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公开(公告)号:CA2519893C
公开(公告)日:2013-03-12
申请号:CA2519893
申请日:2004-03-22
Applicant: SILEX MICROSYSTEMS AB
Inventor: KAELVESTEN EDVARD , EBEFORS THORBJOERN , SVEDIN NIKLAS , RANGSTEN PELLE , SCHOENBERG TOMMY
IPC: H01L21/60 , B81B7/00 , H01L21/768 , H01L23/48 , H01L29/40
Abstract: The invention relates to a method of making an electrical connection between a first (top) and a second (bottom) surface of a conducting or semi-conducting substrate. It comprising creating a trench in the first surface, and establishing an insulating enclosure entirely separating a portion of said substrate, defined by said trench. It also relates to a product usable as a starting substrate for the manufacture of micro-electronic and/or micro-mechanic devices, comprising a flat substrate of a semi-conducting or conducting material, and having a first and a second surface and at least one electrically conducting member extending through said substrate. The electrically conducting member is insulated from surrounding material of the flat substrate by a finite layer of an insulating material, and comprises the same material as the substrate, i.e. it is made from the wafer material.
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公开(公告)号:DK1609180T3
公开(公告)日:2013-06-24
申请号:DK04722492
申请日:2004-03-22
Applicant: SILEX MICROSYSTEMS AB
Inventor: KAELVESTEN EDVARD , EBEFORS THORBJOERN , RANGSTEN PELLE , HUHTAOJA TOMMY , SVEDIN NIKLAS
IPC: B81B7/00 , H01L21/768 , H01L23/48
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公开(公告)号:SE0300784L
公开(公告)日:2004-09-22
申请号:SE0300784
申请日:2003-03-21
Applicant: SILEX MICROSYSTEMS AB
Inventor: EBEFORS THORBJOERN , KAELVESTEN EDVARD , SVEDIN NIKLAS , HUHTAOJA TOMMY , RANGSTEN PELLE
IPC: B81B7/00 , H01L21/768 , H01L23/48 , H01L21/60
Abstract: A method of making an electrical connection between a first (top) and a second (bottom) surface of a conducting or semi-conducting substrate includes creating a trench in the first surface, and establishing an insulating enclosure entirely separating a portion of the substrate, defined by the trench. Also described is a product usable as a starting substrate for the manufacture of micro-electronic and/or micro-mechanic devices, including a flat substrate of a semi-conducting or conducting material, and having a first and a second surface and at least one electrically conducting member extending through the substrate. The electrically conducting member is insulated from surrounding material of the flat substrate by a finite layer of an insulating material, and includes the same material as the substrate, i.e. it is made from the wafer material.
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公开(公告)号:SE0300784D0
公开(公告)日:2003-03-21
申请号:SE0300784
申请日:2003-03-21
Applicant: SILEX MICROSYSTEMS AB
Inventor: EBEFORS THORBJOERN , KAELVESTEN EDVARD , SVEDIN NIKLAS , HUHTAOJA TOMMY , RANGSTEN PELLE
IPC: B81B7/00 , H01L21/768 , H01L23/48 , H01L
Abstract: A method of making an electrical connection between a first (top) and a second (bottom) surface of a conducting or semi-conducting substrate includes creating a trench in the first surface, and establishing an insulating enclosure entirely separating a portion of the substrate, defined by the trench. Also described is a product usable as a starting substrate for the manufacture of micro-electronic and/or micro-mechanic devices, including a flat substrate of a semi-conducting or conducting material, and having a first and a second surface and at least one electrically conducting member extending through the substrate. The electrically conducting member is insulated from surrounding material of the flat substrate by a finite layer of an insulating material, and includes the same material as the substrate, i.e. it is made from the wafer material.
