wide dynamic range. SOLUTION: This minute force measuring instrument 1 includes the cantilever 3 for measurement formed into an overhung beam shape, a distortion sensor 5 for detecting a distortion of the cantilever 3 for the measurement, and a power point detecting sensor 6 provided in the cantilever 3 for the measurement to detect a power point position. COPYRIGHT: (C)2006,JPO&NCIPI
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公开(公告)号:JP2000214093A
公开(公告)日:2000-08-04
申请号:JP1620399
申请日:1999-01-25
Applicant: SEIKO INSTR INC
Inventor: ITOU TETSUMASA , TAKAZAWA RYOJI , NAKAGAWA YOSHITOMO , MATSUZAWA OSAMU
IPC: G01N21/73
Abstract: PROBLEM TO BE SOLVED: To maintain a positional relationship constant even when a force is applied to a torch by setting a torch branch pipe clip which enables a torch branch pipe to be fitted by rotating the torch centering a center axis of the torch. SOLUTION: The inductively coupled plasma emission spectrochemical analyzing apparatus is provided with a torch branch pipe clip 9 for holding, e.g. a plasma gas feed pipe 10 of a torch 12. A gap of the torch branch pipe clip 9 has an equal size to an outer diameter of the plasma gas feed pipe 10. The plasma gas feed branch pipe 10 is fitted by rotating the torch 12 about a center axis of the torch after setting the torch to a torch-fixing tool 7. The fixed torch 12 is accordingly prevented from moving back and forth in a direction of the center axis. A positional relationship in the direction of the center axis between an XYZ stage 14 and the torch 12 is kept constant. Unless a position of the XYZ stage 14 changes, a positional relationship between a plasma 2 formed to a leading end of the torch 12 and a sampling cone 1 or the like is constant at all times, and therefore measurement results of good reproducibility can be obtained.
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公开(公告)号:JP2000258249A
公开(公告)日:2000-09-22
申请号:JP6555999
申请日:1999-03-11
Applicant: SEIKO INSTR INC
Inventor: ITOU TETSUMASA , MATSUZAWA OSAMU
Abstract: PROBLEM TO BE SOLVED: To obtain a spectrum analyzer easily imaging all wave lengths at a two-dimensional detector at a low price to measure every wavelength. SOLUTION: In a spectrum analyzer comprising a diffraction grating 7 diffracting incident light and an order dispersing element 4 further dispersing the diffracted light by the grating 7 every diffraction order, the grating 7 is placed in a diffraction face 14 and rotatably with a straight line 16 vertical to an inscribing line of the channel of the grating 7 as an axis.
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公开(公告)号:JP2000352556A
公开(公告)日:2000-12-19
申请号:JP16433799
申请日:1999-06-10
Applicant: SEIKO INSTR INC
Inventor: MATSUZAWA OSAMU
IPC: G01N21/73
Abstract: PROBLEM TO BE SOLVED: To measure with a good stability even when a peak of any light intensity is repeatedly measured by setting a diaphragm to an optical path to prevent a detect value stability from being affected by an open time of a mechanism shutter with an exposure time being set equal and, controlling the intensity of light focused to a two-dimensional detector. SOLUTION: A sample is introduced to a light-emitting part 1, thereby emitting light. The light enters a spectroscope via a condenser lens 2, an entrance slit 3 and the like. A divergent luminous flux 5 is reflected by a collimating mirror 6 and enters a diffraction grating 7. Grooves are formed at regular intervals to a surface of the diffraction grating 7. The light hits a order dispersion element 4 and scatters after being dispersed to wavelengths. The light thus dispersed in two dimensions is turned by a camera mirror 9 to a convergent luminous flux 20, reflected and focused to each coordinate of a two-dimensional detector 8. If a light-reducing means 11 is set in an optical path of a parallel luminous flux 14, the light passing the light-reducing means 11 is turned to the circular parallel luminous flux 14 of an equal diameter to an opening part of the means and eventually focused to one point of the two-dimensional detector 8.
