Abstract:
The resonator has a piezoelectric layer (3) placed between two electrodes (1, 2). An electrical heating resistor (9) is placed in thermal contact with the electrode (1). The temporary heating of the electrode (1) permits to partially evaporate a material constituting the electrode (1) to make the electrode (1) thinner for adjusting resonance frequency. An independent claim is also included for a method of producing a thin film bulk acoustic resonator or a solidly mounted resonator.
Abstract:
The resonator has a piezoelectric layer (3) placed between two electrodes (1, 2). An electrical heating resistor (9) is placed in thermal contact with the electrode (1). The temporary heating of the electrode (1) permits to partially evaporate a material constituting the electrode (1) to make the electrode (1) thinner for adjusting resonance frequency. An independent claim is also included for a method of producing a thin film bulk acoustic resonator or a solidly mounted resonator.
Abstract:
The resonator has a piezoelectric layer (3) placed between two electrodes (1, 2). An electrical heating resistor (9) is placed in thermal contact with the electrode (1). The temporary heating of the electrode (1) permits to partially evaporate a material constituting the electrode (1) to make the electrode (1) thinner for adjusting resonance frequency. An independent claim is also included for a method of producing a thin film bulk acoustic resonator or a solidly mounted resonator.
Abstract:
The resonator has a piezoelectric layer (3) placed between two electrodes (1, 2). An electrical heating resistor (9) is placed in thermal contact with the electrode (1). The temporary heating of the electrode (1) permits to partially evaporate a material constituting the electrode (1) to make the electrode (1) thinner for adjusting resonance frequency. An independent claim is also included for a method of producing a thin film bulk acoustic resonator or a solidly mounted resonator.
Abstract:
A microswitch comprises a deformable membrane (12) including two substantially parallel flexure arms (13), attached to a substrate via at least one end thereof and comprising thermal actuating means (4). An elongated contact arm (14), substantially parallel with the flexure arms (13), is arranged therebetween and attached thereto at the high deformation areas thereof. The contact arm (14) moves in a direction substantially parallel to the substrate upon actuation of the microswitch, and comprises electrostatic holding electrodes (15) and a conducting pad (6).
Abstract:
The invention concerns a method which consists in successively depositing a polymeric sacrificial layer (2), depositing, on at least part of the substrate (1) and the front surface of the sacrificial layer (2), an embedding layer (6), with a thickness greater than that of the sacrificial layer (2) and performing planarization such that the front surfaces of the sacrificial layer (2) and of the embedding layer (6) form a common planar surface. A forming layer (3) of a suspended structure (5) is deposited on the front face of the common planar surface. The planarization can include chemical mechanical polishing and etching the embedding layer (6). Etching the sacrificial layer (2) can be performed by means of a mask, formed on the front surface of a polymer material layer, removed during the planarization step.
Abstract:
The invention concerns a sensor structure in particular for a harsh environment in a motor vehicle, characterized in that it comprises a sensor body (1) including at one end, an element (2) sensitive to the quantity to be measured in the harsh environment and at another end, a connecting circuit (3) thereof, located outside the harsh environment, physically separated from each other, connected by data non-connection transmitting means and between which are provided means (4) permeable to the data, for protecting the connecting circuit (3) against the environment.
Abstract:
Assemblage entre un composant (20) électromécanique MEMS et/ou NEMS et un boitier (1), le composant (20) électromécanique comportant au moins une structure suspendue (26) et mobile dotée d'au moins une zone (26a) de fixation sur laquelle une régions d'accueil (3) du boitier est fixée, la structure suspendue étant formée au moins partiellement dans un capot de protection (29) du composant ou dans une couche (25) distincte de celle dans laquelle l'élément sensible du composant est formé.
Abstract:
Procédé de réalisation d'un système d'encapsulation comportant : - la fabrication d'un premier élément comprenant, à partir d'un premier substrat, les étapes de formation d'une zone fragilisée de sorte définir une couche mince et une couche support, - l'assemblage du premier élément avec un deuxième élément de sorte que la couche mince soit disposée entre le deuxième élément et la couche support, - le retrait de la couche support par séparation de la couche support et de la couche mince au niveau de la zone fragilisée.