公开(公告)号：DE602004008240T2

公开(公告)日：2008-05-15

申请号：DE602004008240

申请日：2004-06-14

Applicant: ST MICROELECTRONICS SRL

Inventor： IACULO MASSIMO ,  GUIDA NICOLA ,  RUGGIERO ANDREA

IPC: G11C29/00 ,  G06F12/12

Abstract: A method for managing bad memory blocks of a nonvolatile-memory device, in which the available memory blocks are divided into a first set, formed by addressable memory blocks that are to be used by a user, and a second set, formed by spare memory blocks that are to replace bad addressable memory blocks, and in which the bad addressable memory blocks are re-mapped into corresponding spare memory blocks. The re-mapping of the bad addressable memory blocks envisages: seeking bad spare memory blocks; storing the logic address of each bad spare memory block in a re-directing vector in a position corresponding to that of the bad spare memory block in the respective set; seeking bad addressable memory blocks; storing the logic address of each bad addressable memory block in a free position in the re-directing vector; and re-mapping the bad addressable memory block into a spare memory block having a position corresponding to that of the address of the bad addressable memory block in the re-directing vector.

公开(公告)号：DE602004008240D1

公开(公告)日：2007-09-27

申请号：DE602004008240

申请日：2004-06-14

Applicant: ST MICROELECTRONICS SRL

Inventor： IACULO MASSIMO ,  GUIDA NICOLA ,  RUGGIERO ANDREA

IPC: G11C29/00 ,  G06F12/12

Abstract: A method for managing bad memory blocks of a nonvolatile-memory device, in which the available memory blocks are divided into a first set, formed by addressable memory blocks that are to be used by a user, and a second set, formed by spare memory blocks that are to replace bad addressable memory blocks, and in which the bad addressable memory blocks are re-mapped into corresponding spare memory blocks. The re-mapping of the bad addressable memory blocks envisages: seeking bad spare memory blocks; storing the logic address of each bad spare memory block in a re-directing vector in a position corresponding to that of the bad spare memory block in the respective set; seeking bad addressable memory blocks; storing the logic address of each bad addressable memory block in a free position in the re-directing vector; and re-mapping the bad addressable memory block into a spare memory block having a position corresponding to that of the address of the bad addressable memory block in the re-directing vector.