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公开(公告)号:JP2000304612A
公开(公告)日:2000-11-02
申请号:JP11846699
申请日:1999-04-26
Applicant: SEIKO INSTR INC
Inventor: NAKANO NOBUO , HARADA YOICHI , MATSUZAWA OSAMU
Abstract: PROBLEM TO BE SOLVED: To make smoothly slidable a sine bar by providing the side of a knife edge where the sine bar slides while being in contact, with a tilt angle to a perpendicular extending from a rotary shaft of a diffraction grating toward the movement direction of the knife edge. SOLUTION: A diffraction grating 1 is so fitted as to rotates around a rotary shaft 2, with the rotary shaft 2 to which one end of a sine bar 3 is fitted. A pulse motor 7 is connected to a belt 6 with a threaded rod 5 for rotation of the threaded rod 5. A knife-edge 4 is fitted to the threaded rod 5 through a nut. The nut is so fixed not to rotate in the rotational direction of the threaded rod 5, and the rotation of the threaded rod 5 moves the nut to shift in the axial direction of the threaded rod 5. The other end of the sine bar 3 fitted to the rotary shaft 2 so contacts a side 8 not to release it. Movement of the knife-edge 4 pushes and moves the sine bar 3, resulting in rotation of the diffraction grating 1 for change in the angle.
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公开(公告)号:JPH09199076A
公开(公告)日:1997-07-31
申请号:JP336196
申请日:1996-01-11
Applicant: SEIKO INSTR INC
Inventor: MATSUZAWA OSAMU , NAKAGAWA YOSHITOMO , TAKAHASHI JUNICHI
Abstract: PROBLEM TO BE SOLVED: To dispense with the preparation of a mixed solution and prevent the mingling of a contaminant during the preparation process by spraying fogs with two or more sprayers toward a chamber inner tube. SOLUTION: Blank solutions 14a, 15a are put in sample containers 12a, 12b, and carrier gases are fed from carrier gas feed sections 10 so that the gas flows of sprayers 4 are kept constant respectively. The blank solutions 14a, 15a in the sample containers 12a, 12b are sucked into the sprayers 4 through guide pipes 16 and sprayed into a holder 3 from the sprayers 4 to form a foggy mixed sample. The atomized mixed sample reaches the upper face of a torch section 2 through a chamber 1, and the mixed sample of large grains is discharged to the outside from an waste liquid hole 18. The atomized mixed sample is ionized in the torch section 2 where plasma is formed.
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公开(公告)号:JPH10321182A
公开(公告)日:1998-12-04
申请号:JP12759797
申请日:1997-05-16
Applicant: SEIKO INSTR INC
Inventor: ITOU TETSUMASA , NAKAGAWA YOSHITOMO , MATSUZAWA OSAMU
Abstract: PROBLEM TO BE SOLVED: To preclude the possibility of mesh-clogging of the torch tip and a sampling cone by carbon C in a sample and a burst of a chamber even if oxygen gas of a quantity necessary to restrain sensitivity reduction is flowed, prevent mesh-clogging, and perform high sensitivity measurement by arranging a branch pipe in the inmost pipe of a torch, and introducing flow rate- controllable oxygen gas from its branch pipe. SOLUTION: When oxygen gas is supplied from an oxygen gas supply part 20, the oxygen gas is supplied from a branch pipe 22 arranged in the inmost pipe 5 of a torch 4 by passing through an oxygen gas supply pipe 19, and is mixed with a sample 18 by the inmost pipe 5. A flow rate of a nebulizer gas blown out of a nebulizer 13 is sufficiently more than the oxygen gas from the branch pipe 22, and since its flow flows in the tip direction of the torch 4 from a chamber 9, the oxygen gas flows in the direction of the torch 4 from the branch pipe 22, and does not flow to the chamber 9. Therefore, since the oxygen gas concentration in the chamber 9 is extremely reduced, even if a backfire is caused in the chamber 9, combustion is not caused, and it does not burst.
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