公开(公告)号：JP2000298625A

公开(公告)日：2000-10-24

申请号：JP2000038187

申请日：2000-02-10

Applicant: ST MICROELECTRONICS SRL

Inventor： MODELLI ALBERTO

IPC: G06F11/10 ,  G06F12/16 ,  G11C11/56 ,  H03M13/09 ,  H03M13/11

Abstract: PROBLEM TO BE SOLVED: To correct single or plural error bits with the minimum number of correction bits by allocating an error code to a single error for every set of the bits of a binary word and allocating error codes allocated to the individual errors of a partial set at every partial set of multiplex errors. SOLUTION: An error code which is not allocated to other errors is allocated to a single error for the respective sets of the bits of a binary word. An error code depending on an error code allocated to the individual errors of partial sets themselves for the respective partial sets of the multiplex errors. When the error code is previously allocated to the other error, the error code allocated to the partial set or the error code allocated to the single error of the partial set itself is denied. The new error code is allocated to the single error associated with the denied error code. The correction circuit 110 is provided with a decoding means 112 receiving a check word obtained in a decoding process as input and outputting a binary correction string.

公开(公告)号：JP2001057091A

公开(公告)日：2001-02-27

申请号：JP2000236205

申请日：2000-08-03

Applicant: ST MICROELECTRONICS SRL

Inventor： TORELLI GUIDO ,  MODELLI ALBERTO ,  MANSTRETTA ALESSANDRO

IPC: G11C16/02 ,  G11C11/56

Abstract: PROBLEM TO BE SOLVED: To obtain aprogramming method for a non-volatile memory in which the time required for performing programming operation can be minimized by control of gate voltage. SOLUTION: Threshold voltage in which a value is increased for a pre- programming pulse at the time of programming is applied to a gate terminal of each cell to be programmed, and an increment of threshold voltage of a cell to be programmed is made equal to an increment of gate voltage (ΔVcp). Variation interval of threshold voltage relating to each level is held at a small value to move from one threshold level to a next threshold level, in order to reduce a whole programming time, continuous pulses are supplied to each cell to be programmed with non-verifying until it is reduced to a voltage level to be programmed or less (107-109), and a verifying process (110) is performed, successively, a programming process and a verifying process (112, 110, 117, 118) are continuously performed until a cell to be programmed reaches the desired threshold value.

公开(公告)号：DE69907622T2

公开(公告)日：2004-03-25

申请号：DE69907622

申请日：1999-02-10

Applicant: ST MICROELECTRONICS SRL

Inventor： MODELLI ALBERTO

IPC: G06F11/10 ,  G06F12/16 ,  G11C11/56 ,  H03M13/09 ,  H03M13/11

Abstract: The method for correction comprises the step of executing the following steps, for each set of bits in the binary word stored in a single memory cell: a) assigning, to each single error, an error code which is not assigned to other errors; b) for each sub-set of multiple errors, carrying out the following steps: b1) assigning to the sub-set of multiple errors an error code, which is dependent on the error codes assigned to each of the individual errors in the sub-set itself; b2) checking whether the error code assigned to the said sub-set has already been assigned to other errors; b3) if the error code assigned to the said sub-set has already been assigned to other errors, carrying out the following steps: b31) rejecting the error code assigned to the said sub-set, and at least one of the error codes assigned to one of the single errors in the sub-set itself; b32) assigning to the single error assigned to the error code rejected, a new error code, which is not assigned to other errors; and b33) repeating the steps from b1) to b3), until the error code assigned to the sub-set of multiple errors is not assigned to other errors.

公开(公告)号：DE69907622D1

公开(公告)日：2003-06-12

申请号：DE69907622

申请日：1999-02-10

Applicant: ST MICROELECTRONICS SRL

Inventor： MODELLI ALBERTO

IPC: G06F11/10 ,  G06F12/16 ,  G11C11/56 ,  H03M13/09 ,  H03M13/11

Abstract: The method for correction comprises the step of executing the following steps, for each set of bits in the binary word stored in a single memory cell: a) assigning, to each single error, an error code which is not assigned to other errors; b) for each sub-set of multiple errors, carrying out the following steps: b1) assigning to the sub-set of multiple errors an error code, which is dependent on the error codes assigned to each of the individual errors in the sub-set itself; b2) checking whether the error code assigned to the said sub-set has already been assigned to other errors; b3) if the error code assigned to the said sub-set has already been assigned to other errors, carrying out the following steps: b31) rejecting the error code assigned to the said sub-set, and at least one of the error codes assigned to one of the single errors in the sub-set itself; b32) assigning to the single error assigned to the error code rejected, a new error code, which is not assigned to other errors; and b33) repeating the steps from b1) to b3), until the error code assigned to the sub-set of multiple errors is not assigned to other errors.

公开(公告)号：DE69927967D1

公开(公告)日：2005-12-01

申请号：DE69927967

申请日：1999-08-03

Applicant: ST MICROELECTRONICS SRL

Inventor： TORELLI GUIDO ,  MODELLI ALBERTO ,  MANSTRETTA ALESSANDRO

IPC: G11C16/02 ,  G11C11/56

公开(公告)号：DE69927967T2

公开(公告)日：2006-07-27

申请号：DE69927967

申请日：1999-08-03

Applicant: ST MICROELECTRONICS SRL

Inventor： TORELLI GUIDO ,  MODELLI ALBERTO ,  MANSTRETTA ALESSANDRO

IPC: G11C11/56 ,  G11C16/02