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公开(公告)号：GB2497583A
公开(公告)日：2013-06-19
申请号：GB201121688
申请日：2011-12-16
Inventor： MOORE JOHN KEVIN , PURCELL MATTHEW , STORM GRAEME , LULE TAREK
IPC: H04N5/353
Abstract: A method of imaging a scene with a digital image sensor comprising a pixel array comprises: performing a reset operation 500 across one row of the pixel array; integrating pixels in the row for a first calibration time; at the end of this (initial) calibration time, reading 502 pixel values of the row of pixels; comparing the pixel values with one or more predetermined thresholds (e.g., using a DAC ramp, stepped according to the threshold levels); and setting subsequent exposure levels for pixels in the pixel array based upon the pixel values. Thus, a signal is read out for a selection of pixels which acts as a calibration to govern the choice of exposure levels to be applied to the rest of the array, meaning the sensor can adapt to variations in scene intensity, improving dynamic range. Array pixels can also be vertically and horizontally addressed, enabling small areas of intensity variation across an imaged scene to be accounted for. The exposure levels can be stored as decision data, subject to low pass filtering (LPF) and controlling analogue readout circuit gain; only decision data changes applying from one pixel to another may be stored.
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公开(公告)号：GB2482278A
公开(公告)日：2012-02-01
申请号：GB201006088
申请日：2010-04-13
Applicant: ST MICROELECTRONICS RES & DEV
Inventor： MOORE JOHN KEVIN
Abstract: A pixel array image sensor comprises an input circuit 12 having inputs 20, 22 and two coupling capacitors, C1, C2. Input 22 receives an analogue signal from array pixel 18, having a first level during a first calibration period and second level during a second read period. Input 20 receives a reference signal from a time varying reference circuit (RAMP); comparator circuit 14, 16 compares the reference and analogue signal, which are constantly read onto the coupling capacitors during both calibration and read periods. The reference circuit begins providing a ramp signal during the second read period, determining the change in analogue signal between the first calibration and second read periods; the reference (ramp) circuit also starts providing the ramp signal during the first calibration period (Figure 5), compensating for any ramp signal delay during the second read period. Series inverters 26, 28 may have selectively connectable feedback loops. In an alternative system, the inverters are replaced by a circuit (40, Figure 6) comprising a differential amplifier (42) receiving the output of capacitors C1 and C2 at a single terminal. The circuit is resistant to ground bounce, reducing x-droop, as well as thermal noise.
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公开(公告)号：GB2486165A
公开(公告)日：2012-06-13
申请号：GB201020276
申请日：2010-11-30
Applicant: ST MICROELECTRONICS RES & DEV
Inventor： MOORE JOHN KEVIN
Abstract: An oven 400 has a proximity detector 402 for detecting surface movement of contents 406 such as food being cooked or heated or liquids being boiled. The proximity detector is an array of Single Photon Avalanche Diodes (SPADs) with an illumination source. The SPADs may be arranged in rows and columns and connected to a multiplex and a counter to enable measurement of the reflected illumination. The surface movements detected can be used to control the oven e.g. by means of a logic module with cooking programmes. The proximity detector may employ a phase shift extraction method for range determination.
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公开(公告)号：GB2510890A
公开(公告)日：2014-08-20
申请号：GB201302787
申请日：2013-02-18
Applicant: ST MICROELECTRONICS RES & DEV
Inventor： RAE BRUCE , MOORE JOHN KEVIN
IPC: H01L31/107 , G01J1/44 , G01S7/486 , G01S17/08 , H03K17/94
Abstract: Apparatus and method of use, comprising at least one photon sensitive device 1,2 preferably one or more Single Photon Avalanche Diode, Single Photon Avalanche Detector, (SPAD), or a SPAD array 1,2, each photon sensitive device (102, figure 1) being provided with a voltage source for biasing the photon sensitive device (-Vbreakdown and/or Vexcess figure 1); and a controller 8 configured to control a bias voltage source 4, configured to cause the bias voltage source to apply at least one calibration bias voltage to the or each photon sensitive device in a calibration mode to determine a voltage to be provided by the voltage source in a normal mode of operation. The bias voltage source may comprise a charge pump. The controller may configure the apparatus to be in the calibration mode at regular intervals, and may apply a first calibration voltage (S2, figure 3) followed by at least one successive calibration voltages where the successive calibration voltage is increased or decreased (S3 figure 3). The first calibration voltage may be selected to be below or above the breakdown voltage for the or each photon sensitive device. A voltage value is then selected to be used in the normal mode (S5 figure 3). A light source may also be activated by the controller during the calibration mode and the apparatus may be shielded from light other than the reference light activated by the controller. The apparatus and method of calibration mitigates against the variations and drift in breakdown voltage of the SPAD diode over a wide range of temperatures.
