Abstract:
The present invention provides an improved integrated circuit and integrated circuit fabrication method to introduce highly controlled air cavities within high-speed copper interconnects based on the introduction of a polymer material on the walls of the interconnect lines and vias within the interconnect stack, which incorporates and controls air cavities formation, thus enhancing the signal propagation performances of the semiconductor interconnects.
Abstract:
The invention concerns a method of forming a copper portion surrounded by an insulating material (14) in an integrated circuit structure (2), the insulating material being a first oxide, the method having steps including forming a composite material (24) over a region of the insulating material where the copper portion is to be formed, the composite material formed of first and second materials, the first material for forming a copper seed repair layer (28), and annealing such that the second material reacts with the insulating material to form a second oxide (26), the second oxide forming a diffusion barrier to copper (32).