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公开(公告)号:SE526366C3
公开(公告)日:2005-10-26
申请号:SE0300784
申请日:2003-03-21
Applicant: SILEX MICROSYSTEMS AB
Inventor: EBEFORS THORBJOERN , KAELVESTEN EDVARD , SVEDIN NIKLAS , HUHTAOJA TOMMY , RANGSTEN PELLE
IPC: B81B7/00 , H01L21/768 , H01L23/48
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公开(公告)号:SE526366C2
公开(公告)日:2005-08-30
申请号:SE0300784
申请日:2003-03-21
Applicant: SILEX MICROSYSTEMS AB
Inventor: EBEFORS THORBJOERN , KAELVESTEN EDVARD , SVEDIN NIKLAS , HUHTAOJA TOMMY , RANGSTEN PELLE
IPC: B81B7/00 , H01L21/768 , H01L23/48 , H01L21/60
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公开(公告)号:CA2519893A1
公开(公告)日:2004-09-30
申请号:CA2519893
申请日:2004-03-22
Applicant: SILEX MICROSYSTEMS AB
Inventor: HUHTAOJA TOMMY , EBEFORS THORBJOERN , KAELVESTEN EDVARD , RANGSTEN PELLE , SVEDIN NIKLAS
IPC: H01L21/60 , B81B7/00 , H01L21/768 , H01L23/48 , H01L29/40
Abstract: The invention relates to a method of making an electrical connection between a first (top) and a second (bottom) surface of a conducting or semi-conducting substrate. It comprising creating a trench in the first surface, and establishing an insulating enclosure entirely separating a portion of said substrate, defined by said trench. It also relates to a product usable as a starting substrate for the manufacture of micro-electronic and/or micro- mechanic devices, comprising a flat substrate of a semi-conducting or conducting material, and having a first and a second surface and at least on e electrically conducting member extending through said substrate. The electrically conducting member is insulated from surrounding material of the flat substrate by a finite layer of an insulating material, and comprises th e same material as the substrate, i.e. it is made from the wafer material.
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公开(公告)号:HK1084236A1
公开(公告)日:2006-07-21
申请号:HK06104564
申请日:2006-04-13
Applicant: SILEX MICROSYSTEMS AB
Inventor: KAELVESTEN EDVARD , EBEFORS THORBJOERN , SVEDIN NIKLAS , RANGSTEN PELLE , HUHTAOJA TOMMY
IPC: B81B20060101 , B81B7/00 , H01L20060101 , H01L21/768 , H01L23/48
Abstract: A method of making an electrical connection between a first (top) and a second (bottom) surface of a conducting or semi-conducting substrate includes creating a trench in the first surface, and establishing an insulating enclosure entirely separating a portion of the substrate, defined by the trench. Also described is a product usable as a starting substrate for the manufacture of micro-electronic and/or micro-mechanic devices, including a flat substrate of a semi-conducting or conducting material, and having a first and a second surface and at least one electrically conducting member extending through the substrate. The electrically conducting member is insulated from surrounding material of the flat substrate by a finite layer of an insulating material, and includes the same material as the substrate, i.e. it is made from the wafer material.
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公开(公告)号:SE0300784A
公开(公告)日:2004-09-22
申请号:SE0300784
申请日:2003-03-21
Applicant: SILEX MICROSYSTEMS AB
Inventor: EBEFORS THORBJOERN , KAELVESTEN EDVARD , SVEDIN NIKLAS , HUHTAOJA TOMMY , RANGSTEN PELLE
IPC: B81B7/00 , H01L21/768 , H01L23/48 , H01L21/60
CPC classification number: B81B7/0006 , H01L21/76898 , H01L23/481 , H01L2224/05573 , H01L2224/13025 , H01L2224/131 , H01L2924/00014 , H01L2924/1461 , H01L2924/014 , H01L2924/00 , H01L2224/05599
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公开(公告)号:SE0103471D0
公开(公告)日:2001-10-15
申请号:SE0103471
申请日:2001-10-15
Applicant: SILEX MICROSYSTEMS AB ELECTRUM
Inventor: RANGSTEN PELLE , KAALVESTEN EDVARD , MECHBACH MARIANNE
Abstract: In manufacturing a pressure sensor a recess that will form part of the sensor cavity is formed in a lower silicon substrate. An SOI-wafer having a monocrystalline silicon layer on top of a substrate is bonded to the lower silicon substrate closing the recess and forming the cavity. The supporting substrate of the SOI-wafer is then etched away, the portion of the monocrystalline layer located above the recess forming the sensor diaphragm. The oxide layer of the SOI-wafer here acts as an "ideal" etch stop in the case where the substrate wafer is removed by dry (plasma) or wet etching using e.g. KOH. This is due to high etch selectivity between silicon and oxide for some etch processes and it results in a diaphragm having a very accurately defined and uniform thickness. The cavity is evacuated by forming a opening to the cavity and then sealing the cavity by closing the opening using LPCVD. Sensor paths for sensing the deflection of the diaphragm are applied on the outer or inner surface of the diaphragm. The monocrystalline diphragm gives the sensor a good long-term stability. Also the sensor path can be made of monocrystalline material, this giving the sensor even better good long-term characteristics. An increased sensitivity can be obtained by making active portions of the sensor paths freely extending, unsupported by other material of the pressure sensor, by suitable etching procedures.
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