公开(公告)号：FR2787233A1

公开(公告)日：2000-06-16

申请号：FR9815786

申请日：1998-12-11

Applicant: ST MICROELECTRONICS SA

Inventor： NAURA DAVID ,  MONCADA FREDERIC

IPC: G11C29/02 ,  G11C29/10 ,  G11C23/00 ,  H03M13/00 ,  G06F11/30

Abstract: After having written all words to a memory with a same first word (h00), it performs at least N or M writing of second words (h01 hFE) in the storage in such a way that every line and every column has at least registered second word. The second words are different from the first words. Then all words of the storage matrix are read.

公开(公告)号：FR2787233B1

公开(公告)日：2001-02-16

申请号：FR9815786

申请日：1998-12-11

Applicant: ST MICROELECTRONICS SA

Inventor： NAURA DAVID ,  MONCADA FREDERIC

IPC: G11C29/02 ,  G11C29/10 ,  G11C23/00 ,  H03M13/00 ,  G06F11/30

Abstract: A method for testing decoding circuits in a memory including a matrix of storage cells includes writing the same first word in all the storage cells, and then writing second words in the matrix such that each row and each column has at least one stored second word. The second words are different from the first words. If several second words are written in the same row or in the same column, then the second words are different from one another. Reading all the words in the memory permits verification of the integrity of the decoding circuits, and reduces the testing time of the memory.