-
公开(公告)号：DE60306892D1
公开(公告)日：2006-08-31
申请号：DE60306892
申请日：2003-05-02
Applicant: ST MICROELECTRONICS SRL
Inventor： BORTESI LUCA , VENDRAME LORIS , BOGLIOLO ALESSANDRO
Abstract: A method and a corresponding arrangement for measuring the coupling capacitance between two interconnect lines exploits the so-called cross-talk effect and keeps an interconnect line at a constant reference voltage. The method and arrangement solve the problem of short-circuit currents that affects the known test structures, and allow a direct measurement of the coupling capacitance between the two interconnect lines. Capacitance measurements may also be used for determining points of interruption of interconnect lines. When a line is interrupted, the measured coupling capacitance is the capacitance of a single conducting branch. The position of points of interruption of an interconnect line is determined by measuring the coupling capacitance of all segments of the line with a second conducting line.
-
公开(公告)号：DE60306892T2
公开(公告)日：2007-08-30
申请号：DE60306892
申请日：2003-05-02
Applicant: ST MICROELECTRONICS SRL
Inventor： BORTESI LUCA , VENDRAME LORIS , BOGLIOLO ALESSANDRO
Abstract: A method and a corresponding arrangement for measuring the coupling capacitance between two interconnect lines exploits the so-called cross-talk effect and keeps an interconnect line at a constant reference voltage. The method and arrangement solve the problem of short-circuit currents that affects the known test structures, and allow a direct measurement of the coupling capacitance between the two interconnect lines. Capacitance measurements may also be used for determining points of interruption of interconnect lines. When a line is interrupted, the measured coupling capacitance is the capacitance of a single conducting branch. The position of points of interruption of an interconnect line is determined by measuring the coupling capacitance of all segments of the line with a second conducting line.
-
Search Results
2
records
(took 0.024 seconds)
