2.
    发明专利
    未知

    公开(公告)号:ITVA990035A1

    公开(公告)日:2001-05-23

    申请号:ITVA990035

    申请日:1999-11-23

    Abstract: Functions for simulating, burning and controlling integrated fuses of a device are provided by a dedicated circuit which, instead of differing from other circuits, is integrated by sharing part of the registers with the circuit that normally exists to scan test the integrity of the state of the device. The architecture is simplified and only requires an additional pin as compared to a common scan test circuit.

    3.
    发明专利
    未知

    公开(公告)号:ITVA990035D0

    公开(公告)日:1999-11-23

    申请号:ITVA990035

    申请日:1999-11-23

    Abstract: Functions for simulating, burning and controlling integrated fuses of a device are provided by a dedicated circuit which, instead of differing from other circuits, is integrated by sharing part of the registers with the circuit that normally exists to scan test the integrity of the state of the device. The architecture is simplified and only requires an additional pin as compared to a common scan test circuit.

    5.
    发明专利
    未知

    公开(公告)号:DE602006009422D1

    公开(公告)日:2009-11-05

    申请号:DE602006009422

    申请日:2006-03-17

    Abstract: An electronic synchronous/asynchronous transceiver device for power line communication networks is integrated into a single chip and operates from a single supply voltage. The transceiver device includes: at least an internal register that is programmable through a synchronous serial interface; at least a line driver for a two-way network communication over power lines implemented by a single ended power amplifier with direct accessible input and output lines that is part of a tunable active filter for the transmission path; and at least a couple of linear regulators for powering with different voltage levels different kind of external controllers linked to the transceiver device.

    7.
    发明专利
    未知

    公开(公告)号:IT1313401B1

    公开(公告)日:2002-07-23

    申请号:ITVA990035

    申请日:1999-11-23

    Abstract: Functions for simulating, burning and controlling integrated fuses of a device are provided by a dedicated circuit which, instead of differing from other circuits, is integrated by sharing part of the registers with the circuit that normally exists to scan test the integrity of the state of the device. The architecture is simplified and only requires an additional pin as compared to a common scan test circuit.

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