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Patent Agency Ranking5.发明专利
公开(公告)号：GB2498529A
公开(公告)日：2013-07-24
申请号：GB201200761
申请日：2012-01-17
Applicant: ST MICROELECTRONICS RES & DEV
Inventor： MOORE JOHN KEVIN , DUGGAL AMAR
IPC: H04N5/3745 , H01L27/14 , H04N5/335 , H04N5/357
Abstract: An image sensor comprising an array of pixels and first and second Analogue to Digital Convertors (ADCs) with a bias line common to both the ADCs and in which a positive feedback coupling (which may comprise a capacitor) is provided between the bias line and the output of each ADC. Each ADC may serve one column of pixels in the array and may be formed within and as part of the pixel structure. The bias line may be global to the pixel array and to every ADC or it may be split to form two or more localised bias lines with each of the localised bias lines being associated with a predetermined set of ADCs. At least one of the ADCs may comprise a multi-stage comparator having a positive feedback coupling between the output of one stage and a current source of a second preceding stage. Also disclosed is a mobile telephone comprising the disclosed image sensor. The positive feedback coupling of the invention is design to improve the noise performance of CMOS image sensors
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公开(公告)号：GB2510891A
公开(公告)日：2014-08-20
申请号：GB201302789
申请日：2013-02-18
Applicant: ST MICROELECTRONICS RES & DEV
Inventor： MOORE JOHN KEVIN , RAE BRUCE
Abstract: Apparatus comprising an array of photon sensitive devices 1 or 2 such as a single photon avalanche diode array (SPAD), the array configured to provide a plurality of outputs; and a plurality of pulse shaping circuitry 30, each pulse shaping circuitry configured to shape a respective output of the array in a normal mode of operation and a calibration signal in a calibration mode of operation. In one embodiment the pulse shaping circuitry may deliver a signal pulse (SPAD2, Figure 7D) exhibiting pulses having their beginning coinciding with the beginning of the input pulses (SPAD2 figure 7C), but would have a constant duration or constant pulse width. In the calibration mode the calibration signal may be applied to one pulse shaper at a time. A logic arrangement may be coupled to a respective output of each of the pulse shapers and may be in the form of an OR tree 5 or 6. The apparatus may comprise a calibration source 9 configured to output a plurality of calibration signals for the respective pulse shaping circuitry 30 and may output the calibration signals at different times. Two sets of apparatus may also be included (figure 13), the first arrangement comprising a reference array (2, figure 13) and the second arrangement comprises a measuring array (1 figure 13). The circuitry is suitable for integration within an integrated circuit. The invention is particularly applicable to Time-of-flight (TOF) measurement devices.
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公开(公告)号：GB2486428A
公开(公告)日：2012-06-20
申请号：GB201021144
申请日：2010-12-14
Applicant: ST MICROELECTRONICS RES & DEV
Inventor： STORM GRAEME , PURCELL MATTHEW , TOLMIE DEREK , MOORE JOHN KEVIN , WIGLEY MICHAEL
Abstract: An image sensor comprising a pixel array in which each pixel column comprises at least two column bit-lines, a readout input circuit comprising a plurality of first inputs and a second input with each of the first inputs and the second input being connected via a capacitance to a single comparator input node and a readout comparator circuit connected to the single comparator input node. Each of the first inputs receives, in parallel, an analogue signal acquired from the output of one or more of the pixels via the column bit-line. The analogue signals vary during a pixel readout period and have a first level during a calibration period and a second level during a read period. The analogue signals at the first inputs and a reference signal from a time varying reference circuit on the second input are constantly read onto their respective capacitances during both the calibration period and the read period. The readout comparator circuit compares an average of the signals on each of the plurality of first inputs to the reference signal.
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公开(公告)号：GB2497571A
公开(公告)日：2013-06-19
申请号：GB201121577
申请日：2011-12-15
Applicant: ST MICROELECTRONICS RES & DEV
Inventor： MOORE JOHN KEVIN
Abstract: An array of pixels in an image sensor comprises some pixels of relatively low photosensitivity. The low photosensitivity pixels allow the use of long integration times, which permits the reliable detection of pulsed light sources, such as LED vehicle brake lights, in the image. The higher sensitivity pixels have a shorter integration time and permit good low-level sensitivity. Lower pixel photosensitivity may be achieved by use of an attenuating filter or by use of a smaller sensing area. One of the green pixels in a repeating RGBG pattern may have a lower sensitivity than the other green pixel, or selected RGBG groups may have lower sensitivity (figure 6C). The dynamic range may be further improved by use of multiple exposures, each with different integration times (figure 3). Dynamic range may also be improved by adapting the pixel integration times in dependence on the image data captured in an initial calibration phase (figure 4).
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公开(公告)号：GB2485993A
公开(公告)日：2012-06-06
申请号：GB201020275
申请日：2010-11-30
Applicant: ST MICROELECTRONICS RES & DEV
Inventor： MOORE JOHN KEVIN
Abstract: Sports equipment, such as a tennis racket, golf club, hockey stick, football boot or rugby boot, etc, is described comprising a proximity detector for measuring the speed of an object struck by the sports equipment. The proximity detector preferably comprises an array of single photon avalanche diodes (SPAD) and an illumination source, e.g. modulated laser or modulated LEDs. Preferably the proximity detector is used to detect the range to the object, such as a ball, struck by the sports equipment. The range is preferably determined by a phase shift extraction method, wherein the phase shift of the reflected radiation is detected. The phase shift may be determined by counting photons which arrive in different bins (see fig. 1). The speed of the object struck by the sports equipment is determined by measuring the change in range to the object over a short time period (in the order of nanoseconds). The sports equipment may include an accelerometer to compensate for the relative movement of the sports equipment and struck object, e.g. racket and ball.
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